Abstract: An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware hooks (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and debug of a part/platform under test.

Abstract: Devices for sensing touch on a surface using a minimum depth-value surface characterization, including associated methods, are disclosed and described.

Abstract: A depth-sensing camera may be used to locate objects on a planar surface. A planar fit calculation is used to model the surface. One problem with the best planar fit calculation is that it is not robust over time. Firstly, this is because the depth data has a non-linear curve near its extremities because of camera lens distortion. Secondly, as the depth-sensing camera warms up and its thermal activity changes, the depth data drifts and the initial plane fit is no longer valid. The position and the amount of curvature and drift may be different for cameras of the same make and model in some cases. In accordance with some embodiments, algorithms may be used to detect and correct for these types of errors to support more robust plane fitting in real time.

Abstract: A depth-sensing camera may be used to locate objects on a planar surface. A planar fit calculation is used to model the surface. One problem with the best planar fit calculation is that it is not robust over time. Firstly, this is because the depth data has a non-linear curve near its extremities because of camera lens distortion. Secondly, as the depth-sensing camera warms up and its thermal activity changes, the depth data drifts and the initial plane fit is no longer valid. The position and the amount of curvature and drift may be different for cameras of the same make and model in some cases. In accordance with some embodiments, algorithms may be used to detect and correct for these types of errors to support more robust plane fitting in real time.

Abstract: An apparatus and method is described herein for providing a test, validation, and debug architecture. At a target or base level, hardware (Design for Test or DFx) are designed into and integrated with silicon parts. A controller may provide abstracted access to such hooks, such as through an abstraction layer that abstracts low level details of the hardware DFx. In addition, the abstraction layer through an interface, such as APIs, provides services, routines, and data structures to higher-level software/presentation layers, which are able to collect test data for validation and debug of a unit/platform under test. Moreover, the architecture potentially provides tiered (multiple levels of) secure access to the test architecture. Additionally, physical access to the test architecture for a platform may be simplified through use of a unified, bi-directional test access port, while also potentially allowing remote access to perform remote test and de-bug of a part/platform under test.