Patents by Inventor Kinji Takizawa

Kinji Takizawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5272120
    Abstract: A method of making a ceramic material by radiating a laser beam onto the portion of said ceramic material to be marked in a low oxygen atmosphere and a block gauge marked by this marking method. This marking method enables a ceramic material to have a distinct mark. A block gauge composed of a ceramic material has excellent properties such as corrosion resistance.
    Type: Grant
    Filed: July 1, 1992
    Date of Patent: December 21, 1993
    Assignee: Mitutoyo Corporation
    Inventors: Tetsuo Kosuda, Yoshirou Kamata, Kinji Takizawa
  • Patent number: 4679326
    Abstract: A height gauge has a touch signal probe provided on a slider vertically movably supported on a support for the purpose of measuring the dimensions or the like of an object by bringing the probe into contact with the object. A rack is formed on the support, and a driving shaft is disposed on the slider, the driving shaft having a pinion engaged with the rack. To the driving shaft are secured a pulley to which the turning force from a motor is transmitted and a control wheel for manually rotating the driving shaft. A clutch member is interposed between the pulley and the control wheel. When the clutch member is engaged with the pulley, the slider is automatically moved up and down, while when the clutch member is engaged with the control wheel, the slider can be manually moved up and down. The height gauge further includes a control circuit which stops the drive of the motor when the touch signal probe generates a touch signal and which holds the indication of a measured value being displayed at that time.
    Type: Grant
    Filed: November 15, 1985
    Date of Patent: July 14, 1987
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventors: Kinji Takizawa, Ichiro Mizuno, Iwao Sugizaki
  • Patent number: 4444504
    Abstract: A displacement measuring instrument wherein the instrument comprises a main scale and a carriage movable along the main scale having thereon mounted an index scale whose graduated surface is opposed through a minute space to a graduated surface of said main scale, and a value of relative displacement between the main scale and the carriage is measured from a variation in volume of a light emitted to the main scale and the index scale and transmitted therethrough or reflected thereat due to the relative movement between the scales, is of such an arrangement that at least part of travel guide mechanisms for said carriage comprises a groove formed in the moving direction of the carriage on either the graduated surface of said main scale or the outer surface of the carriage opposed to said graduated surface and convex guide means solidly secured to the rest of the abovementioned surfaces and guided in travel by the groove.
    Type: Grant
    Filed: April 21, 1981
    Date of Patent: April 24, 1984
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventor: Kinji Takizawa
  • Patent number: 4414746
    Abstract: A linear scale type measuring instrument comprising a hollow case, a linear scale housed in said hollow case and a slider movable along said linear scale, wherein at least part of a travel guide mechanism of the slider includes bearings rotatably supported on the slider and a guide bar being circular in cross section, supported by said hollow case and in abutting contact at the outer peripheral surface thereof with portions of rotating surface of the bearings.
    Type: Grant
    Filed: February 23, 1981
    Date of Patent: November 15, 1983
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventor: Kinji Takizawa
  • Patent number: 4261106
    Abstract: A linear digital scale including an extended linear digital scale made up with a plurality of relatively small digital scale pieces which are connected and fixed together, and its manufacturing method in which graduation coincidence by use of a standard scale removes the errors produced at bound and fixed sections.
    Type: Grant
    Filed: May 31, 1979
    Date of Patent: April 14, 1981
    Assignee: Mitutoyo Mfg. Co., Ltd.
    Inventor: Kinji Takizawa