Abstract: An example container includes a plurality of package segments, each having a respective conductive lead that is interrupted when its package segment is opened. The container includes a signaling source configured to provide two signals that are distinguishable from each other. A presence of one or both of the signals on a shared return line indicates whether one of the package segments has been opened.

Abstract: An example container includes a plurality of package segments, each having a respective conductive lead that is interrupted when its package segment is opened. The container includes a signaling source configured to provide two signals that are distinguishable from each other. A presence of one or both of the signals on a shared return line indicates whether one of the package segments has been opened.

Abstract: An illustrative wire processing machine includes at least one blade configured for at least one of cutting a conductor or at least piercing an insulation layer on the conductor. At least one gripper assembly includes a gripper configured to at least temporarily grasp a portion of a conductor during a wire processing operation. A generator, which is part of the gripper assembly, is configured to radiate a field toward a conductor. The gripper assembly also includes a detector that is configured to detect at least some of the field propagated along the conductor. A processor is configured to determine when a change in the propagated field detected by the detector indicates contact between a conductor and the blade.

Abstract: An illustrative example embodiment of a sensing device includes a force sensor that detects a force and provides an output indicative of the detected force. An acceleration sensor detects acceleration and provides an output indicative of the detected acceleration. A processor receives the output from the force sensor and the acceleration sensor. The processor provides an indication of a relationship between the detected force and the detected acceleration.

Abstract: An illustrative example conductor monitoring device includes a generator configured to radiate a field into a conductor. A detector is configured to detect at least some of the field propagated along the conductor. A processor is configured to determine when a change in the propagated field detected by the detector indicates contact between the conductor and a conductive blade of a wire processing machine. The example conductor monitoring device is capable of providing information regarding the condition of a conductor that has gone through a wire handling process that involves cutting the wire and stripping insulation from near the end of the cut wire, for example. The information regarding the condition of the wire is obtained without making contact with the wire and without interfering with or requiring any alteration of the wire handling process or machine.

Abstract: According to an example embodiment, a display system includes, among other things, a plurality of displays. A corresponding plurality of processors are associated with the displays. Each processor is configured to control a displayed image on one of the associated displays. A controller is configured to provide a control signal to each of the processors. The control signal indicates a desired image to be displayed on the displays. Each of the processors is configured to receive the control signal and determine whether the control signal satisfies at least one criterion. Each processor is configured to determine a portion of the desired image to be displayed on the associated display based on the control signal. Each controller is also configured to control the associated display to display the portion of the desired image at a time corresponding a timing indicator.

Abstract: An illustrative example embodiment of a sensing device includes a force sensor that detects a force and provides an output indicative of the detected force. An acceleration sensor detects acceleration and provides an output indicative of the detected acceleration. A processor receives the output from the force sensor and the acceleration sensor. The processor provides an indication of a relationship between the detected force and the detected acceleration.

Abstract: An illustrative wire processing machine includes at least one blade configured for at least one of cutting a conductor or at least piercing an insulation layer on the conductor. At least one gripper assembly includes a gripper configured to at least temporarily grasp a portion of a conductor during a wire processing operation. A generator, which is part of the gripper assembly, is configured to radiate a field toward a conductor. The gripper assembly also includes a detector that is configured to detect at least some of the field propagated along the conductor. A processor is configured to determine when a change in the propagated field detected by the detector indicates contact between a conductor and the blade.

Abstract: An illustrative example conductor monitoring device includes a generator configured to radiate a field into a conductor. A detector is configured to detect at least some of the field propagated along the conductor. A processor is configured to determine when a change in the propagated field detected by the detector indicates contact between the conductor and a conductive blade of a wire processing machine. The example conductor monitoring device is capable of providing information regarding the condition of a conductor that has gone through a wire handling process that involves cutting the wire and stripping insulation from near the end of the cut wire, for example. The information regarding the condition of the wire is obtained without making contact with the wire and without interfering with or requiring any alteration of the wire handling process or machine.

Abstract: According to an example embodiment, a display system includes, among other things, a plurality of displays. A corresponding plurality of processors are associated with the displays. Each processor is configured to control a displayed image on one of the associated displays. A controller is configured to provide a control signal to each of the processors. The control signal indicates a desired image to be displayed on the displays. Each of the processors is configured to receive the control signal and determine whether the control signal satisfies at least one criterion. Each processor is configured to determine a portion of the desired image to be displayed on the associated display based on the control signal. Each controller is also configured to control the associated display to display the portion of the desired image at a time corresponding a timing indicator.

Abstract: A sensor device includes at least one piezoelectric polymer film supported on a plate that is positioned relative to a machine such that a force used during a manufacturing process involving the machine is incident on the plate. The piezoelectric polymer film provides an electrical output indicative of the incident force. In a disclosed example, a single piezoelectric polymer film extends across a substantial portion of a surface area of the plate. In another disclosed example, a plurality of piezoelectric polymer film sensor elements area are arranged symmetrically about a location where the incident force is expected to be most prominent.

Abstract: A sensor device includes at least one piezoelectric polymer film supported on a plate that is positioned relative to a machine such that a force used during a manufacturing process involving the machine is incident on the plate. The piezoelectric polymer film provides an electrical output indicative of the incident force. In a disclosed example, a single piezoelectric polymer film extends across a substantial portion of a surface area of the plate. In another disclosed example, a plurality of piezoelectric polymer film sensor elements area are arranged symmetrically about a location where the incident force is expected to be most prominent.

Abstract: A device for determining the quality of a part includes a sensor for detecting a strain on a selected portion of a part forming machine. A controller utilizes the detected amount of strain to make a determination regarding the quality of a corresponding part. In one example, the sensor detects a compressive or tensile strain on a machine frame when the sensor is aligned to detect a strain parallel to a direction of a force applied during the part formation process. The controller uses one or more characteristics of the sensor output and determines whether the detected amount of strain is within an acceptable range. In one example, monitoring the strain during the formation of a plurality of acceptable parts provides information for determining the acceptable range. The disclosed arrangements allow for making part quality determinations without requiring a sensor to be “in line” with the load.

Abstract: Apparatus, and a corresponding method, for spatially isolating a transmit beam and a receive beam, which, in satellite communication systems, are inherently separated by a look ahead angle. A receive beam separation mirror is positioned in the receive beam path but out of the transmit beam path, and the receive beam is reflected along a path separated from the transmit beam path. The mirror may be annular, allowing the transmit beam to be directed through the center of the mirror. In applications where a desired isolation angle is different from the look ahead angle, or where there is no look ahead angle, the receive beam separation mirror is used in conjunction with a dichroic beam splitter and at least one receive beam steering mirror, to achieve the desired angular separation.

Abstract: A sensor device includes a source of radiation that irradiates a plurality of sensing elements. A test object is passed through the spacing between the source of radiation and the sensing elements so that the object blocks the radiation from at least some of the sensing elements. The sensor device provides two-dimensional profile information based upon which ones of the sensing elements are blocked from the radiation and an amount of time that the radiation is blocked at each sensing element. One example use of the inventive arrangement is for monitoring the quality of formed tube ends. Another example disclosed use is for monitoring the quality and characteristics of stripped wire ends.

Abstract: An electrical assembly testing device includes the capability of testing for specific components of interest. A sample component and the component of interest receive a test signal from a test signal generator. An output from each component in response to the test signal is utilized by a controller to determine a relationship between the outputs. The determined relationship between the outputs provides information regarding the component of interest so that the controller can make a determination whether the component is acceptable or whether it fails to meet selected criteria. In one example, a device designed according to this invention is particularly well suited for testing capacitors within wire harness assemblies.

Abstract: An electrical assembly testing device includes the capability of testing for specific components of interest. A sample component and the component of interest receive a test signal from a test signal generator. An output from each component in response to the test signal is utilized by a controller to determine a relationship between the outputs. The determined relationship between the outputs provides information regarding the component of interest so that the controller can make a determination whether the component is acceptable or whether it fails to meet selected criteria. In one example, a device designed according to this invention is particularly well suited for testing capacitors within wire harness assemblies.

Abstract: A sensor device includes a source of radiation that irradiates a plurality of sensing elements. A test object is passed through the spacing between the source of radiation and the sensing elements so that the object blocks the radiation from at least some of the sensing elements. The sensor device provides two-dimensional profile information based upon which ones of the sensing elements are blocked from the radiation and an amount of time that the radiation is blocked at each sensing element. One example use of the inventive arrangement is for monitoring the quality of formed tube ends. Another example disclosed use is for monitoring the quality and characteristics of stripped wire ends.

Abstract: A wire analyzing device includes a source of radiation that irradiates a plurality of sensing elements. The source of radiation preferably is a laser beam and the sensing elements preferably are light sensitive devices that each provide an individual output indicating the amount of radiation incident on each sensing element. A wire sample is moved near the sensing elements so that it interrupts the radiation received by each sensing element. The output of each sensing element is utilized to determine any one or more of a number of desired characteristics of the wire sample. Example characteristics include the length and condition of an exposed, conductive portion of the wire, a position of an insulation shoulder, a position, orientation and condition of a seal member placed onto the wire.

Abstract: An improved method of monitoring the quality of a crimping machine includes setting the boundaries based upon the mean and standard deviation of a number of learned samples. By setting the boundaries based on actual samples, the system is better able to identify whether a particular sample is in fact defective or acceptable. In the prior art, the boundaries have been preset subjectively. By utilizing learned samples, the present invention is able to insure that the particular boundaries are proper given the particular size of wire, the particular type of connector, and particular arrangement of machinery that is being monitored.