Abstract: A channel electron multiplier including a single channel CEM for receiving an input particle. A multi-channel CEM is positioned after the single channel CEM for receiving emissions from the single channel CEM. An electron collector is positioned after the multi-channel CEM for generating a pulse current in response to emissions from the multi-channel CEM.

Abstract: A channel electron multiplier including a single channel CEM for receiving an input particle. A multi-channel CEM is positioned after the single channel CEM for receiving emissions from the single channel CEM. An electron collector is positioned after the multi-channel CEM for generating a pulse current in response to emissions from the multi-channel CEM.

Abstract: An ion detection system includes a mass analyzer generating an ion beam along an ion beam longitudinal axis. A field generator generates a field for altering the direction of ions in the ion beam away from the ion beam longitudinal axis. A conversion dynode includes an ion collision region on a conversion dynode surface. A conversion dynode axis passes through the ion collision region perpendicular to the conversion dynode surface, the conversion dynode axis being offset from and not intersecting the ion beam longitudinal axis. An electron multiplier receives secondary charged particles from the conversion dynode generated in response to the ion collision with the conversion dynode surface.

Abstract: An embodiment of the invention is an electron multiplier including a first plate having an electron emissive first interior surface. A second plate has an electron emissive second interior surface. A voltage source is connected across the first plate and the second plate. A collector generates a signal responsive to electron multiplication by the first plate and the second plate. The first interior surface and the second interior surface are parallel and are non-planar.