Patents by Inventor Kiran Nagaraja

Kiran Nagaraja has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7921206
    Abstract: A computer implemented technique framework, prototype tool and associated methods that provide a high degree of visibility and control over the in-field execution of software in a minimally intrusive manner wherein developer-defined correctness tests and validation logic are embedded into the sensor node itself, making in-field software testing autonomous without necessitating continuous developer participation.
    Type: Grant
    Filed: April 18, 2008
    Date of Patent: April 5, 2011
    Assignee: NEC Laboratories America, Inc.
    Inventors: Kiran Nagaraja, Vijay Raghunathan, Florin Sultan, Srimat Chakradhar, Nupur Kothari
  • Patent number: 7581142
    Abstract: A method and system usable in sensor networks for handling memory faults is disclosed. In order to protect the operating system of a sensor node, coarse-grained memory protection is provided by creating and enforcing an application fault domain in the data memory address space of the sensor node. The data memory accessed by the application modules is restricted to the region (which defines the application fault domain) within the data memory address space. The application modules are prevented from accessing memory outside the application fault domain through software-based run-time checks. The state belonging to the operations system is maintained outside of the application fault domain, and is thus protected from memory corruption from any application module. In order to ensure that an application module does not operate on a corrupted state, fine-grained error detection and recovery is provided within the application fault domain.
    Type: Grant
    Filed: December 26, 2006
    Date of Patent: August 25, 2009
    Assignee: NEC Laboratories America, Inc.
    Inventors: Florin Sultan, Kiran Nagaraja, Srimat T. Chakradhar, Ram Kumar Rengaswamy
  • Publication number: 20080320130
    Abstract: A computer implemented technique framework, prototype tool and associated methods that provide a high degree of visibility and control over the in-field execution of software in a minimally intrusive manner wherein developer-defined correctness tests and validation logic are embedded into the sensor node itself, making in-field software testing autonomous without necessitating continuous developer participation.
    Type: Application
    Filed: April 18, 2008
    Publication date: December 25, 2008
    Applicant: NEC LABORATORIES AMERICA
    Inventors: Kiran NAGARAJA, Vijay RAGHUNATHAN, Florin SULTAN, Srimat CHAKRADHAR, Nupur KOTHARI
  • Publication number: 20070156951
    Abstract: A method and system usable in sensor networks for handling memory faults is disclosed. In order to protect the operating system of a sensor node, coarse-grained memory protection is provided by creating and enforcing an application fault domain in the data memory address space of the sensor node. The data memory accessed by the application modules is restricted to the region (which defines the application fault domain) within the data memory address space. The application modules are prevented from accessing memory outside the application fault domain through software-based run-time checks. The state belonging to the operations system is maintained outside of the application fault domain, and is thus protected from memory corruption from any application module. In order to ensure that an application module does not operate on a corrupted state, fine-grained error detection and recovery is provided within the application fault domain.
    Type: Application
    Filed: December 26, 2006
    Publication date: July 5, 2007
    Applicant: NEC Laboratories America, Inc.
    Inventors: Florin Sultan, Kiran Nagaraja, Srimat Chakradhar, Ram Rengaswamy