Patents by Inventor Kiran Jitendra

Kiran Jitendra has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240112935
    Abstract: A system for glass substrate inspection, such as flat patterned media, includes an air table that holds the glass substrate. The air table includes chucks that emit gas as air bearings. A camera is disposed over the air table and moves in a direction across a width of a top surface of the glass substrate. An assembly includes a gripper and a probe bar configured to be transported under the camera. The gripper is configured to grip a bottom surface of the glass substrate opposite the top surface. The probe bar delivers driving signals to the glass substrate through a plurality of probe pins.
    Type: Application
    Filed: December 6, 2023
    Publication date: April 4, 2024
    Inventors: Neil Dang Nguyen, Kent Nguyen, Kiran Jitendra, Inho Chae, Gordon Yue
  • Publication number: 20220208579
    Abstract: A system for glass substrate inspection, such as flat patterned media, includes an air table that holds the glass substrate. The air table includes chucklets that emit gas as air bearings. A camera is disposed over the air table and moves in a direction across a width of a top surface of the glass substrate. An assembly includes a gripper and a probe bar configured to be transported under the camera. The gripper is configured to grip a bottom surface of the glass substrate opposite the top surface. The probe bar delivers driving signals to the glass substrate through a plurality of probe pins.
    Type: Application
    Filed: December 29, 2020
    Publication date: June 30, 2022
    Inventors: Neil Dang Nguyen, Kent Nguyen, Kiran Jitendra, Inho Chae, Gordon Yue
  • Patent number: 10962567
    Abstract: A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.
    Type: Grant
    Filed: November 22, 2016
    Date of Patent: March 30, 2021
    Inventors: Gordon Yue, Lloyd Russell Jones, Neil Dang Nguyen, Kiran Jitendra, Kent Nguyen, Steven Aochi
  • Publication number: 20170146567
    Abstract: A probe system for facilitating inspection of a device under test comprising a plurality of panels, the probe system incorporating: a configurable universal probe bar comprising a plurality of probe blocks, the plurality of probe blocks comprising a plurality of probe pins positioned to simultaneously electrically engage a plurality of cell contact pads of the plurality of panels of the device under test to deliver a plurality of electrical test signals; and an alignment system configured to achieve an alignment of the plurality of probe pins with the plurality of the cell contact pads of the plurality of panels of the device under test.
    Type: Application
    Filed: November 22, 2016
    Publication date: May 25, 2017
    Inventors: Gordon Yue, Lloyd Russell Jones, Neil Dang Nguyen, Kiran Jitendra, Kent Nguyen, Steven Aochi
  • Patent number: 9103876
    Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.
    Type: Grant
    Filed: January 7, 2011
    Date of Patent: August 11, 2015
    Assignee: PHOTON DYNAMICS, INC.
    Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard
  • Publication number: 20120319713
    Abstract: A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.
    Type: Application
    Filed: January 7, 2011
    Publication date: December 20, 2012
    Applicant: PHOTON DYNAMICS, INC.
    Inventors: Kent Nguyen, Kaushal Gangakhedkar, David Baldwin, Nile Light, Steve Aochi, Yan Wang, Atila Ersahin, Hai Tran, Thomas H. Bailey, Kiran Jitendra, Alan Cable, Dave Smiley, Thomas E. Wishard