Patents by Inventor Kimio Kuno

Kimio Kuno has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6815943
    Abstract: An electric parts testing system comprises a testing unit to test electric parts for individual condition identifiers assigned for identification of a plurality of test conditions different from each other; a first memory unit which previously stores estimated causes in relation at least to each said condition identifier, said estimated causes being obtained by estimation as causes of defectiveness of the electric parts; a second memory unit to store at least one or more of the condition identifiers regarded as fault-connected identifiers when any of the electric parts are judged to be defective; and an arithmetical unit to calculate a parameter when there are a plurality of said fault-connected identifiers, said parameter being related to the fault-connected identifiers at least for each said estimated cause related to the fault-connected identifiers.
    Type: Grant
    Filed: May 14, 2003
    Date of Patent: November 9, 2004
    Assignee: Advantest Corporation
    Inventor: Kimio Kuno
  • Publication number: 20040032249
    Abstract: An electric parts testing system comprises a testing unit to test electric parts for individual condition identifiers assigned for identification of a plurality of test conditions different from each other; a first memory unit which previously stores estimated causes in relation at least to each said condition identifier, said estimated causes being obtained by estimation as causes of defectiveness of the electric parts; a second memory unit to store at least one or more of the condition identifiers regarded as fault-connected identifiers when any of the electric parts are judged to be defective; and an arithmetical unit to calculate a parameter when there are a plurality of said fault-connected identifiers, said parameter being related to the fault-connected identifiers at least for each said estimated cause related to the fault-connected identifiers.
    Type: Application
    Filed: May 14, 2003
    Publication date: February 19, 2004
    Inventor: Kimio Kuno