Patents by Inventor Kimberly Tuck

Kimberly Tuck has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method, System and Device for Microscopic Examination Employing Fib-Prepared Sample Grasping Element
    Publication number: 20070187623
    Abstract: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.
    Type: Application
    Filed: April 17, 2007
    Publication date: August 16, 2007
    Applicant: ZYVEX INSTRUMENTS, LLC
    Inventors: George SKIDMORE, Matthew ELLIS, Aaron GEISBERGER, Kenneth BRAY, Kimberly TUCK, Robert Folaron
  • Method, system and device for microscopic examination employing fib-prepared sample grasping element
    Patent number: 7227140
    Abstract: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.
    Type: Grant
    Filed: September 23, 2004
    Date of Patent: June 5, 2007
    Assignee: Zyvex Instruments, LLC
    Inventors: George Skidmore, Matthew D. Ellis, Aaron Geisberger, Kenneth Bray, Kimberly Tuck, Robert Folaron
  • Method, system and device for microscopic examination employing fib-prepared sample grasping element
    Publication number: 20050178980
    Abstract: A method including, in one embodiment, severing a sample at least partially from a substrate by cutting the substrate with a focused ion beam (FIB), capturing the substrate sample by activating a grasping element, and separating the captured sample from the substrate. The captured sample may be separated from the substrate and transported to an electron microscope for examination.
    Type: Application
    Filed: September 23, 2004
    Publication date: August 18, 2005
    Applicant: Zyvex Corporation
    Inventors: George Skidmore, Matthew Ellis, Aaron Geisberger, Kenneth Bray, Kimberly Tuck, Robert Folaron