Abstract: An integrated circuit (IC) includes self-calibrating programmable digital logic circuitry. The IC includes at least one programmable digital logic cell, wherein the first programmable digital logic cell provides (i) a plurality of different accessible circuit configurations or (ii) a voltage level controller. A self-calibration system is provided that includes at least one reference device, a measurement device for measuring at least one electrical performance parameter that can affect a processing speed of the first programmable digital logic cell or at least one parameter that can affect the electrical performance parameter using the reference device to obtain calibration data. A processing device maps the calibration data or a parameter derived therefrom to generate a control signal that is operable to select from the plurality of different accessible circuit configurations or a voltage level output to change the processing speed of the programmable digital logic cell.

Abstract: An integrated circuit (IC) includes at least one programmable digital logic cell that includes first dedicated digital logic cell having a plurality of transistors including at least one PMOS transistor and at least one NMOS transistor configured to perform at least one digital logical function. The first dedicated digital logic cell includes a plurality of nodes including at least one input node and at least one output node that reflects performance of a digital logical function. Programmable tuning circuitry includes at least one tuning input and at least one tuning circuit output. Circuitry for coupling or decoupling the tuning input or tuning circuit output to at least one of the plurality of nodes of the first dedicated digital logical cell is provided, wherein the coupling or decoupling is operable to change the processing speed for the first reprogrammable digital logic cell.

Abstract: An integrated circuit (IC) includes at least one programmable digital logic cell that includes first dedicated digital logic cell having a plurality of transistors including at least one PMOS transistor and at least one NMOS transistor configured to perform at least one digital logical function. The first dedicated digital logic cell includes a plurality of nodes including at least one input node and at least one output node that reflects performance of a digital logical function. Programmable tuning circuitry includes at least one tuning input and at least one tuning circuit output. Circuitry for coupling or decoupling the tuning input or tuning circuit output to at least one of the plurality of nodes of the first dedicated digital logical cell is provided, wherein the coupling or decoupling is operable to change the processing speed for the first reprogrammable digital logic cell.

Abstract: An integrated circuit (IC) includes self-calibrating programmable digital logic circuitry. The IC includes at least one programmable digital logic cell, wherein the first programmable digital logic cell provides (i) a plurality of different accessible circuit configurations or (ii) a voltage level controller. A self-calibration system is provided that includes at least one reference device, a measurement device for measuring at least one electrical performance parameter that can affect a processing speed of the first programmable digital logic cell or at least one parameter that can affect the electrical performance parameter using the reference device to obtain calibration data. A processing device maps the calibration data or a parameter derived therefrom to generate a control signal that is operable to select from the plurality of different accessible circuit configurations or a voltage level output to change the processing speed of the programmable digital logic cell.