Patents by Inventor Kiriti Nagesh Gowda

Kiriti Nagesh Gowda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10455211
    Abstract: A method and apparatus of precomputing includes capturing a first image by a first image capturing device. An image space for the first image is defined and pixels in the image space are analyzed for validity. Valid pixels are stored as valid pixel groups and the valid pixel groups are processed.
    Type: Grant
    Filed: May 25, 2017
    Date of Patent: October 22, 2019
    Assignee: ADVANCED MICRO DEVICES, INC.
    Inventors: Michael L. Schmit, Radhakrishna Giduthuri, Kiriti Nagesh Gowda
  • Patent number: 10321052
    Abstract: A method and apparatus of seam finding includes determining an overlap area between a first image and a second image. The first image is captured by a first image capturing device and the second image is captured by a second image capturing device. A plurality of seam paths for stitching the first image with the second image is computed and a cost is computed for each seam path. A seam is selected to stitch the first image to the second image based upon the cost for the seam path for that seam being less than a cost for all other computed seam paths, that seam is maintained as the selected seam for stitching based upon a predefined criteria.
    Type: Grant
    Filed: April 28, 2017
    Date of Patent: June 11, 2019
    Assignee: Advanced Micro Devices, Inc.
    Inventors: Michael L. Schmit, Radhakrishna Giduthuri, Kiriti Nagesh Gowda
  • Publication number: 20180343430
    Abstract: A method and apparatus of precomputing includes capturing a first image by a first image capturing device. An image space for the first image is defined and pixels in the image space are analyzed for validity. Valid pixels are stored as valid pixel groups and the valid pixel groups are processed.
    Type: Application
    Filed: May 25, 2017
    Publication date: November 29, 2018
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Michael L. Schmit, Radhakrishna Giduthuri, Kiriti Nagesh Gowda
  • Publication number: 20180316851
    Abstract: A method and apparatus of seam finding includes determining an overlap area between a first image and a second image. The first image is captured by a first image capturing device and the second image is captured by a second image capturing device. A plurality of seam paths for stitching the first image with the second image is computed and a cost is computed for each seam path. A seam is selected to stitch the first image to the second image based upon the cost for the seam path for that seam being less than a cost for all other computed seam paths, that seam is maintained as the selected seam for stitching based upon a predefined criteria.
    Type: Application
    Filed: April 28, 2017
    Publication date: November 1, 2018
    Applicant: Advanced Micro Devices, Inc.
    Inventors: Michael L. Schmit, Radhakrishna Giduthuri, Kiriti Nagesh Gowda