Abstract: An IC inspection socket includes: a pin block including a contact probe array; a guide plate configured to guide an IC package to be inspected to the contact probe array; and a cover including an engaging portion to be engaged with the pin block, and configured to hold the guide plate by an engagement of the engaging portion. The pin block includes a support portion configured to detachably support the guide plate, and an engaged portion with which the engaging portion is engaged during a sliding movement of the cover on the guide plate supported by the support portion.

Abstract: A socket includes a pin block on which a plurality of contact probes are installed, a pin plate configured to hold the plurality of contact probes together with the pin block, and an engagement portion configured to engage the pin block and the pin plate with each other. The engagement portion is configured to detachably engage the pin block and the pin plate with each other.