Patents by Inventor Ko Inada

Ko Inada has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240126151
    Abstract: To provide a camera mounting structure that can protect a camera attached to the front of the body from bouncing stones or the like. In a camera mounting structure applied to a saddled vehicle with a body having a front to which a camera is attached, the camera is disposed at a position on the saddled vehicle below a headlamp and above a front fender. The camera is attached to a bracket fixed to the body. A yaw rotation shaft that allows a swinging motion in a yaw direction relative to the body is provided to the bracket. A pitch rotation shaft that allows a swinging motion in a pitch direction of the camera is provided to the bracket.
    Type: Application
    Filed: March 31, 2021
    Publication date: April 18, 2024
    Applicant: Honda Motor Co., Ltd.
    Inventors: Satoru KAMIJO, Kyosuke INADA, Ko HOSOKAWA
  • Publication number: 20230016405
    Abstract: A production method of producing a fluorine-containing olefin by allowing a first olefin represented by the following Formula (1) and a second olefin to react with each other in the presence of a ruthenium compound represented by the following Formula (X) is provided.
    Type: Application
    Filed: August 19, 2022
    Publication date: January 19, 2023
    Applicants: THE UNIVERSITY OF TOKYO, AGC INC.
    Inventors: Kyoko NOZAKI, Midori AKIYAMA, Kenta MORI, Takashi OKAZOE, Yuichiro ISHIBASHI, Ko INADA
  • Patent number: 8043939
    Abstract: To provide a method for manufacturing an SOI substrate having a single crystal semiconductor layer having a small and uniform thickness over an insulating film. Further, time of adding hydrogen ions is reduced and time of manufacture per SOI substrate is reduced. A bond layer is formed over a surface of a first semiconductor wafer and a separation layer is formed below the bond layer by irradiating the first semiconductor wafer with H3+ ions by an ion doping apparatus. H3+ ions accelerated by high voltage are separated to be three H+ ions at a semiconductor wafer surface, and the H+ ions cannot enter deeply. Therefore, H+ ions are added into a shallower region in the semiconductor wafer at a higher concentration than the case of using a conventional ion implantation method.
    Type: Grant
    Filed: August 24, 2010
    Date of Patent: October 25, 2011
    Assignee: Semiconductor Energy Laboratory Co., Ltd.
    Inventors: Shunpei Yamazaki, Akiharu Miyanaga, Ko Inada, Yuji Iwaki
  • Publication number: 20100317161
    Abstract: To provide a method for manufacturing an SOI substrate having a single crystal semiconductor layer having a small and uniform thickness over an insulating film. Further, time of adding hydrogen ions is reduced and time of manufacture per SOI substrate is reduced. A bond layer is formed over a surface of a first semiconductor wafer and a separation layer is formed below the bond layer by irradiating the first semiconductor wafer with H3+ ions by an ion doping apparatus. H3+ ions accelerated by high voltage are separated to be three H+ ions at a semiconductor wafer surface, and the H+ ions cannot enter deeply. Therefore, H+ ions are added into a shallower region in the semiconductor wafer at a higher concentration than the case of using a conventional ion implantation method.
    Type: Application
    Filed: August 24, 2010
    Publication date: December 16, 2010
    Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
    Inventors: Shunpei YAMAZAKI, Akiharu MIYANAGA, Ko INADA, Yuji IWAKI
  • Patent number: 7829434
    Abstract: To provide a method for manufacturing an SOI substrate having a single crystal semiconductor layer having a small and uniform thickness over an insulating film. Further, time of adding hydrogen ions is reduced and time of manufacture per SOI substrate is reduced. A bond layer is formed over a surface of a first semiconductor wafer and a separation layer is formed below the bond layer by irradiating the first semiconductor wafer with H3+ ions by an ion doping apparatus. H3+ ions accelerated by high voltage are separated to be three H+ ions at a semiconductor wafer surface, and the H+ ions cannot enter deeply. Therefore, H+ ions are added into a shallower region in the semiconductor wafer at a higher concentration than the case of using a conventional ion implantation method.
    Type: Grant
    Filed: September 15, 2008
    Date of Patent: November 9, 2010
    Assignee: Semiconductor Energy Laboratory Co., Ltd,
    Inventors: Shunpei Yamazaki, Akiharu Miyanaga, Ko Inada, Yuji Iwaki
  • Publication number: 20090081849
    Abstract: To provide a method for manufacturing an SOI substrate having a single crystal semiconductor layer having a small and uniform thickness over an insulating film. Further, time of adding hydrogen ions is reduced and time of manufacture per SOI substrate is reduced. A bond layer is formed over a surface of a first semiconductor wafer and a separation layer is formed below the bond layer by irradiating the first semiconductor wafer with H3+ ions by an ion doping apparatus. H3+ ions accelerated by high voltage are separated to be three H+ ions at a semiconductor wafer surface, and the H+ ions cannot enter deeply. Therefore, H+ ions are added into a shallower region in the semiconductor wafer at a higher concentration than the case of using a conventional ion implantation method.
    Type: Application
    Filed: September 15, 2008
    Publication date: March 26, 2009
    Applicant: Semiconductor Energy Laboratory Co. Ltd.
    Inventors: Shunpei Yamazaki, Akiharu Miyanaga, Ko Inada, Yuji Iwaki