Patents by Inventor Klaus Wagner-Drebenstedt

Klaus Wagner-Drebenstedt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for testing an integrated circuit featuring scan design
    Patent number: 5485473
    Abstract: The present invention provides for improved testing of an integrated circuit. In order to measure a test signal S from the integrated circuit 1 a multi-pattern is placed in a shift register. The multi-pattern is generated by overlaying at least two test patterns Ax and Bx. Therefore the signal S changes its state in response to only a small amount of shift operations.
    Type: Grant
    Filed: August 20, 1993
    Date of Patent: January 16, 1996
    Inventors: Ulich Diebold, Peter Rost, Manfred Schmidt, Otto Torreiter, Rolf Vogt, Klaus Wagner-Drebenstedt