Abstract: A circuit on an integrated circuit is made from a design that is verified using a design tool. The design tool takes a model of the circuit and generates equations with respect to nodes on the circuit. The time consuming task of completely determining the voltage at each node is performed for a predetermined input. To determine the node voltages for other signals, the first order transfer function of the equations is taken and then calculated for the predetermined input. A first order estimate of the node voltages is achieved using this first order transfer function and the node voltages determined from the predetermined input. A second order estimate is achieved using the first order transfer function and the first order estimate. A third order estimate is achieved using the first order transfer function and the second order estimate. The circuit design is verified for manufacturabiltity then manufactured.

Abstract: A circuit on an integrated circuit is made from a design that is verified using a design tool. The design tool takes a model of the circuit and generates equations with respect to nodes on the circuit. The time consuming task of completely determining the voltage at each node is performed for a predetermined input. To determine the node voltages for other signals, the first order transfer function of the equations is taken and then calculated for the predetermined input. A first order estimate of the node voltages is achieved using this first order transfer function and the node voltages determined from the predetermined input. A second order estimate is achieved using the first order transfer function and the first order estimate. A third order estimate is achieved using the first order transfer function and the second order estimate. The circuit design is verified for manufacturabiltity then manufactured.

Abstract: The present invention relates generally to analyzing small signal response and noise in nonlinear circuits. One embodiment relates to a computer implemented method for analyzing an electrical circuit. The method includes receiving a circuit description and circuit element models, generating circuit equations using the circuit description and models, and determining a periodic stead-state response of the electrical circuit in the time domain. The method further includes linearizing the circuit element models about the steady-state response, generating a time-varying linear system of equations, and representing a small signal solution to the time-varying linear system of equations in response to a sine wave input as an amplitude modulated sine wave.

Abstract: The present invention relates generally to analyzing small signal response and noise in nonlinear circuits. One embodiment relates to a computer implemented method for analyzing an electrical circuit. The method includes receiving a circuit description and circuit element models, generating circuit equations using the circuit description and models, and determining a periodic stead-state response of the electrical circuit in the time domain. The method further includes linearizing the circuit element models about the steady-state response, generating a time-varying linear system of equations, and representing a small signal solution to the time-varying linear system of equations in response to a sine wave input as an amplitude modulated sine wave.

Abstract: Heterostructure barrier quantum well device with a super-lattice structure of alternating lightly doped and heavily doped spacer layers having multiple, stable current-voltage curves extending continuously through zero bias at ambient temperature. The device can be repetitively switched between the multiple current-voltage curves. Once placed on a particular curve, the device retains memory of the curve it has been set on, even if held at zero bias for extended periods of time. The device can be switched between current-voltage curve settings at higher positive or negative voltages and can be read at lower voltages. Switching between current-voltage curve settings can also be effected by additional terminal connection(s) to the spacer layer(s).