Abstract: A mechanism for improving speed of table model-based simulation of complex circuits that include transistors and other devices that share similar properties is provided. Circuit simulation speed is improved by efficiently identifying transistors and other devices having substantially the same properties that share a same state at the time of interest in the simulation. Transistors and other devices are collected into groups having the same characteristics and topologies prior to simulation. Then during simulation, a determination is made as to whether a previously-evaluated transistor or device in the same group as a presently-being evaluated transistor or device has terminal input values that are the same, or nearly the same. If so, a cache lookup is performed to determine table model solution values for the previously-evaluated transistor or device, and those values are used to determine exact output values per the table model of the presently being evaluated transistor or device.

Abstract: There are provided a highly safe epimerase usable in food industry, and a method for producing a ketose. Resolution: The epimerase is a ketose 3-epimerase obtainable from a microorganism of the genus Arthrobacter, and having (1) substrate specificity whereby a D- or L-ketose is epimerized at position 3 to produce a corresponding D- or L-ketose, and (2) the highest substrate specificity for D-fructose and D-psicose among D- and L-ketoses.

Abstract: Task: There are provided a highly safe epimerase usable in food industry, and a method for producing a ketose. Resolution: The epimerase is a ketose 3-epimerase obtainable from a microorganism of the genus Arthrobacter, and having (1) substrate specificity whereby a D- or L-ketose is epimerized at position 3 to produce a corresponding D- or L-ketose, and (2) the highest substrate specificity for D-fructose and D-psicose among D- and L-ketoses.

Abstract: A mechanism for improving speed of table model-based simulation of complex circuits that include transistors and other devices that share similar properties is provided. Circuit simulation speed is improved by efficiently identifying transistors and other devices having substantially the same properties that share a same state at the time of interest in the simulation. Transistors and other devices are collected into groups having the same characteristics and topologies prior to simulation. Then during simulation, a determination is made as to whether a previously-evaluated transistor or device in the same group as a presently-being evaluated transistor or device has terminal input values that are the same, or nearly the same. If so, a cache lookup is performed to determine table model solution values for the previously-evaluated transistor or device, and those values are used to determine exact output values per the table model of the presently being evaluated transistor or device.

Abstract: A method of providing simulation results includes detecting any power net and rail in a circuit netlist. The circuit can be divided into net-partitioned blocks. Using these net-partitioned blocks, a topological analysis can be performed to identify cuttable/un-cuttable devices and synchronization requirements. Then, the circuit can be re-divided into rail-partitioned blocks. Using these rail-partitioned blocks, a sparse solver can identify potential partitions, but eliminate fill-ins as determined by the topological analysis. A cost function can be applied to the potential partitions as well as the identified cuttable/un-cuttable devices to determine final cut points in the circuit and dynamic inputs to the final blocks. Simulation can be performed on the final blocks and simulation results can be generated.

Abstract: A method of providing simulation results includes detecting any power net and rail in a circuit netlist. The circuit can be divided into net-partitioned blocks. Using these net-partitioned blocks, a topological analysis can be performed to identify cuttable/un-cuttable devices and synchronization requirements. Then, the circuit can be re-divided into rail-partitioned blocks. Using these rail-partitioned blocks, a sparse solver can identify potential partitions, but eliminate fill-ins as determined by the topological analysis. A cost function can be applied to the potential partitions as well as the identified cuttable/un-cuttable devices to determine final cut points in the circuit and dynamic inputs to the final blocks. Simulation can be performed on the final blocks and simulation results can be generated.