Abstract: A low voltage differential signal (LVDS) driver circuit with reduced power consumption. A pre-driver stage, implemented as a differential current mode amplifier, is driven by the differential input signal and provides a corresponding differential drive signal, which drives the output stage, implemented as a differential voltage mode amplifier, which, in turn, provides the differential output signal for the load. Total current consumption equals the load current, which is provided by the output stage, plus a much smaller current used by the pre-driver stage.

Abstract: A low voltage differential signal (LVDS) driver circuit with reduced power consumption. A pre-driver stage, implemented as a differential current mode amplifier, is driven by the differential input signal and provides a corresponding differential drive signal, which drives the output stage, implemented as a differential voltage mode amplifier, which, in turn, provides the differential output signal for the load. Total current consumption equals the load current, which is provided by the output stage, plus a much smaller current used by the pre-driver stage.

Abstract: An apparatus comprising a first circuit and a second circuit. The first circuit may be configured to generate a plurality of digital intermediate signals in response to an analog input signal, a first set of threshold and reference voltages and a second set of threshold and reference voltages, where the threshold and reference voltages of the first set are shifted with respect to corresponding threshold and reference voltages of the second set. The second circuit may be configured to generate a digital output signal in response to the plurality of digital intermediate signals.

Abstract: An apparatus comprising a first circuit and a second circuit. The first circuit may be configured to generate a plurality of digital intermediate signals in response to an analog input signal, a first set of threshold and reference voltages and a second set of threshold and reference voltages, where the threshold and reference voltages of the first set are shifted with respect to corresponding threshold and reference voltages of the second set. The second circuit may be configured to generate a digital output signal in response to the plurality of digital intermediate signals.

Abstract: A circuit and method configured to generate a variable impedance. The circuit may comprise a voltage controlled resistor configured to generate the variable impedance in response to (i) a first transistor configured to receive a first control signal and (ii) a bias transistor configured to receive a bias signal. In one example, the variable impedance may be generated in further response to a clamp transistor.

Abstract: A circuit comprising an oscillator configured to generate a periodic signal in response to (i) control signal and (ii) a current. The current may be varied independently of the control signal. In one example, the oscillator may generate the periodic signal in further response to a second current that may vary in response to the control signal. In another example, the oscillator may be used in a phase-locked loop circuit.

Abstract: A nonvolatile memory circuit that includes a load circuit coupled to a band-gap reference circuit and a nonvolatile memory cell. The load line circuit is configured to provide a programming voltage to the nonvolatile memory cell. The programming voltage may be generated in response to the reference voltage generated by the band-gap reference circuit. The nonvolatile memory circuit may also include an amplifying circuit that amplifies the reference voltage of the band-gap circuit, and provides the amplified reference voltage to the load circuit. The nonvolatile memory circuit may further include a voltage trim circuit that trims the amplified reference voltage and provides the trimmed amplified reference voltage to the load circuit. The reference voltage, amplified reference voltage, and the trimmed amplified reference voltage may each output a stable voltage that is independent of variations in process parameters, operating temperatures, and supply voltages of the nonvolatile memory circuit.

Abstract: A voltage source is configured to produce a desired voltage and the desired voltage is applied to a programmable cell coupled to the voltage source. Configuration may be accomplished by loading a register with a programmed voltage value which may be received as a serial data stream through a test access port coupled to the register. For one embodiment, the voltage source may be coupled to a gate of the programmable cell, thus allowing testing of margin voltages of the programmable cell. In a further embodiment, the voltage source may be coupled to a drain of the programmable cell through a load line circuit, thus providing a programmed voltage for the programmable cell. In general then, the programmable voltage source is configurable to provide a voltage to the programmable cell in accordance with a programmed voltage value loaded into the programmable voltage source.