Patents by Inventor Kieu Do

Kieu Do has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11748240
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: November 3, 2020
    Date of Patent: September 5, 2023
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 11113184
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: May 19, 2016
    Date of Patent: September 7, 2021
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 11055212
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: August 27, 2019
    Date of Patent: July 6, 2021
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20210073113
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: November 3, 2020
    Publication date: March 11, 2021
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 10838006
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: June 27, 2019
    Date of Patent: November 17, 2020
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20190391204
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: August 27, 2019
    Publication date: December 26, 2019
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20190317147
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: June 27, 2019
    Publication date: October 17, 2019
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 10429442
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: June 13, 2017
    Date of Patent: October 1, 2019
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 10365326
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two module representations of the plurality of module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the plurality of module representations, and the one or more connections. The test scenario model includes a path from the input via the plurality of module representations and the one or more connections to the desired output.
    Type: Grant
    Filed: January 11, 2018
    Date of Patent: July 30, 2019
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20180136277
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: January 11, 2018
    Publication date: May 17, 2018
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 9874608
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: April 26, 2017
    Date of Patent: January 23, 2018
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20170276727
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: June 13, 2017
    Publication date: September 28, 2017
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20170227603
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: April 26, 2017
    Publication date: August 10, 2017
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 9689921
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: February 26, 2016
    Date of Patent: June 27, 2017
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 9651619
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: March 25, 2016
    Date of Patent: May 16, 2017
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20160266203
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: May 19, 2016
    Publication date: September 15, 2016
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20160209469
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: March 25, 2016
    Publication date: July 21, 2016
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Publication number: 20160196197
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Application
    Filed: February 26, 2016
    Publication date: July 7, 2016
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 9360523
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: April 17, 2015
    Date of Patent: June 7, 2016
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse
  • Patent number: 9316689
    Abstract: A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.
    Type: Grant
    Filed: April 17, 2015
    Date of Patent: April 19, 2016
    Assignee: Breker Verification Systems
    Inventors: Adnan Hamid, Kairong Qian, Kieu Do, Joerg Grosse