Patents by Inventor Kiyoharu Kurosawa

Kiyoharu Kurosawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Substrate inspection apparatus
    Patent number: 8106672
    Abstract: According to one embodiment, a substrate inspection apparatus includes a probe socket, a probe pin, and an adaptor. The probe socket is fixed to an inspection jig on which a substrate is provided, one end of the probe socket being connected to a processor. The probe pin is attached to the other end portion of the probe socket, includes a tip shape conforming to an inspection point of the substrate with which the probe pin is in contact, and including at least one of a projection and a groove designed to specify the tip shape on a side on which the probe pin is attached to the probe socket. The adaptor is attached to the other end portion of the probe socket, and including a through hole formed in conformity with the shape of the side on which the probe pin is attached to the probe socket.
    Type: Grant
    Filed: August 25, 2010
    Date of Patent: January 31, 2012
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Kiyoharu Kurosawa
  • SUBSTRATE INSPECTION APPARATUS
    Publication number: 20110050264
    Abstract: According to one embodiment, a substrate inspection apparatus includes a probe socket, a probe pin, and an adaptor. The probe socket is fixed to an inspection jig on which a substrate is provided, one end of the probe socket being connected to a processor. The probe pin is attached to the other end portion of the probe socket, includes a tip shape conforming to an inspection point of the substrate with which the probe pin is in contact, and including at least one of a projection and a groove designed to specify the tip shape on a side on which the probe pin is attached to the probe socket. The adaptor is attached to the other end portion of the probe socket, and including a through hole formed in conformity with the shape of the side on which the probe pin is attached to the probe socket.
    Type: Application
    Filed: August 25, 2010
    Publication date: March 3, 2011
    Inventor: Kiyoharu Kurosawa