Abstract: A semiconductor memory device includes: a memory cell array including a plurality of memory cells; an error correction code (ECC) engine configured to detect and/or correct at least one error bit in read data and configured to generate a decoding status flag indicative of whether the at least one error bit is detected and/or corrected, wherein the read data is read from the memory cell array; a channel interface circuit configured to receive the read data and the decoding status flag from the ECC engine and configured to transmit the read data and the decoding status flag to a memory controller, wherein the channel interface circuit is configured to transmit the decoding status flag to the memory controller through a pin; and a control logic circuit configured to control the ECC engine and the channel interface circuit in response to an address and a command from the memory controller.

Abstract: A semiconductor memory device includes: a memory cell array including a plurality of memory cells; an error correction code (ECC) engine configured to detect and/or correct at least one error bit in read data and configured to generate a decoding status flag indicative of whether the at least one error bit is detected and/or corrected, wherein the read data is read from the memory cell array; a channel interface circuit configured to receive the read data and the decoding status flag from the ECC engine and configured to transmit the read data and the decoding status flag to a memory controller, wherein the channel interface circuit is configured to transmit the decoding status flag to the memory controller through a pin; and a control logic circuit configured to control the ECC engine and the channel interface circuit in response to an address and a command from the memory controller.

Abstract: A semiconductor memory device includes: a memory cell array including a plurality of memory cells; an error correction code (ECC) engine configured to detect and/or correct at least one error bit in read data and configured to generate a decoding status flag indicative of whether the at least one error bit is detected and/or corrected, wherein the read data is read from the memory cell array; a channel interface circuit configured to receive the read data and the decoding status flag from the ECC engine and configured to transmit the read data and the decoding status flag to a memory controller, wherein the channel interface circuit is configured to transmit the decoding status flag to the memory controller through a pin; and a control logic circuit configured to control the ECC engine and the channel interface circuit in response to an address and a command from the memory controller.

Abstract: An error correcting circuit receives a codeword including user data and a parity code, and performs an error correction operation on the user data. The circuit includes a first buffer, a decoder, a second buffer and a processor. The first buffer stores the codeword and sequentially outputs pieces of subgroup data obtained by dividing the codeword. The decoder generates pieces of integrity data for each of the pieces of subgroup data received from the first buffer, and performs the error correction operation on the user data using the parity code. The second buffer sequentially stores the pieces of integrity data for each of the pieces of subgroup data. The processor determines whether an error is present in the codeword based on the pieces of integrity data stored in the second buffer when at least one of the pieces of integrity data is updated in the second buffer.

Abstract: An error correction code (ECC) circuit of a semiconductor memory device includes a syndrome generation circuit and a correction circuit. The syndrome generation circuit generates syndrome based on a message and first parity bits in a codeword read from a memory cell array by using one of a first parity check matrix and a second parity check matrix, in response to a decoding mode signal. The correction circuit receives the codeword, corrects at least a portion of (t1+t2) error bits in the codeword based on the syndrome and outputs a corrected message. Here, t1 and t2 are natural numbers, respectively.

Abstract: An error correction code (ECC) decoder of a semiconductor memory device is provided. The ECC decoder includes an ECC checker, a syndrome generator, and an error detection/correction circuit. The ECC checker generates characteristic information representing first error information associated with message bits in an input codeword that is read from a target page in a memory cell array. The syndrome generator outputs a syndrome vector representing second error information associated with the input codeword by performing an operation on the message bits and parity bits in the input codeword based on a parity check matrix. The an error detection/correction circuit generates a transmission codeword by selectively correcting an error bit in the input codeword based on the characteristic information and the syndrome vector, generates a flag signal indicating whether the transmission codeword includes an error bit, and outputs a transmission message based on the transmission codeword.

Abstract: An error correction code (ECC) circuit of a semiconductor memory device includes a syndrome generation circuit and a correction circuit. The syndrome generation circuit generates syndrome based on a message and first parity bits in a codeword read from a memory cell array by using one of a first parity check matrix and a second parity check matrix, in response to a decoding mode signal. The correction circuit receives the codeword, corrects at least a portion of (t1+t2) error bits in the codeword based on the syndrome and outputs a corrected message. Here, t1 and t2 are natural numbers, respectively.

Abstract: An error correction code (ECC) decoder of a semiconductor memory device is provided. The ECC decoder includes an ECC checker, a syndrome generator, and an error detection/correction circuit. The ECC checker generates characteristic information representing first error information associated with message bits in an input codeword that is read from a target page in a memory cell array. The syndrome generator outputs a syndrome vector representing second error information associated with the input codeword by performing an operation on the message bits and parity bits in the input codeword based on a parity check matrix. The an error detection/correction circuit generates a transmission codeword by selectively correcting an error bit in the input codeword based on the characteristic information and the syndrome vector, generates a flag signal indicating whether the transmission codeword includes an error bit, and outputs a transmission message based on the transmission codeword.

Abstract: A method of decoding a low density parity check (LDPC) code, includes dividing a parity check matrix of the LDPC code, into a plurality of sub blocks. The method further includes, for each of a plurality of decoding iterations, performing a node operation of each of target sub blocks among the plurality of sub blocks, the target sub blocks corresponding to a present decoding iteration among the plurality of decoding iterations, in a decoding schedule, estimating a reliability of each of the target sub blocks, based on a result of the node operation of each of the target sub blocks, and adjusting the decoding schedule, based on the reliability of each of the target sub blocks.

Abstract: An error correcting circuit receives a codeword including user data and a parity code, and performs an error correction operation on the user data. The circuit includes a first buffer, a decoder, a second buffer and a processor. The first buffer stores the codeword and sequentially outputs pieces of subgroup data obtained by dividing the codeword. The decoder generates pieces of integrity data for each of the pieces of subgroup data received from the first buffer, and performs the error correction operation on the user data using the parity code. The second buffer sequentially stores the pieces of integrity data for each of the pieces of subgroup data. The processor determines whether an error is present in the codeword based on the pieces of integrity data stored in the second buffer when at least one of the pieces of integrity data is updated in the second buffer.

Abstract: A semiconductor memory device includes: a memory cell array including a plurality of memory cells; an error correction code (ECC) engine configured to detect and/or correct at least one error bit in read data and configured to generate a decoding status flag indicative of whether the at least one error bit is detected and/or corrected, wherein the read data is read from the memory cell array; a channel interface circuit configured to receive the read data and the decoding status flag from the ECC engine and configured to transmit the read data and the decoding status flag to a memory controller, wherein the channel interface circuit is configured to transmit the decoding status flag to the memory controller through a pin; and a control logic circuit configured to control the ECC engine and the channel interface circuit in response to an address and a command from the memory controller.

Abstract: A method of operating a memory system, having a non-volatile memory device, includes processing a response to a first request toward the memory device by using an original key, in response to the first request, generating and storing first parity data corresponding to the original key, and deleting the original key.

Abstract: A method of decoding a low density parity check (LDPC) code, includes dividing a parity check matrix of the LDPC code, into a plurality of sub blocks. The method further includes, for each of a plurality of decoding iterations, performing a node operation of each of target sub blocks among the plurality of sub blocks, the target sub blocks corresponding to a present decoding iteration among the plurality of decoding iterations, in a decoding schedule, estimating a reliability of each of the target sub blocks, based on a result of the node operation of each of the target sub blocks, and adjusting the decoding schedule, based on the reliability of each of the target sub blocks.

Abstract: A list decoding method for a polar code includes generating a tree-type decoding graph for input codeword symbols; the generating a tree-type decoding graph including, generating a decoding path list to which a decoding edge is added based on a reliability of a decoding path, the decoding path list being generated such that, among decoding paths generated based on the decoding edge, decoding paths within a threshold number of critical paths survive within the decoding path list in an order of high likelihood probability, and determining an estimation value, which corresponds to a decoding path having a maximum likelihood probability from among decoding paths of the decoding path list, as an information word.

Abstract: A method of operating a memory system, having a non-volatile memory device, includes processing a response to a first request toward the memory device by using an original key, in response to the first request, generating and storing first parity data corresponding to the original key, and deleting the original key.

Abstract: A list decoding method for a polar code includes generating a tree-type decoding graph for input codeword symbols; the generating a tree-type decoding graph including, generating a decoding path list to which a decoding edge is added based on a reliability of a decoding path, the decoding path list being generated such that, among decoding paths generated based on the decoding edge, decoding paths within a threshold number of critical paths survive within the decoding path list in an order of high likelihood probability, and determining an estimation value, which corresponds to a decoding path having a maximum likelihood probability from among decoding paths of the decoding path list, as an information word.

Abstract: An interleaving apparatus may include a first buffer unit configured to buffer input data in units having a size of a sector to generate sector unit data, an encoding unit configured to encode the sector unit data and generate a plurality of parity codes based on the encoding, a second buffer unit configured to interleave the sector unit data and the parity codes and generate interleaving data based on the interleaving, the second buffer unit including a plurality of output buffers configured to store the interleaving data, and an output unit configured to output the interleaving data.

Abstract: An encoding device includes an encoder and a puncturing unit. The encoder generates parity bits based on information bits. The puncturing unit punctures the parity bits based on a puncturing pattern complying with a first criterion determining a period of the puncturing pattern and a second criterion determining positions of remaining parity bits.

Abstract: An analog delay element for delaying an input clock signal to produce an output clock signal. The analog delay element includes a delay circuit for receiving the input clock signal and for providing an intermediate clock signal in response to a first bias voltage. A current mirror amplifier generates a first current in a first current branch in response to the intermediate clock signal, and generates a second current in a second current branch in response to the first current and a second bias voltage. The second current branch has an output node for providing the output clock signal having a logic level corresponding to the delayed intermediate clock signal logic level.

Abstract: An error correction code (ECC) circuit of a semiconductor memory device includes a syndrome generation circuit and a correction circuit. The syndrome generation circuit generates syndrome based on a message and first parity bits in a codeword read from a memory cell array by using one of a first parity check matrix and a second parity check matrix, in response to a decoding mode signal. The correction circuit receives the codeword, corrects at least a portion of (t1+t2) error bits in the codeword based on the syndrome and outputs a corrected message. Here, t1 and t2 are natural numbers, respectively.