Patents by Inventor Kiyoto Itoh

Kiyoto Itoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7560144
    Abstract: A method of forming a film having a low dielectric constant, comprises the steps of: placing a substrate between an upper electrode and a lower electrode inside a reaction chamber, introducing a silicon-containing hydrocarbon compound source gas, an additive gas, and an inert gas into a space between the upper and lower electrodes by controlling a gas flow ratio, generating a plasma by applying RF power to the space between the upper and lower electrodes in a state in which an interval between the upper electrode and the substrate is narrower in the vicinity of a center of the substrate than that in the vicinity of its periphery, and forming a film having a low dielectric constant on the substrate at a deposition rate of less than approx. 790 nm/min by controlling a flow rate of the process gas.
    Type: Grant
    Filed: March 22, 2005
    Date of Patent: July 14, 2009
    Assignee: ASM Japan K.K.
    Inventors: Atsuki Fukazawa, Kiyoto Itoh, Tsunayuki Kimura, Nobuo Matsuki
  • Publication number: 20060216433
    Abstract: A method of forming a film having a low dielectric constant, comprises the steps of: placing a substrate between an upper electrode and a lower electrode inside a reaction chamber, introducing a silicon-containing hydrocarbon compound source gas, an additive gas, and an inert gas into a space between the upper and lower electrodes by controlling a gas flow ratio, generating a plasma by applying RF power to the space between the upper and lower electrodes in a state in which an interval between the upper electrode and the substrate is narrower in the vicinity of a center of the substrate than that in the vicinity of its periphery, and forming a film having a low dielectric constant on the substrate at a deposition rate of less than approx. 790 nm/min by controlling a flow rate of the process gas.
    Type: Application
    Filed: March 22, 2005
    Publication date: September 28, 2006
    Applicant: ASM JAPAN K.K.
    Inventors: Atsuki Fukazawa, Kiyoto Itoh, Tsunayuki Kimura, Nobuo Matsuki
  • Patent number: 6698469
    Abstract: A cylinder containing gas has a valve and is connected to a delivery side through a filling pipe, a primary pipe, a first air-operated valve, a pressure reducing valve, a secondary pipe, and a second air-operated valve. Inert gas flows into the primary pipe through an air-operated valve. The primary pipe is connected to a vacuum generator through an air-operated valve and a pipe. Gas remaining in the primary pipe is purged as exhaust gas by automatically repeating leaving-pipe-in-pressurized-state purge for pressurizing the inside of the primary pipe by the inert gas and leaving the pipe in this state for 2 to 10 minutes and evacuating the pipe for 20 seconds. Gas remaining in the primary pipe is purged with high-efficiency, and the vacuum generator is stopped while the inside of the primary pipe is pressurized in the leaving-pipe-in-pressurized-state purge and the just-before-replacement purge.
    Type: Grant
    Filed: June 27, 2002
    Date of Patent: March 2, 2004
    Assignees: NEC Electronics Corporation, Toyoku Kagaku Co., Ltd.
    Inventors: Yutaka Sakamoto, Tsuneo Kano, Takashi Ogawa, Hiroshi Matsumura, Toshiaki Sango, Kiyoto Itoh, Norio Otake
  • Publication number: 20030010395
    Abstract: A cylinder containing gas has a valve and is connected to a delivery side through a filling pipe, a primary pipe, a first air-operated valve, a pressure reducing valve, a secondary pipe, and a second air-operated valve. Inert gas flows into the primary pipe through an air-operated valve. The primary pipe is connected to a vacuum generator through an air-operated valve and a pipe. Gas remaining in the primary pipe is purged as exhaust gas by automatically repeating leaving-pipe-in-pressurized-state purge for pressurizing the inside of the primary pipe by the inert gas and leaving the pipe in this state for 2 to 10 minutes and evacuating the pipe for 20 seconds. Gas remaining in the primary pipe is purged with high-efficiency, and the vacuum generator is stopped while the inside of the primary pipe is pressurized in the leaving-pipe-in-pressurized-state purge and the just-before-replacement purge.
    Type: Application
    Filed: June 27, 2002
    Publication date: January 16, 2003
    Inventors: Yutaka Sakamoto, Tsuneo Kano, Takashi Ogawa, Hiroshi Matsumura, Toshiaki Sango, Kiyoto Itoh, Norio Otake