Patents by Inventor Kian Chong

Kian Chong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11684945
    Abstract: A dispensing system can include a material delivery assembly that includes a tubular reservoir with a tubular extension, where the tubular reservoir includes a longitudinal axis; a nozzle body, where the tubular extension fluidly couples the tubular reservoir to the nozzle body; and a rotor coupling that operatively couples to the material delivery assembly for rotation of the tubular reservoir about its longitudinal axis.
    Type: Grant
    Filed: June 20, 2020
    Date of Patent: June 27, 2023
    Assignee: NSW AUTOMATION SDN. BHD.
    Inventors: Kiang Ngee Boo, Kiang Seng Boo, Kian Chong Tai, Chin Hui Toh
  • Publication number: 20210394226
    Abstract: A dispensing system can include a material delivery assembly that includes a tubular reservoir with a tubular extension, where the tubular reservoir includes a longitudinal axis; a nozzle body, where the tubular extension fluidly couples the tubular reservoir to the nozzle body; and a rotor coupling that operatively couples to the material delivery assembly for rotation of the tubular reservoir about its longitudinal axis.
    Type: Application
    Filed: June 20, 2020
    Publication date: December 23, 2021
    Inventors: Kiang Ngee Boo, Kiang Seng Boo, Kian Chong Tai, Chin Hui Toh
  • Patent number: 7136799
    Abstract: A mixed signal delay locked loop characterization technique for automatically characterizing a mixed signal delay locked loop is provided. The technique tests the mixed signal delay locked loop using a top-down approach in order to ensure the robustness of the mixed signal delay locked loop. Top-level testing involves testing the performance of the mixed signal delay locked loop in different process corners, and the results obtained from the top-level testing are then used to test sub-components of the mixed signal delay locked loop.
    Type: Grant
    Filed: March 21, 2003
    Date of Patent: November 14, 2006
    Assignee: Sun Microsystems, Inc.
    Inventors: Kian Chong, Dean Liu, Claude R. Gauthier
  • Publication number: 20040183578
    Abstract: A mixed signal delay locked loop characterization technique for automatically characterizing a mixed signal delay locked loop is provided. The technique tests the mixed signal delay locked loop using a top-down approach in order to ensure the robustness of the mixed signal delay locked loop. Top-level testing involves testing the performance of the mixed signal delay locked loop in different process corners, and the results obtained from the top-level testing are then used to test sub-components of the mixed signal delay locked loop.
    Type: Application
    Filed: March 21, 2003
    Publication date: September 23, 2004
    Inventors: Kian Chong, Dean Liu, Claude R. Gauthier
  • Publication number: 20040017873
    Abstract: A delay locked loop characterization technique for automatically characterizing a delay locked loop is provided. The technique tests the delay locked loop using a top-down approach in order to ensure the robustness of the delay locked loop. Top-level testing involves testing the performance of the delay locked loop in different process corners, and the results obtained from the top-level testing are then used to test sub-components of the delay locked loop.
    Type: Application
    Filed: July 25, 2002
    Publication date: January 29, 2004
    Inventors: Kian Chong, Dean Liu, Claude Gauthier