Patents by Inventor Kiyoaki Iwasa

Kiyoaki Iwasa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230056494
    Abstract: A semiconductor memory device includes a plurality of word lines, a first select gate line, a second select gate line, a first semiconductor layer, a third select gate line, a fourth select gate line, a second semiconductor layer, and a word line contact electrode. The first select gate line and the third select gate line are farther from the substrate than the plurality of word lines. The second select gate line and the fourth select gate line are closer to the substrate than the plurality of word lines. The first semiconductor layer is opposed to the plurality of word lines, the first select gate line, and the second select gate line. The second semiconductor layer is opposed to the plurality of word lines, the third select gate line, and the fourth select gate line. The word line contact electrode is connected to one of the plurality of word lines.
    Type: Application
    Filed: March 15, 2022
    Publication date: February 23, 2023
    Applicant: KIOXIA CORPORATION
    Inventors: Wataru MORIYAMA, Hayato KONNO, Takao NAKAJIMA, Fumihiro KONO, Masaki FUJIU, Kiyoaki IWASA, Tadashi SOMEYA
  • Patent number: 7852685
    Abstract: A semiconductor memory device comprises a first exclusive-OR circuit which compares mth N-bit first data with (m+1)th N-bit second data, a majority circuit which generates flag data to invert the second data if a comparison result of the first exclusive-OR circuit indicates that the number of mismatch bits between the first data and the second data is not less than N/2, and generates flag data to noninvert the second data if the number of mismatch bits between the first data and the second data is less than N/2, a second exclusive-OR circuit which inverts or noninverts the second data based on the flag data, a shift register which stores the flag data generated by the majority circuit, and a pad to serially output both the inverted or noninverted second data and the flag data.
    Type: Grant
    Filed: March 18, 2009
    Date of Patent: December 14, 2010
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Kiyoaki Iwasa, Mitsuaki Honma
  • Publication number: 20090244991
    Abstract: A semiconductor memory device comprises a first exclusive-OR circuit which compares mth N-bit first data with (m+1)th N-bit second data, a majority circuit which generates flag data to invert the second data if a comparison result of the first exclusive-OR circuit indicates that the number of mismatch bits between the first data and the second data is not less than N/2, and generates flag data to noninvert the second data if the number of mismatch bits between the first data and the second data is less than N/2, a second exclusive-OR circuit which inverts or noninverts the second data based on the flag data, a shift register which stores the flag data generated by the majority circuit, and a pad to serially output both the inverted or noninverted second data and the flag data.
    Type: Application
    Filed: March 18, 2009
    Publication date: October 1, 2009
    Inventors: Kiyoaki IWASA, Mitsuaki Honma
  • Patent number: 5949090
    Abstract: A semiconductor integrated circuit includes a rectangular semiconductor chip having a main surface, a plurality of pads formed in a peripheral portion of the main surface of the semiconductor chip, for connection to external connecting members, a plurality of circuit elements of an integrated circuit formed in an area of the main surface other than an area in which the plurality of pads are formed, and at least one characteristic evaluating circuit element connected to at least one of the plurality of circuit elements of the integrated circuit by sharing an impurity doped region which forms part of the at least one circuit element with the at least one circuit element of the integrated circuit in an area of the main surface other than the peripheral portion in which the plurality of pads are formed.
    Type: Grant
    Filed: September 18, 1997
    Date of Patent: September 7, 1999
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Kiyoaki Iwasa, Shigeo Ohshima
  • Patent number: 5703381
    Abstract: A semiconductor integrated circuit includes a rectangular semiconductor chip having a main surface, a plurality of pads formed in a peripheral portion of the main surface of the semiconductor chip, for connection to external connecting members, a plurality of circuit elements of an integrated circuit formed in an area of the main surface other than an area in which the plurality of pads are formed, and at least one characteristic evaluating circuit element connected to at least one of the plurality of circuit elements of the integrated circuit by sharing an impurity doped region which forms part of the at least one circuit element with the at least one circuit element of the integrated circuit in an area of the main surface other than the peripheral portion in which the plurality of pads are formed.
    Type: Grant
    Filed: November 13, 1995
    Date of Patent: December 30, 1997
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Kiyoaki Iwasa, Shigeo Ohshima