Abstract: A portable appliance detects explosive materials. An indicator has a carrier and a plurality of indicator substances arranged in different regions to represent a location dependent pattern. The indicator substances are a thin layer positionable in an indicator area by a holding apparatus. A plurality of radiation sources emit quasi-monochromatic excitation radiation and are arranged at various locations in a radiation area so as to represent a location dependent pattern of radiation sources. An excitation beam path with a first imaging system images excitation radiation into the indicator area such that emission of the indicator substances is producible at the imaging locations on the indicator area. An emission beam path with a second imaging system images the indicator area into a reception area such that a pattern of emissions is producible depending on the location. Receivers receive emissions from the reception area and convert them into electrical signals.

Abstract: A portable appliance for detecting explosive materials has an apparatus for generating and measuring emission of an indicator. The indicator has a carrier and a plurality of indicator substances that can be impinged upon by analytes, said indicator substances being applied onto the carrier as a thin layer and being positionable in an indicator area by means of a holding apparatus. The indicator substances are arranged in different regions of the carrier such that the indicator substances in the indicator area represent a pattern of indicator substances depending on the location. The apparatus has a plurality of radiation sources for emitting quasi-monochromatic excitation radiation. The radiation sources are arranged at various locations in a radiation area such that the radiation area represents a pattern of radiation sources depending on the location.

Abstract: The invention relates to a device for measuring the scattering of a sample. Said device includes at least one first and one second scattering receiver for capturing scattered rays from the sample; and at least one imaging element via which rays can reach the sample and from the sample to the scattering receiver. According to the invention, the first and second scattering receivers are arranged in a common flat or approximately spherically curved surface, which is oriented perpendicular to an optical axis of the imaging element. The first scattering receiver is designed and arranged to capture saturated scattered rays from the sample and the second scattering receiver is designed and arranged to capture linearly scattered rays from the sample.

Abstract: The invention relates to a device for measuring the scattering of a sample. Said device includes at least one first and one second scattering receiver for capturing scattered rays from the sample; and at least one imaging element via which rays can reach the sample and from the sample to the scattering receiver. According to the invention, the first and second scattering receivers are arranged in a common flat or approximately spherically curved surface, which is oriented perpendicular to an optical axis of the imaging element. The first scattering receiver is designed and arranged to capture saturated scattered rays from the sample and the second scattering receiver is designed and arranged to capture linearly scattered rays from the sample.

Abstract: Device for measuring at least one of diffusion, absorption and refraction of a sample, having a radiation source, at least one receiving element, an optical imaging element and a protection element, the radiation source and the receiving element being arranged on the sensor side of the optical imaging element, the protection element being arranged on the sample side of the imaging element and adjacent to the imaging element and the radiation source. A refraction radiation source and a refraction receiver are arranged on the sensor side of the imaging element and arranged relative to the imaging element so that the refraction radiation of the sample specularly reflected by the sample side interface of the protection element can essentially be received by the refraction receiver and the radiation specularly reflected by the imaging element side interface of the protection element essentially cannot be received by the refraction receiver.

Abstract: Device for measuring at least one of diffusion, absorption and refraction of a sample, having a radiation source, at least one receiving element, an optical imaging element and a protection element, the radiation source and the receiving element being arranged on the sensor side of the optical imaging element, the protection element being arranged on the sample side of the imaging element and adjacent to the imaging element and the radiation source. A refraction radiation source and a refraction receiver are arranged on the sensor side of the imaging element and arranged relative to the imaging element so that the refraction radiation of the sample specularly reflected by the sample side interface of the protection element can essentially be received by the refraction receiver and the radiation specularly reflected by the imaging element side interface of the protection element essentially cannot be received by the refraction receiver.

Abstract: The invention relates to the synchronous determination of the absorption, fluorescence, dispersion and refraction of liquids, gases and solids (measurement volumes) with high sensitivity. Radiation of defined wavelength is coupled into a multiple reflection device. The transmitted coupling radiation is measured with a receiver that is located immediately behind a semireflecting mirror. The diffuse reflecting that is directed against the direction of incidence and the radiation which is specularly reflected at the boundary surface with the measurement volume are measured with a receiver that is directed at the measurement volume and located on the coupling mirror. The absorbing power is determined from the reciprocal value of the transmitted coupling radiation. The scattering power and fluorescence power are determined indirectly from the combination of diffuse reflection and transmitted radiation. The refraction is determined from the combination of specularly reflected radiation and transmitted radiation.