Patents by Inventor Kiyokazu Nakano

Kiyokazu Nakano has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Baseline correction in densitometrical measurements
    Patent number: 4013364
    Abstract: Method and apparatus for densitometry wherein a sample spot developed on a supporting medium is scanned by monochromatic light in a zigzag way, and at a predetermined point outside the spot in each scanning stroke the measured output is periodically sampled and stored so as to be subtracted from the measured output during the scanning stroke for correction of the base line of the measured output.
    Type: Grant
    Filed: August 22, 1975
    Date of Patent: March 22, 1977
    Assignee: Shimadzu Seisakusho Ltd.
    Inventors: Kiyokazu Nakano, Hiroshi Yamamoto, Yasunori Ito