Abstract: To provide a rolling bearing for a man-made satellite which is free from the damages, e.g., formation of the band mark on the surfaces of the rolling elements, and the losing of the luster of the surfaces thereof. There is provided a rolling bearing, which is used mainly for a man-made satellite, includes an outer ring, an inner ring, and rolling elements. The parent material of those components is martensitic stainless steel. Of those components, at least the rolling elements are processed to have nitride surface layers formed over their surfaces. A hardness of the nitride surface layer is Hv1200 to 1500.

Abstract: A semiconductor integrated circuit testing apparatus of the invention comprises a correcting means for correcting input waveform timing of a measuring signal applied to all pins of a semiconductor integrated circuit 5. The correcting means includes: a high-speed clock generating circuit 12 for generating a clock signal; latch circuits 9a, 9b for latching the measuring signal by use of the clock signal from the high-speed clock generating circuit 12; FIFO memories 10a, 10b for storing as data the measuring signal latched by the latch circuits 9a, 9b; and a control circuit 14 for retrieving the data from the FIFO memories 10a, 10b for transfer to a tester.

Abstract: To provide a rolling bearing for a man-made satellite which is free from the damages, e.g., formation of the band mark on the surfaces of the rolling elements, and the losing of the luster of the surfaces thereof. There is provided a rolling bearing, which is used mainly for a man-made satellite, includes an outer ring, an inner ring, and rolling elements. The parent material of those components is martensitic stainless steel. Of those components, at least the rolling elements are processed to have nitride surface layers formed over their surfaces. A hardness of the nitride surface layer is Hv1200 to 1500.

Abstract: An anti-electrolytic corrosion rolling bearing having at least an outer race, an inner race, and rolling elements interposed between the outer and inner races, which has an insulating body on at least one of the outer peripheral surface of the outer race, the inner peripheral surface of the inner race, and the side surfaces of the outer race and inner race, said insulating body being composed of an insulating film or insulating member each containing at least one of a thermoplastic synthetic resin, a rubber, and a thermoplastic elastomer as a base material and having a resistivity of not less than 1.times.10.sup.13 .OMEGA..multidot.cm and a thermal conductivity of not less than 0.5 W/m.multidot.K.

Abstract: An IC measuring method including positioning a plurality of ICS, each having a plurality of circuit blocks performing different functions, selecting different circuit blocks in each of the plurality of ICs, measuring the test results from each of the selected circuit blocks, and selecting a different circuit block in each of the plurality of ICs for the next measurement. The circuit block selection is controlled by a matrix circuit or by physically shifting the positions of the ICs.

Abstract: A semiconductor integrated circuit device includes individual circuit blocks which are tested according to the method of the invention. Circuit blocks of a semiconductor integrated circuit device may be tested independently of one another until all circuit blocks have been tested, or alternatively may be simultaneously tested. The multi-test method of the invention simultaneously tests plural semiconductor integrated circuit devices by successively testing corresponding circuit blocks on each semiconductor integrated circuit device. The test apparatus of the present invention is of minimal size and complexity, and greatly enhances testability of a semiconductor integrated circuit device.