Patents by Inventor Klaus P. Schindl

Klaus P. Schindl has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4712889
    Abstract: A photometer for use with a microscope having an object plane an image plane and an optical axis between said planes. The photometer includes an optical dividing means adapted to be disposed in the optical axis between the microscope object and image planes, and a reflective element having a reflecting surface. A pin hole occluder is adapted to be arranged on the opposite side of the optical dividing means to the reflective element. An optical imaging device provides an image of the pin hole occluder on the reflecting surface. A semi-reflective element is provided for reflecting light from the light source to the optical dividing means. A detector is arranged in an optical axis including the semi-reflective element, the pin hole occluder, the optical dividing means, the optical imaging device and reflective element.
    Type: Grant
    Filed: November 20, 1985
    Date of Patent: December 15, 1987
    Assignee: C. Reichert Optische Werke AG
    Inventor: Klaus P. Schindl
  • Patent number: 4711537
    Abstract: A stage for a microscope comprises a stage carrier, an object stage, an intermediate carrier disposed between the stage carrier and the object stage, and first and second displacement means. The first displacement means serves to displace the intermediate carrier together with the object stage in a first direction relative to the stage carrier, and the second displacement means serves to displace the object stage in a second direction substantially transverse to the first direction. The first and second displacement means are fixed relative to the stage carrier so that they do not move when the intermediate carrier and the object stage moves.
    Type: Grant
    Filed: June 12, 1986
    Date of Patent: December 8, 1987
    Assignee: Reichert-Jung Optische Werke AG
    Inventors: Klaus P. Schindl, Franz Meitz, Kurt Salzmann
  • Patent number: 4678291
    Abstract: To allow rapid change between the conoscopic observation method and the orthoscopic observation method in a microscope, while showing a small overall size and permitting and optically correct position of the Bertrand lens and the associated diaphragm, an additional supplementary beam path can be selectively used in addition to the main beam path. The supplementary beam path includes the Bertrand lens and the iris diaphragm and extends away from the optical axis of the microscope objective in a lateral direction.
    Type: Grant
    Filed: December 14, 1984
    Date of Patent: July 7, 1987
    Assignee: C. Reichert Optische Werke AG
    Inventors: Georg N. Nyman, Ferdinand Pauliny, Klaus P. Schindl
  • Patent number: 4597644
    Abstract: In a microscope possessing an adjustable-inclination viewing tube and optical path system for erecting the image, an optical component forming part of the erecting system can be interchanged with another optical component. It is thus possible to select, at will, either a totally reflecting optical component, or an optical component which splits the beam into two, the latter optical component being usable for the purpose of attaching the microscope to a photographic device or similar accessory.
    Type: Grant
    Filed: September 21, 1984
    Date of Patent: July 1, 1986
    Assignee: C. Reichert Optische Werke AG
    Inventor: Klaus P. Schindl
  • Patent number: 4593979
    Abstract: In a microscope possessing an adjustable-inclination binocular unit and an optical path system for erecting the image, these two subsystems possess a common splitting prism, thus shortening the overall optical path in the microscope, so that the space required for the optical components remains small. This is of particular importance in cases involving microscope objectives which are corrected to infinity.
    Type: Grant
    Filed: September 21, 1984
    Date of Patent: June 10, 1986
    Assignee: C. Reichert Optische Werke AG
    Inventors: Klaus P. Schindl, Peter B. Puxkandl
  • Patent number: 4057318
    Abstract: Refractive characteristics of the eye or eyes of a microscopist can result in an unfocused image in the film plane of a camera attachment if accommodation occurs in the objective focusing system and an unfocus image can be prevented by providing a separate image for adjustment of the eyepiece or eyepieces to accommodate refractive characteristics of the eye or eyes of the microscopist independent of the object focusing mechanism.
    Type: Grant
    Filed: December 31, 1975
    Date of Patent: November 8, 1977
    Assignee: C. Reichert Optische Werke
    Inventor: Klaus P. Schindl
  • Patent number: 3935011
    Abstract: By using two or more masks in a microscope having an optical system with an intermediate image plane therein in combination with a camera, composite photomicrographs can be prepared with two or more images.
    Type: Grant
    Filed: April 18, 1973
    Date of Patent: January 27, 1976
    Assignee: C. Reichert Optische Werke AG
    Inventor: Klaus P. Schindl