Patents by Inventor Kiyoshi Takimoto
Kiyoshi Takimoto has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 6640433Abstract: The method of forming a micro-pattern comprising forming an organic thin film by building up monomolecular films on an insulating substrate; heating and baking the organic thin film to turn the organic thin film into an amorphous carbon or graphite film, thereby providing an electroconductive thin film; and processing the organic thin film by conducting a microcutting work on it while holding a probe in contact with the organic thin film by means of atomic force to produce the micro-pattern.Type: GrantFiled: May 12, 1998Date of Patent: November 4, 2003Assignee: Canon Kabushiki KaishaInventors: Ryo Kuroda, Hiroshi Matsuda, Kiyoshi Takimoto
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Patent number: 6477132Abstract: Probe including a cantilever having a movable end and formed from an elastic body, an electroconductive sensing needle arranged at the movable end of the cantilever, and a field effect transistor arranged at the movable end of the cantilever and having a gate electrode electronically connected to the electroconductive sensing needle. The probe may further comprise another field effect transistor formed on the cantilever and having its drain electrically connected to the sensing needle. The probe may be used in an information recording/reproduction apparatus.Type: GrantFiled: August 12, 1999Date of Patent: November 5, 2002Assignee: Canon Kabushiki KaishaInventors: Hiroo Azuma, Kiyoshi Takimoto, Takehiko Kawasaki, Yasuhiro Shimada, Takeo Yamazaki
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Publication number: 20020000036Abstract: An electrode substrate and a recording medium having a smooth surface with surface unevenness of 1 nm or less and a size of 1 &mgr;m/or more are disclosed. An electrode substrate and a recording medium having a concave-shaped groove for tracking on the surface, which groove has a depth which can detect of the tunnel current from the bottom thereof by a probe electrode for scanning the surface are also disclosed. Information processing devices equipped with the smooth recording medium, an electroconductive probe arranged approximate to the recording medium and a pulse voltage application circuit for recording are also disclosed.Type: ApplicationFiled: August 3, 2001Publication date: January 3, 2002Inventors: Osamu Takamatsu, Katsunori Hatanaka, Kiyoshi Takimoto, Haruki Kawada, Ken Eguchi, Yuko Morikawa, Hiroshi Matsuda, Toshihiko Takeda, Yoshihiro Yanagisawa, Hisaaki Kawade, Hideyuki Kawagishi
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Patent number: 6308405Abstract: An electrode substrate and a recording medium having a smooth surface with surface unevenness of 1 nm or less and a size of 1 &mgr;m□ or more are disclosed. An electrode substrate and a recording medium having a concave-shaped groove for tracking on the surface, which groove has a depth which can detect of the tunnel current from the bottom thereof by a probe electrode for scanning the surface are also disclosed. Information processing devices equipped with the smooth recording medium, an electroconductive probe arranged approximate to the recording medium and a pulse voltage application circuit for recording are also disclosed.Type: GrantFiled: November 10, 1997Date of Patent: October 30, 2001Assignee: Canon Kabushiki KaishaInventors: Osamu Takamatsu, Katsunori Hatanaka, Kiyoshi Takimoto, Haruki Kawada, Ken Eguchi, Yuko Morikawa, Hiroshi Matsuda, Toshihiko Takeda, Yoshihiro Yanagisawa, Hisaaki Kawade, Hideyuki Kawagishi
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Patent number: 5732053Abstract: A physical action such as voltage or the like is locally applied to a recording medium in accordance with information to be recorded and a physical quantity such as a current, a voltage, and the like of a portion of the recording medium to which the physical action is applied, is measured. Recording of information is confirmed on the basis of the measured physical quantity.Type: GrantFiled: August 21, 1996Date of Patent: March 24, 1998Assignee: Canon Kabushiki KaishaInventors: Koji Yano, Hisaaki Kawade, Etsuro Kishi, Kiyoshi Takimoto
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Patent number: 5623295Abstract: An information recording and/or reproducing apparatus for recording and/or reproducing information to/from a recording medium in a scanning probe microscope comprises a circuit to reproduce recording bits formed on the recording medium on the basis of a physical amount such as tunnel current, interatomic force, electrostatic force, or magnetic force which occurs between the probe and the recording medium, a sensor to detect a state such as film thickness or film quality of the recording medium on the basis of the physical amount before the recording bits are reproduced, and a correcting circuit to correct reproducing conditions such as a magnitude of a voltage which is applied between the probe and the medium on the basis of the detected state of the medium.Type: GrantFiled: February 25, 1994Date of Patent: April 22, 1997Assignee: Canon Kabushiki KaishaInventors: Etsuro Kishi, Hisaaki Kawade, Kiyoshi Takimoto, Koji Yano
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Patent number: 5610898Abstract: An information recording/reproducing method and apparatus is for carrying out at least one of recording and reproducing information through a probe electrode or through a plurality of probe electrodes on an information recording medium. A probe electrode is disposed on an elastic member. A relative position is so adjusted between the recording medium and the probe electrode that a repulsive force between them is comparative to an elastic force of the elastic member. In case of plural probe electrodes, they are displaced to keep an equal spacing between the recording medium and the respective probe electrodes so that they may have either a zero average or a minimized square sum of displacement. A spacer layer will do for setting a spacing between a probe electrode and the recording medium.Type: GrantFiled: June 7, 1995Date of Patent: March 11, 1997Assignee: Canon Kabushiki KaishaInventors: Kiyoshi Takimoto, Toshihiko Miyazaki, Kunihiro Sakai, Ryo Kuroda
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Patent number: 5569974Abstract: An electron-emitting device comprises a substrate, an electrode provided on said substrate, an insulating layer laminated on the electrode, and a second electrode having an opening and laminated on the insulating layer in such a manner that the insulating layer is uncovered at the opening and electrons are emitted from the opening of the second electrode as a result of application of an voltage between the electrodes. An image display apparatus comprises the electron-emitting device, a modulating electrode capable of modulating an electron beam emitted from the electron-emitting device, in accordance with an information signal, and an image forming member capable of forming an image as a result of irradiation with the electron beam, these of which are successively disposed. An image forming apparatus comprises the electron-emitting device, and a means for modulating an electron beam emitted from said electron-emitting device, in accordance with an information signal.Type: GrantFiled: July 12, 1994Date of Patent: October 29, 1996Assignee: Canon Kabushiki KaishaInventors: Yuko Morikawa, Yoshihiro Yanagisawa, Kiyoshi Takimoto
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Patent number: 5567872Abstract: A scanning atomic force microscope includes a probe arranged near a sample surface to oppose the sample surface, a support device for supporting the prove, a moving mechanism for moving the probe relative to the sample, and a signal detector for detecting a signal corresponding to a structure of the sample surface obtained by the probe. The signal detector includes a laser beam oscillator for oscillating a laser beam, and a laser beam receiving device for receiving the laser beam which is emitted from the laser beam oscillator and is reflected by the support device. The scanning atomic force microscope is further provided with a laser beam output device which has a function of controlling the laser beam oscillator to discontinuously emit the laser beam.Type: GrantFiled: March 7, 1995Date of Patent: October 22, 1996Assignee: Canon Kabushiki KaishaInventors: Masafumi Kyogaku, Kiyoshi Takimoto
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Patent number: 5535185Abstract: An information recording/reproduction is performed as follows on a recording medium using a probe. A distance between the probe and a recording layer of the recording medium is controlled, and relative movement of the probe and the medium is effected so that the probe scans a surface of the recording layer. Recording bits corresponding to information is recorded or erased on the recording layer under a predetermined recording/erasing condition. The information is reproduced from the recording bits produced on the recording layer upon detection of a physical quantity such as a tunneling current, an electric field radiation current and the like generated between the probe and the recording layer. A characteristic/state such as an electrical characteristic, a surface state and the like of the recording layer is detected. The recording/erasing condition is corrected on the basis of the detected characteristic/state of the recording layer.Type: GrantFiled: January 21, 1994Date of Patent: July 9, 1996Assignee: Canon Kabushiki KaishaInventors: Etsuro Kishi, Hisaaki Kawade, Kiyoshi Takimoto, Koji Yano
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Patent number: 5508527Abstract: A method and apparatus for detecting the relative positional displacement between a mask and a wafer. The mask is provided with a cantilever. The position mark is provided on the wafer so as to face the cantilever. A relative positional displacement between the mask and the wafer is detected from a deformation amount of the cantilever based on a force acting between the position mark and the cantilever upon relative movement of the position mark and the cantilever.Type: GrantFiled: September 1, 1994Date of Patent: April 16, 1996Assignee: Canon Kabushiki KaishaInventors: Ryo Kuroda, Toshihiko Miyazaki, Kunihiro Sakai, Hiroyasu Nose, Kiyoshi Takimoto
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Patent number: 5481529Abstract: The present invention relates to a scanning probe microscope for observing the surface of a sample therethrough by the use of a probe including a probe, means for causing the sample and the probe to scan relative to each other, means for applying an AC voltage between the sample and the probe, and means for detecting an electric current flowing between the sample and the probe at a predetermined phase point of the AC voltage, the surface of the sample being observed on the basis of the detected electric current. The specification also discloses an information recording-reproducing apparatus using such probe microscope.Type: GrantFiled: February 14, 1994Date of Patent: January 2, 1996Assignee: Canon Kabushiki KaishaInventors: Kiyoshi Takimoto, Hisaaki Kawade, Etsuro Kishi, Koji Yano
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Patent number: 5461605Abstract: An information recording/reproducing method and apparatus is for carrying out at least one of recording and reproducing information through a probe electrode or through a plurality of probe electrodes on an information recording medium. A probe electrode is disposed on an elastic member. A relative position is so adjusted between the recording medium and the probe electrode that a repulsive force between them is comparative to an elastic force of the elastic member. In case of plural probe electrodes, they are displaced to keep an equal spacing between the recording medium and the respective probe electrodes so that they may have either a zero average or a minimized square sum of displacement. A spacer layer will do for setting a spacing between a probe electrode and the recording medium.Type: GrantFiled: January 31, 1995Date of Patent: October 24, 1995Assignee: Canon Kabushiki KaishaInventors: Kiyoshi Takimoto, Toshihiko Miyazaki, Kunihiro Sakai, Ryo Kuroda
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Patent number: 5448421Abstract: A method for positioning an information processing head at a predetermined position on a recording medium includes detecting a predetermined magnetization pattern on a magnetic material having a predetermined positional relation to a recording region of the recording medium by a magnetization detector having a predetermined positional relation to the information processing head, generating a signal indicative of a relative position of the information processing head with respect to the recording medium based on a result of the detecting step and moving the information processing head and the recording medium relatively to position the information processing head at the predetermined position with respect to the recording medium based on the generated signal, and a process for forming a cantilever-type probe capable of indicating a magnitude of a magnetic force between the probe and a recording medium and capable of performing at least one of a recording operation and a reproducing operation on the recording mType: GrantFiled: October 15, 1993Date of Patent: September 5, 1995Assignee: Canon Kabushiki KaishaInventors: Hiroshi Matsuda, Hisaaki Kawade, Ken Eguchi, Etsuro Kishi, Hideyuki Kawagishi, Kiyoshi Takimoto, Yuji Kasanuki, Yoshihiro Yanagisawa, Toshihiko Takeda
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Patent number: 5439777Abstract: A recording-reproducing apparatus includes an electrode, a material that changes its intramolecular electron distribution upon the application of electromagnetic wave irradiation and an electric field provided on the electrode, and an electrically conductive probe having a pointed tip. The apparatus projects an electromagnetic wave onto the material, and applies a pulse voltage between the electrode and the conductive probe.Type: GrantFiled: February 18, 1993Date of Patent: August 8, 1995Assignee: Canon Kabushiki KaishaInventors: Haruki Kawada, Hiroshi Matsuda, Kiyoshi Takimoto, Hiroyasu Nose
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Patent number: 5432379Abstract: An MIM type electric element has an upper electrode, a lower electrode, and a barrier layer held therebetween and composed of an insulator or a semiconductor. The lower electrode contains a noble metal crystal having a facet of a plate-shaped crystal formed on a substrate. The facet has a plane given by the crystal face (111) and contains a region having a plane orientation variance angle of not more than 1.degree. by X-ray diffraction.Type: GrantFiled: September 14, 1994Date of Patent: July 11, 1995Assignee: Canon Kabushiki KaishaInventors: Ken Eguchi, Haruki Kawada, Tsutomu Ikeda, Kiyoshi Takimoto, Toshihiko Takeda
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Patent number: 5414260Abstract: A scanning probe microscope is used to observe a sample. The same portion of a surface of the sample is scanned forward and backward using a probe. A first signal corresponding to a structure of the sample is detected from the probe during a period in which the probe scans the surface of the sample forward. A second signal corresponding to the structure of the sample is detected from the probe during a period in which the probe scans the surface of the sample backward. When a difference is caused in at least a portion between the first and second signals, the portion of one of the first and the second signals is replaced by a portion of the other signal to generate a corrected signal. An image of the sample is formed using the corrected signal.Type: GrantFiled: April 30, 1993Date of Patent: May 9, 1995Assignee: Canon Kabushiki KaishaInventors: Kiyoshi Takimoto, Katsunori Hatanaka, Kunihiro Sakai, Masahiko Miyamoto, Hisaaki Kawade, Yasufumi Sato, Etsuro Kishi, Hideyuki Kawagishi
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Patent number: 5390161Abstract: A probe for reading an information from an object and/or inputting an information to an object is disclosed. The probe has a supporting member and a rod-shaped projection of which the end is positioned opposed to the object for information reading therefrom and/or information input thereto. The rod-shaped projection protrudes from a partial area of the supporting member. The information reading from the object and/or information input to the object is effected at the longitudinal end of the probe. The probe provides precise and accurate output and/or input of information regardless of the surface state of the object.Type: GrantFiled: May 10, 1994Date of Patent: February 14, 1995Assignee: Canon Kabushiki KaishaInventors: Suomi Kurihara, Haruki Kawada, Kiyoshi Takimoto, Yuji Kasanuki, Toshimitsu Kawase, Hisaaki Kawade, Ken Eguchi
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Patent number: 5389475Abstract: A recording medium includes a substrate electrode, a recording layer constituted of a monomolecular film of an organic compound or a built-up film thereof, and a photoconductive thin film, laminated in this order on a substrate. The photoconductive thin film may preferably be divided to a plurality of isolated sectors. The recording medium is used in an ultra high density information processing apparatus with a probe electrode disposed close to the medium, a power source for applying a voltage between the medium and the probe electrode, and a light source for irradiating the medium.Type: GrantFiled: June 18, 1992Date of Patent: February 14, 1995Assignee: Canon Kabushiki KaishaInventors: Yoshihiro Yanagisawa, Hiroshi Matsuda, Hisaaki Kawade, Etsuro Kishi, Haruki Kawada, Hideyuki Kawagishi, Kiyoshi Takimoto, Yuko Morikawa, Toshihiko Takeda
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Patent number: 5381400Abstract: An information carrier for performing information recording and/or reproducing through a probe provided in an information recording and/or reproducing apparatus includes an information recording medium having a recording plane for recording and/or reproducing through the probe, and a frame which is formed detachably in the information recording and/or reproducing apparatus to accommodate the information recording medium airtightly. A mechanism is provided in the frame which can be opened or closed to allow the recording plane of the information recording medium to be open when the frame is mounted in the information recording and/or reproducing apparatus.Type: GrantFiled: June 9, 1993Date of Patent: January 10, 1995Assignee: Canon Kabushiki KaishaInventors: Hideyuki Kawagishi, Toshihiko Miyazaki, Hisaaki Kawade, Etsuro Kishi, Kiyoshi Takimoto, Toshihiko Takeda