Abstract: There is provided a probe apparatus. The probe apparatus has a first end configured to connect to a rotating scanner device. The probe apparatus further has a second end with two or more eddy current elements. The second end further has a positioning mechanism configured to position the two or more eddy current elements against cavity walls of an annular cavity of a structure to be inspected with the probe apparatus, when the probe apparatus is positioned within the annular cavity. The second end further has an aligning mechanism coupled to the positioning mechanism. The aligning mechanism is configured to align the two or more eddy current elements in a perpendicular position with respect to the cavity walls of the annular cavity, when the probe apparatus is positioned within the annular cavity.

Abstract: A testing apparatus may include a reservoir and a test tank. The reservoir may contain a solution. The test tank may contain a test specimen for stress corrosion testing. A fill pump may pump the solution from the reservoir to the test tank. A sequence controller may be communicatively coupled to the fill pump and may provide sequence timing to control an immersion time period and a drying time period of the test specimen.

Abstract: There is provided a probe apparatus. The probe apparatus has a first end configured to connect to a rotating scanner device. The probe apparatus further has a second end with two or more eddy current elements. The second end further has a positioning mechanism configured to position the two or more eddy current elements against cavity walls of an annular cavity of a structure to be inspected with the probe apparatus, when the probe apparatus is positioned within the annular cavity. The second end further has an aligning mechanism coupled to the positioning mechanism. The aligning mechanism is configured to align the two or more eddy current elements in a perpendicular position with respect to the cavity walls of the annular cavity, when the probe apparatus is positioned within the annular cavity.

Abstract: A non-destructive method is provided for measuring a non-scattering coating on a non-specular or specular surface of a metallic substrate. The surface may be a rough surface, such as a chemically milled surface. Infrared energy is transmitted into an integrating sphere that is in physical contact with a sample of the coating on the metallic substrate. The infrared energy is partially absorbed by the coating. The infrared energy is in part specularly reflected by the metallic substrate and is in part scattered by the metallic substrate depending on the wavelength of the infrared radiation. The integrating sphere integrates and collects total reflectance of the infrared energy. Infrared detectors detect the total reflectance at two wavelength bands. A decrease in total reflectance in one of the two wavelength bands indicates presence of the coating or may be mapped to an amount of the coating.

Abstract: A non-destructive method is provided for measuring a non-scattering coating on a non-specular or specular surface of a metallic substrate. The surface may be a rough surface, such as a chemically milled surface. Infrared energy is transmitted into an integrating sphere that is in physical contact with a sample of the coating on the metallic substrate. The infrared energy is partially absorbed by the coating. The infrared energy is in part specularly reflected by the metallic substrate and is in part scattered by the metallic substrate depending on the wavelength of the infrared radiation. The integrating sphere integrates and collects total reflectance of the infrared energy. Infrared detectors detect the total reflectance at two wavelength bands. A decrease in total reflectance in one of the two wavelength bands indicates presence of the coating or may be mapped to an amount of the coating.