Abstract: Conventional semiconductor devices are problematic in that an operation cannot be continued in the event of a failure of one of CPU cores performing a lock step operation and, as a result, reliability cannot be improved. The semiconductor device according to the present invention includes a computing unit including a first CPU core and a second CPU core that perform a lock step operation, wherein the first CPU core and the second CPU core respectively diagnose failures of internal logic circuits, and a sequence control circuit switches the CPU core that outputs data to a shared resource, in the computing unit based on the diagnosed result.

Abstract: In a data processing device including two sets of circuit pairs which are respectively duplicated in two clock domains which are asynchronous to each other, an asynchronous transfer circuit that transfers a payload signal is provided between the two sets of circuit pairs. The asynchronous transfer circuit includes two sets of a pair of bridge circuits which are respectively connected to the two sets of circuit pairs, and asynchronously transfers the payload signal and a control signal indicating a timing at which the payload signal is stable on a reception side. The two sets of a pair of bridge circuits and the payload signals can be duplicated, but the control signal is not duplicated, and the received payload signal is used for timing control to supply an expected same time difference, to the pair of duplicated circuits. This enables asynchronous transfer between circuits duplicated in the asynchronous clock domains.

Abstract: Conventional semiconductor devices are problematic in that an operation cannot be continued in the event of a failure of one of CPU cores performing a lock step operation and, as a result, reliability cannot be improved. The semiconductor device according to the present invention includes a computing unit including a first CPU core and a second CPU core that perform a lock step operation, wherein the first CPU core 11 and the second CPU core 12 respectively diagnose failures of internal logic circuits, and a sequence control circuit switches the CPU core that outputs data to a shared resource, in the computing unit based on the diagnose result.

Abstract: Conventional semiconductor devices are problematic in that an operation cannot be continued in the event of a failure of one of CPU cores performing a lock step operation and, as a result, reliability cannot be improved. The semiconductor device according to the present invention includes a computing unit including a first CPU core and a second CPU core that perform a lock step operation, wherein the first CPU core and the second CPU core respectively diagnose failures of internal logic circuits, and a sequence control circuit switches the CPU core that outputs data to a shared resource, in the computing unit based on the diagnose result.

Abstract: In a data processing device including two sets of circuit pairs which are respectively duplicated in two clock domains which are asynchronous to each other, an asynchronous transfer circuit that transfers a payload signal is provided between the two sets of circuit pairs. The asynchronous transfer circuit includes two sets of a pair of bridge circuits which are respectively connected to the two sets of circuit pairs, and asynchronously transfers the payload signal and a control signal indicating a timing at which the payload signal is stable on a reception side. The two sets of a pair of bridge circuits and the payload signals can be duplicated, but the control signal is not duplicated, and the received payload signal is used for timing control to supply an expected same time difference, to the pair of duplicated circuits. This enables asynchronous transfer between circuits duplicated in the asynchronous clock domains.

Abstract: Conventional semiconductor devices are problematic in that an operation cannot be continued in the event of a failure of one of CPU cores performing a lock step operation and, as a result, reliability cannot be improved. The semiconductor device according to the present invention includes a computing unit including a first CPU core and a second CPU core that perform a lock step operation, wherein the first CPU core 11 and the second CPU core 12 respectively diagnose failures of internal logic circuits, and a sequence control circuit switches the CPU core that outputs data to a shared resource, in the computing unit based on the diagnose result.

Abstract: A semiconductor integrated circuit device employing two clock signal generating circuits which output clock signals for distribution to an internal circuit of the device, the first and second clock signal generating circuits having different clock-settling times and the selection thereof is effected from outside of the device. A first one of the clock signal generating circuits uses, for example, a phase-locked loop circuit which has a large clock-settling time, and the second clock signal generating circuit is implemented, for example, using a delay-locked loop circuit whose clock-settling time is small, for example, 2-3 periods. Due to the selective actuation of the second clock signal generating circuit, which has a small clock-settling time, the generating of clock signals for the internal circuits can also be halted when the internal circuits of the device are halted thereby to further lower power consumption without compromising clock oscillator responsiveness.

Abstract: A data processor for executing branch prediction comprises a queuing buffer (23) allocated to an instruction queue and to a return destination instruction queue and having address pointers managed for each instruction stream and a control portion (21) for the queuing buffer. The control portion stores a prediction direction instruction stream and a non-prediction direction instruction stream in the queuing buffer and switches an instruction stream as an execution object from the prediction direction instruction stream to the non-prediction direction instruction stream inside the queuing buffer in response to failure of branch prediction. When buffer areas (Qa1, Qb) are used as the instruction queue, the buffer area (Qa2) is used as a return instruction queue and the buffer area (Qa1) is used as a return instruction queue.

Abstract: A clock signal generating circuit supplies a clock signal output in a short time of 2-3 clock periods after operation starts. As a result, the clock signal generating circuit can be stopped simultaneously when the operation of an internal circuit is put in a stop state, the clock signal generating circuit can output a clock signal when the internal circuit returns to the operating state, and power consumption when the internal circuit is in the stop state is reduced.

Abstract: A signal from a crystal resonator or an external clock signal are input from terminals xta1 or exta1, and the signal from the crystal resonator or external clock signal are selected by mode terminal mod8 and input to an oscillator OSC. An input clock signal ckl1 is frequency-divided to desired values by a divider DIV1. A divided clock signal clk2 is input as the reference clock of a phase-locked loop PLL1 or delay-locked loop DLL1, and a clock signal output by a circuit selected by a selector SEL3 passes via a divider DIV2 to be distributed to an LSI. The phase-locked loop PLL1 has a clock settling time of at least 40 clock periods, whereas the clock settling time of the delay-locked loop DLL1 is 2-3 periods.