Patents by Inventor Kiyoshi Murakami
Kiyoshi Murakami has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11180065Abstract: A beverage container holding device includes a storage member having a storage space whose top is open and which is configured to receive a beverage container, and a movable floor mounted to the storage member such that the movable floor can move up and down and is configured to support to bottom of the beverage container. The storage member includes support members that advance into the storage space to support the beverage container, and support biasing members for causing the support members to advance into the storage space. The movable floor has support retracting members for causing the support members to move backward such that the support members retract from the storage space.Type: GrantFiled: November 23, 2020Date of Patent: November 23, 2021Assignee: MORIROKU TECHNOLOGY COMPANY, LTD.Inventor: Kiyoshi Murakami
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Publication number: 20210178952Abstract: A beverage container holding device includes a storage member having a storage space whose top is open and which is configured to receive a beverage container, and a movable floor mounted to the storage member such that the movable floor can move up and down and is configured to support to bottom of the beverage container. The storage member includes support members that advance into the storage space to support the beverage container, and support biasing members for causing the support members to advance into the storage space.Type: ApplicationFiled: November 23, 2020Publication date: June 17, 2021Inventor: Kiyoshi Murakami
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Patent number: 9783131Abstract: A decorated molded article includes a corner portion in the form of an entirely rounded corner portion. The rounded corner portion has a distal end face at a distal end thereof. The distal end face has a width determined by an outer curved line and an inner curved line. The inner curved line has a central portion curved to approach the outer curved line. The width of the distal end face of the rounded corner portion is smaller than a width of a distal end face formed at a distal end of the first wall extending from the substrate body.Type: GrantFiled: March 24, 2016Date of Patent: October 10, 2017Assignee: MORIROKU TECHNOLOGY COMPANY LTD.Inventor: Kiyoshi Murakami
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Patent number: 9552803Abstract: A communication method is provided. The communication method includes generating a pseudo background sound signal based on a gradient pulse control signal, performing a computation of subtracting the pseudo background sound signal from an acoustic signal having a sound signal and a background sound signal including a gradient coil drive sound signal, the acoustic signal obtained by an input device configured to receive the voice of a subject, and outputting sound based on a result of the computation, wherein a parameter of generating the pseudo background sound signal is controlled to reduce the difference resulting from the subtraction.Type: GrantFiled: December 17, 2012Date of Patent: January 24, 2017Assignee: General Electric CompanyInventors: Yasuyuki Innami, Kiyoshi Murakami, Shohei Kimoto, Yuya Mizobe, Yusuke Asaba
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Publication number: 20160280152Abstract: A decorated molded article includes a corner portion in the form of an entirely rounded corner portion. The rounded corner portion has a distal end face at a distal end thereof. The distal end face has a width determined by an outer curved line and an inner curved line. The inner curved line has a central portion curved to approach the outer curved line. The width of the distal end face of the rounded corner portion is smaller than a width of a distal end face formed at a distal end of the first wall extending from the substrate body.Type: ApplicationFiled: March 24, 2016Publication date: September 29, 2016Inventor: Kiyoshi Murakami
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Patent number: 8351682Abstract: This invention enables information on a connection wiring with a substrate of a mounted component to be accurately and easily inputted in an X-ray examination apparatus. In teaching of a substrate examination, when a user inputs a two-dimensional region of a component to be examined with respect to a visible light image of the substrate, three-dimensional data is generated for the relevant region, which data is then analyzed to acquire a center coordinate, the number, the number of rows, and the number of columns on a ball terminal connecting the component to the substrate. Results such as the center coordinate acquired in such a manner may be displayed. The visible light image for the substrate is displayed in a display field of a screen.Type: GrantFiled: December 30, 2009Date of Patent: January 8, 2013Assignee: Omron CorporationInventors: Hideyuki Hayashi, Kunio Yoshida, Kiyoshi Murakami
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Publication number: 20110222655Abstract: An X-ray inspection apparatus previously acquires and stores a mask thickness in a cream solder printing as a thickness of the solder applied on the board. In a cross-section parallel to a board surface, a range in a height direction is set as an inspection target from the mask thickness of the inspection target board, and the number of cross-sections is specified. The X-ray inspection apparatus measures an area and roundness of the solder in an inspection window for each cross-section. When the minimum values of the area and roundness are not lower than reference values, the X-ray inspection apparatus determines that the soldering of the inspection window is nondefective. When one of the minimum values of the area and roundness is lower than the reference value, the X-ray inspection apparatus determines that the soldering of the inspection window is defective.Type: ApplicationFiled: February 22, 2011Publication date: September 15, 2011Applicant: OMRON CORPORATIONInventors: Kiyoshi Murakami, Hironori Kasahara
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Publication number: 20110222647Abstract: The X-ray inspection apparatus and method realize high-speed defect analysis inspection. The processing executed by the X-ray inspection apparatus includes executing high-speed imaging, creating an inspection image by executing reconstruction processing, and performing automatic inspection. If the object has passed automatic inspection, the processing executed by the X-ray inspection apparatus includes displaying inspection results. If the object has failed automatic inspection, the processing executed by the X-ray inspection apparatus includes switching the imaging conditions and performing imaging for defect analysis, creating an image by executing reconstruction processing for defect analysis, and outputting the image for defect analysis.Type: ApplicationFiled: February 24, 2011Publication date: September 15, 2011Applicant: OMRON CORPORATIONInventors: Shinji Sugita, Masayuki Masuda, Kiyoshi Murakami
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Patent number: 7869644Abstract: Inspection apparatus are used to inspect a substrate as solder is printed, components are mounted and the substrate is heated for a soldering process. Images of the substrate are taken both before and after a production process such as the component mounting process and the soldering process and their differences are extracted. Each component on the substrate may be identified by differentiation and binarization processes and setting conditions for windows are determined corresponding to identified components. Windows are set according to determined setting conditions for inspecting the conditions of the substrate by using image data in the set windows and standard inspection data corresponding to component identification data.Type: GrantFiled: July 20, 2005Date of Patent: January 11, 2011Assignee: OMRON CorporationInventors: Kiyoshi Murakami, Masato Ishiba, Jun Kuriyama, Teruhisa Yotsuya
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Patent number: 7822566Abstract: Where substrates with components are produced through a series of production processes and inspected after each of these production processes, a method is provided for setting an optimum reference value for making judgments in these inspections such that the frequency of occurrence of disagreement between inspection results after an intermediate process and after the final results will come to within a specified range. After an initial value is assigned for a reference value, this value is sequentially varied while repeating specified processes of saving measured and judgment data on inspected portions of components in a memory and setting a reference value by using the data saved in the memory until a specified condition becomes satisfied.Type: GrantFiled: June 28, 2007Date of Patent: October 26, 2010Assignee: OMRON CorporationInventor: Kiyoshi Murakami
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Publication number: 20100177947Abstract: This invention enables information on a connection wiring with a substrate of a mounted component to be accurately and easily inputted in an X-ray examination apparatus. In teaching of a substrate examination, when a user inputs a two-dimensional region of a component to be examined with respect to a visible light image of the substrate, three-dimensional data is generated for the relevant region, which data is then analyzed to acquire a center coordinate, the number, the number of rows, and the number of columns on a ball terminal connecting the component to the substrate. Results such as the center coordinate acquired in such a manner may be displayed. The visible light image for the substrate is displayed in a display field of a screen.Type: ApplicationFiled: December 30, 2009Publication date: July 15, 2010Inventors: HIDEYUKI HAYASHI, KUNIO YOSHIDA, KIYOSHI MURAKAMI
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Patent number: 7680320Abstract: A color image as a combination of color data corresponding to a plural n-number of different hues is processed by extracting a target object from the image and carrying out a specified image processing. A reference image is obtained in the absence of the target object. Color data corresponding to specified less than n of the different hues are considered and difference in the degree of intensity of the considered color data relative to the combination of color data corresponding to n different hues between each pixel of the target image containing the target object and a corresponding pixel on the reference image are extracted. Pixels for which the extracted difference is greater than a specified threshold value and is in a specified direction are extracted. An image area formed by the extracted pixels are recognized as the target object.Type: GrantFiled: December 22, 2005Date of Patent: March 16, 2010Assignee: OMRON CorporationInventors: Kiyoshi Murakami, Masato Ishiba, Teruhisa Yotsuya
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Patent number: 7512260Abstract: Preparation steps are taken before a substrate with components is inspected and a whole image of a standard substrate is prepared preliminarily and inspection areas are determined for target portions to be inspected on this whole image. At the time of the inspection, a camera is positioned corresponding to a target portion to obtain a target image and an area corresponding to the target image is extracted from the whole image and displacement values of this area are calculated relative to the target image. The setting position of the inspection area is corrected by the calculated displacement values and an inspection area is set on the target image based on the corrected coordinates.Type: GrantFiled: September 2, 2005Date of Patent: March 31, 2009Assignee: OMRON CorporationInventors: Kiyoshi Murakami, Yasunori Asano, Takashi Kinoshita, Teruhisa Yotsuya
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Patent number: 7505149Abstract: A target object has its surface condition inspected by having its image taken from above while being irradiated by red, green and blue light beams at different elevation angles. An inspection area is set on the image and a direction is extracted on the image in which a change appears in the color phase according to the arrangement of the light sources and this extracted direction is compared with a preliminarily registered standard direction to judge the surface condition from the result of this comparison.Type: GrantFiled: February 11, 2005Date of Patent: March 17, 2009Assignee: OMRON CorporationInventors: Masato Ishiba, Jun Kuriyama, Kiyoshi Murakami, Teruhisa Yotsuya
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Patent number: 7394084Abstract: For generating an image for inspection of a substrate, a camera is provided above this substrate with an optical axis orienting downward and a plurality of multi-colored light emitting members are set around the optical axis of the camera so as to be within a specified angular range with respect to a target area on the substrate. The camera is operated to generate an image of the target area for inspection while switched-on conditions of these light emitting members are being controlled such that the colors and angles of light illuminating this target area are varied according to a specified kind of the purpose of this inspection.Type: GrantFiled: June 20, 2005Date of Patent: July 1, 2008Assignee: OMRON CorporationInventors: Jun Kuriyama, Masato Ishiba, Kiyoshi Murakami, Teruhisa Yotsuya
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Publication number: 20080046210Abstract: Where substrates with components are produced through a series of production processes and inspected after each of these production processes, a method is provided for setting an optimum reference value for making judgments in these inspections such that the frequency of occurrence of disagreement between inspection results after an intermediate process and after the final results will come to within a specified range. After an initial value is assigned for a reference value, this value is sequentially varied while repeating specified processes of saving measured and judgment data on inspected portions of components in a memory and setting a reference value by using the data saved in the memory until a specified condition becomes satisfied.Type: ApplicationFiled: June 28, 2007Publication date: February 21, 2008Inventor: Kiyoshi Murakami
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Patent number: 7310406Abstract: On a production line for component mounting substrate, mutually communicating inspection apparatus are each provided to a different one of production processes that are carried out sequentially such as the solder printing, component mounting and soldering processes. Each inspection apparatus can generate an X-ray transmission image of the substrate. Each inspection apparatus on the downstream side inputs an image from another inspection apparatus on the upstream side and generates a differential image of the inputted image and an X-ray transmission image of the same substrate generated by itself after the production process associated with itself is carried out. The differential image thus generated is used for inspecting the substrate such that the effect of the associated production process can be more accurately inspected.Type: GrantFiled: June 27, 2005Date of Patent: December 18, 2007Assignee: OMRON CorporationInventors: Jun Kuriyama, Masato Ishiba, Kiyoshi Murakami, Teruhisa Yotsuya
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Publication number: 20070165254Abstract: A method for correcting a color captured by a detector using a light source includes determining target reference color values corresponding to a plurality of groups each of which includes at least three reference colors; determining detected reference color values corresponding to the plurality of groups by capturing the emitted reference colors using the detector; calculating a plurality of sets of correction factors; and correcting the detected color value or the target color value to generate a corrected color value based on one of the sets of the correction factors.Type: ApplicationFiled: January 9, 2007Publication date: July 19, 2007Inventors: Jun Kuriyama, Masato Ishiba, Kiyoshi Murakami
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Patent number: 7114249Abstract: Inspection a is executed between a step B of mounting a chip component by a high-speed mounter and a step C of mounting a odd-shaped component by a odd-shape mounter. The inspection a executes not only mounted component inspection for determining a mounted state of a chip component mounted in the preceding step but also component fly inspection for determining whether a chip component is flown to a position where a odd-shaped component is mounted in the next step C. It is possible to execute the component fly inspection in accordance with a condition corresponding to the situation of an actual spot such as a case in which it is detected that a component is missing in mounted component inspection or a case in which the replacement date of an attracting nozzle in a high-speed mounter is approaching.Type: GrantFiled: February 26, 2004Date of Patent: October 3, 2006Assignee: Omron CorporationInventor: Kiyoshi Murakami
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Publication number: 20060140471Abstract: A color image as a combination of color data corresponding to a plural n-number of different hues is processed by extracting a target object from the image and carrying out a specified image processing. A reference image is obtained in the absence of the target object. Color data corresponding to specified less than n of the different hues are considered and difference in the degree of intensity of the considered color data relative to the combination of color data corresponding to n different hues between each pixel of the target image containing the target object and a corresponding pixel on the reference image are extracted. Pixels for which the extracted difference is greater than a specified threshold value and is in a specified direction are extracted. An image area formed by the extracted pixels are recognized as the target object.Type: ApplicationFiled: December 22, 2005Publication date: June 29, 2006Inventors: Kiyoshi Murakami, Masato Ishiba, Teruhisa Yotsuya
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Patent number: 5146957Abstract: A tapered liquid container which is nestable with other like empty containers and a collector for receiving empty containers in nested relationship. The container has a tapered side wall, a large bottom end, and a small top dispensing end. A closable large bottom opening and a closable small top opening is formed in the bottom and top ends, respectively. A bottom closure seals the bottom opening and is removable when dispensing the liquid. A top closure is provided for sealing the top opening and is removable to permit liquid to be emptied. The collector includes an upper portion having a tapered socket for receiving an inverted empty container body with the top and bottom closures removed to permit draining of residual liquid. The tapered socket holds the container securely to permit successive containers to be inserted into the open bottom end when the bottom closure is removed of a preceding container. The containers are thus nested for consolidation and draining of residual liquid.Type: GrantFiled: January 4, 1992Date of Patent: September 15, 1992Inventors: Paul Belokin, Jr., Martin P. Belokin