Abstract: Provided are carbon dioxide capture composite particles which contribute to carbon neutrality by fixing carbon dioxide in seawater or an aqueous solution in which calcium ions are dissolved through mineralization, and a method of producing the same. More particularly, provided are carbon dioxide capture composite particles which capture carbon dioxide in seawater to form calcium carbonate particles, preferably aragonite type calcium carbonate, and a method of producing the same. In an exemplary embodiment, a method of producing carbon dioxide capture composite particles including: immersing polyamidoamine particles in seawater or an aqueous solution in which calcium ions are dissolved and maintaining the solution at room temperature under normal pressure to produce carbon dioxide capture composite particles in which aragonite type calcium carbonate particles are formed on a surface of the polyamidoamine particles is provided.

Abstract: Provided is a wafer prober. The wafer probing stage of the wafer prober includes: a lower plate; a plurality of lifting pillars mounted on an upper surface of the lower plate; and an upper plate mounted on upper ends of the plurality of lifting pillars, wherein the plurality of lifting pillars are located between the upper plate and the lower plate and ends of the lifting pillars are configured to lift up and down in a vertical direction, and wherein a height and a slope of the upper plate are adjusted according to heights of the lifting pillars. The wafer probing stage can adjust a height of the chuck arranged on the upper plate and a slope or flatness of the chuck by adjusting a height of each lifting pillar according to a weight applied to each lifting pillar.

Abstract: Provided is a wafer prober. The wafer probing stage of the wafer prober includes: a lower plate; a plurality of lifting pillars mounted on an upper surface of the lower plate; and an upper plate mounted on upper ends of the plurality of lifting pillars, wherein the plurality of lifting pillars are located between the upper plate and the lower plate and ends of the lifting pillars are configured to lift up and down in a vertical direction, and wherein a height and a slope of the upper plate are adjusted according to heights of the lifting pillars. The wafer probing stage can adjust a height of the chuck arranged on the upper plate and a slope or flatness of the chuck by adjusting a height of each lifting pillar according to a weight applied to each lifting pillar.