Abstract: Power consumption in an integrated circuit memory is reduced by lowering the power supply demand from an on-chip pumped VCCP power source. Only the row decoders for subarrays in a memory bank that were previously activated are precharged in response to a bank precharge command. Additional circuitry is provided to the precharge clock generator circuit. The additional circuitry includes a latch that is set when an array select signal is asserted, and reset when a precharge operation for that bank occurs.

Abstract: A high-speed, static random access memory (SRAM) compatible, high availability memory array and method employing synchronous dynamic random access memory (DRAM) in conjunction with a data cache and separate data read and write registers and tag blocks. The inclusion of separate data read and write registers allows the device to effectively operate at a cycle time limited only by the DRAM subarray cycle time. Further, the inclusion of two tag blocks allows one to be accessed with an externally supplied address and the other to be accessed with a write-back address, thus eliminating the requirement for a single tag to execute two read-modify write cycles in one DRAM cycle time.

Abstract: A powergating circuit includes a P-channel transistor with a source coupled to VCC, a gate for receiving a first boosted or non-boosted powergating control signal, and a drain forming the internal switched VCC power supply. An N-channel transistor has a source coupled to VSS, a gate for receiving a second boosted or non-boosted powergating control signal, and a drain forming the internal switched VSS power supply. The powergating circuit further includes a circuit for forcing the first and second internal power supply voltages to a mid-point reference voltage during the standby mode.

Abstract: A precharge initiated dynamic random access memory (DRAM) technique of especial utility with respect to DRAM devices and other integrated circuit devices incorporating embedded DRAM in which the rising edge of each clock initiates a precharge to those subarrays that were active as opposed to conventional techniques wherein the subarrays are typically precharged so that they are made ready on the rising edge of the clock, which would then start an active cycle. The longer restore time that is achieved can be used to enable the establishment of better logic “1” and “0” levels in the memory cells, to reduce the device clock period and/or to enable other functions to be performed in parallel with the precharge function.

Abstract: A power-gating system and method for integrated circuit devices wherein the minimization of “Standby” or “Sleep Mode” current is a design factor and wherein an output stage is coupled directly between a supply voltage level (VCC) and a reference voltage level (VSS). In a representative complementary metal oxide semiconductor (CMOS) implementation, the gate of the N-channel output transistor in the final inverter stage may be driven below VSS in Sleep Mode while, alternatively, the corresponding P-channel transistor can be driven above VCC. In Active Mode, the switching speed of the output stage is not impacted, and the preceding stage can be made smaller than that of the output stage.

Abstract: A column read amplifier power-gating technique for DRAM devices and those devices incorporating embedded DRAM which incorporate a power-down (or Sleep) mode of operation which overcomes the deficiencies of conventional power-gating approaches by eliminating the need for a large, separate power-gating transistor thereby saving on-chip area yet still reducing power during Sleep Mode. In operation, the column select signal YR is controlled such that it is driven below VSS during Sleep Mode when N-channel pass transistors are used in the column read amplifier or to a supply voltage level of VCC when P-channel devices are used instead. This significantly reduces the current through the pass transistors and yet causes no reduction in the switching speed of the column read amplifiers.

Abstract: A high speed power-gating technique for an integrated circuit device having a Sleep Mode of operation comprises providing an output stage coupled between a supply voltage source and a reference voltage source and driving a gate terminal of least one element of the output stage to a level above that of the supply voltage source or below that of the reference voltage source in the Sleep Mode of operation.

Abstract: An integrated circuit transistor body bias regulation circuit and method of especial applicability with respect to low voltage applications wherein the threshold voltage (Vt) of certain transistors is lowered at low power supply voltage (VCC) levels, low temperature and/or high Vt process conditions to assure adequate transistor drive but may also be raised at high VCC levels, high temperature and/or low Vt process conditions to reduce leakage current. In this manner, circuit speed that is closer to constant (versus VCC, temperature and process variation) is thereby achieved.

Abstract: A sense amplifier power-gating circuit and method is disclosed which is of particular utility with respect to DRAM devices, or those incorporating embedded DRAM, and having a power-down (or Sleep) mode of operation. In accordance with a particular technique of the present invention, the local sense amplifier driver transistors serve a dual purpose as both driver and power gate transistors thereby obviating the need for large, distinct power-gating devices. This serves to minimize on-chip area requirements while not degrading sensing speed as in conventional approaches.

Abstract: An improved integrated circuit area efficient redundancy multiplexer circuit technique provides similar functionality to conventional CMOS transmission, or “pass” gates while concomitantly reducing circuit complexity, the die area necessary to support redundant elements and complementary control signals in memory device ICs and undesired parasitic capacitance. The technique of the present invention effectuates this end by utilizing the on-chip boosted voltage levels (Vpp) which are generally available in integrated circuit memory devices to supply the voltage for the control signal applied to a single N-channel transistor pass gate instead of the conventional supply voltage level of Vcc. The Vpp voltage and circuit ground (“GND”) are then utilized as the logic “high” and “low” signal levels respectively. This use is made possible due to the fact that these control signals operate at a direct current (“DC”) level after device power-up.

Abstract: An improved integrated circuit area efficient redundancy multiplexer circuit technique provides similar functionality to conventional CMOS transmission, or “pass” gates while concomitantly reducing circuit complexity, the die area necessary to support redundant elements and complementary control signals in memory device ICs and undesired parasitic capacitance. The technique of the present invention effectuates this end by utilizing the on-chip boosted voltage levels (VPP) which are generally available in integrated circuit memory devices to supply the voltage for the control signal applied to a single N-channel transistor pass gate instead of the conventional supply voltage level of VCC. The VPP voltage and circuit ground (“GND”) are then utilized as the logic “high” and “low” signal levels respectively. This use is made possible due to the fact that these control signals operate at a direct current (“DC”) level after device power-up.

Abstract: A sense amplifier for a very high density integrated circuit memory using CMOS technology is described. Each sense amplifier includes first and second local sense amplifier drive transistors, one connecting the P channel transistors to VCC; the other connecting the N channel transistors to VSS. A read amplifier circuit is provided within each sense amplifier and is operated by read control signals. Internal nodes of the latch of the sense amplifier are coupled by pass transistors that are responsive to column write control signals. Local data write driver transistors are also provided to selectively couple the pass transistors to VCC-Vt or VSS in response to further data write control signals. A relatively wider power line is coupled to the drive transistors to provide VCC thereto, and a narrower line is used to control those first sense amplifier drive transistors.