Patents by Inventor Kinichi Matsushita

Kinichi Matsushita has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test pattern for use in measuring thickness of insulating layer and method for using the same
    Patent number: 6218847
    Abstract: A test pattern for use in measuring thickness of insulating layer comprising a wiring pattern provided in an insulating layer and a dummy pattern provided in the insulating layer. The wiring pattern has a electrical resistant value depending on the thickness of the insulating layer. The dummy pattern is provided so as to be adjacent to the wiring layer. The dummy pattern allows the thickness of the insulating layer thereon to be directly measured. By using the test pattern, characteristic chart showing a relationship between the electrical resistance value and the thickness of the insulating layer.
    Type: Grant
    Filed: November 25, 1997
    Date of Patent: April 17, 2001
    Assignee: Oki Electric Industry Co., Ltd.
    Inventor: Kinichi Matsushita