Patents by Inventor Kohei Sasai
Kohei Sasai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240145744Abstract: The present invention is a fuel cell evaluation system that obtains an actual gas consumption amount in a fuel cell in real time with accuracy and calculates a consumption amount of a fuel gas in the fuel cell, the fuel cell evaluation system including: a fuel gas supply path that supplies a fuel gas of a first flow rate to the fuel cell; a fuel gas discharge path that discharges the fuel gas from the fuel cell; an inert gas introduction path that introduces an inert gas of a second flow rate into the fuel gas discharge path or the fuel gas supply path; a first fuel gas concentration meter that measures a fuel gas concentration in a mixed gas of the fuel gas and the inert gas flowing through the fuel gas discharge path; and a fuel gas consumption amount calculation unit that calculates the consumption amount of the fuel gas in the fuel cell based on the first flow rate, the second flow rate, and the fuel gas concentration measured by the first fuel gas concentration meter.Type: ApplicationFiled: March 14, 2022Publication date: May 2, 2024Applicant: HORIBA, LTD.Inventors: Yoichi OKADA, Yoshinori TANAKA, Kohei SASAI, Shunta WATANABE
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Publication number: 20240097510Abstract: Provided are a magnetic gear device and a rotating electrical machine having intermediate cylindrical portions with increased rigidity against radial-direction external forces. In a magnetic gear device and a rotating electrical machine according to the present disclosure, an intermediate cylindrical portion includes: magnetic-pole portions arranged in a circumferential direction; frame-shaped spacers penetrating in the radial direction, arranged in the circumferential direction alternately with the magnetic-pole portions, and each having two side-wall portions contacting with the adjacent magnetic-pole portions; end plates provided at both ends of the magnetic-pole portions and the spacers in an axial direction of a rotary shaft; and reinforcement portions placed inside the spacers while being pressed to inner surfaces of the side-wall portions in the circumferential direction, to apply forces in the circumferential direction to the adjacent magnetic-pole portions via the spacer.Type: ApplicationFiled: March 18, 2021Publication date: March 21, 2024Applicant: Mitsubishi Electric CorporationInventors: Kohei SAMATA, Takuma SASAI, Norihiko HANA
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Publication number: 20230365122Abstract: A vehicle speed is lower than a first threshold, a control device controls both a first drive unit and a second drive unit to output a requested driving force by setting an operation mode of the first drive unit to a first mode when the requested driving force is smaller than a second threshold and the charge level of a power storage device is equal to or higher than a third threshold, and controls both the first drive unit and the second drive unit to output the requested driving force by setting the operation mode of the first drive unit to a second mode when the requested driving force is equal to or larger than the second threshold or the charge level of the power storage device is lower than the third threshold.Type: ApplicationFiled: December 3, 2021Publication date: November 16, 2023Applicant: AISIN CORPORATIONInventors: Daiki SUYAMA, Takuyo MAEDA, Shohei TOKORO, Kohei SASAI
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Patent number: 11270878Abstract: A quadrupole mass spectrometer includes an ion source that ionizes a sample, a filter unit that includes a quadrupole and separates ions generated from the ion source according to mass, a detector that detects ions passing through the filter unit, a filter voltage controller that controls a filter voltage applied to the quadrupole to switch between a blocking mode in which ions entering the filter unit are not allowed to impinge on the detector and a passing mode in which ions entering the filter unit are allowed to impinge on the detector, the filter voltage including a radio-frequency voltage and a direct-current voltage, a baseline computing unit that computes a baseline based on outputs of the detector in the blocking mode, and an analyzing unit that outputs an analysis result of the sample based on outputs of the detector in the passing mode and the computed baseline.Type: GrantFiled: November 20, 2020Date of Patent: March 8, 2022Assignees: HORIBA STEC, CO., LTD., HORIBA, LTD.Inventors: Kohei Sasai, Kazushi Sasakura, Toshihiro Ikeyama, Takahito Inoue, Hiroshi Uchihara
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Publication number: 20210318267Abstract: An element analysis device is provided, which can quantitatively analyze an H element contained in a sample gas with high accuracy. The element analysis device is provided with a heating furnace for heating a crucible having a sample contained therein while a carrier gas is introduced into the heating furnace to vaporize at least a part of the sample to generate a sample gas containing the H element and then deriving the sample gas with the carrier gas as a mixed gas and a mass spectrometer for quantitatively analyzing at least one element contained in the sample gas in the mixed gas that has been derived from the heating furnace, wherein the mass spectrometer quantitatively analyzes the H element contained as an H2O component in the mixed gas as the H element contained in the sample gas.Type: ApplicationFiled: May 21, 2019Publication date: October 14, 2021Inventors: Takahito INOUE, Hiroshi UCHIHARA, Kohei SASAI, Toshihiro IKEYAMA, Hiroyuki SEKI
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Publication number: 20210166932Abstract: A quadrupole mass spectrometer includes an ion source that ionizes a sample, a filter unit that includes a quadrupole and separates ions generated from the ion source according to mass, a detector that detects ions passing through the filter unit, a filter voltage controller that controls a filter voltage applied to the quadrupole to switch between a blocking mode in which ions entering the filter unit are not allowed to impinge on the detector and a passing mode in which ions entering the filter unit are allowed to impinge on the detector, the filter voltage including a radio-frequency voltage and a direct-current voltage, a baseline computing unit that computes a baseline based on outputs of the detector in the blocking mode, and an analyzing unit that outputs an analysis result of the sample based on outputs of the detector in the passing mode and the computed baseline.Type: ApplicationFiled: November 20, 2020Publication date: June 3, 2021Applicants: HORIBA STEC, Co., Ltd., HORIBA, Ltd.Inventors: Kohei SASAI, Kazushi SASAKURA, Toshihiro IKEYAMA, Takahito INOUE, Hiroshi UCHIHARA
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Patent number: 10978285Abstract: An objective of this invention is to conduct an accurate quantitative analysis on the Ar element contained in a sample gas by an element analysis device comprising a heating furnace and a mass spectrometer for conducting a quantitative analysis on an element in a vacuum atmosphere. The element analysis device comprises: a heating furnace that heats a graphite crucible containing a sample while introducing a carrier gas into the heating furnace, thereby vaporizing the sample to generate a sample gas; a quadrupole mass spectrometer that conducts the quantitative analysis on the Ar element contained in the sample gas in a mixed gas comprising the carrier gas and the sample gas discharged from the heating furnace, a first pressure regulator that controls the pressure of the carrier gas to be introduced into the heating furnace, and a second pressure regulator that controls the pressure of the mixed gas discharged from the heating furnace.Type: GrantFiled: September 22, 2017Date of Patent: April 13, 2021Assignees: HORIBA, LTD., HORIBA STEC, CO., LTD.Inventors: Takahito Inoue, Hiroshi Uchihara, Kohei Sasai, Toshihiro Ikeyama
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Publication number: 20190206667Abstract: An objective of this invention is to conduct an accurate quantitative analysis on the Ar element contained in a sample gas by an element analysis device comprising a heating furnace and a mass spectrometer for conducting a quantitative analysis on an element in a vacuum atmosphere. The element analysis device comprises: a heating furnace that heats a graphite crucible containing a sample while introducing a carrier gas into the heating furnace, thereby vaporizing the sample to generate a sample gas; a quadrupole mass spectrometer that conducts the quantitative analysis on the Ar element contained in the sample gas in a mixed gas comprising the carrier gas and the sample gas discharged from the heating furnace, a first pressure regulator that controls the pressure of the carrier gas to be introduced into the heating furnace, and a second pressure regulator that controls the pressure of the mixed gas discharged from the heating furnace.Type: ApplicationFiled: September 22, 2017Publication date: July 4, 2019Inventors: Takahito INOUE, Hiroshi UCHIHARA, Kohei SASAI, Toshihiro IKEYAMA
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Patent number: 10026582Abstract: In order to provide a thermionic emission filament capable of ensuring a long life and improving an analysis accuracy of a mass spectrometer using the thermionic emission filament, in the thermionic emission filament including a core member through which electric current flows and an electron emitting layer which is formed so as to cover a surface of the core member, the electron emitting layer is configured to have denseness for substantial gas-tight integrity.Type: GrantFiled: December 7, 2016Date of Patent: July 17, 2018Assignee: HORIBA STEC, CO., LTD.Inventors: Kohei Sasai, Toshihiro Ikeyama, Toshiaki Sakai
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Publication number: 20170169981Abstract: In order to provide a thermionic emission filament capable of ensuring a long life and improving an analysis accuracy of a mass spectrometer using the thermionic emission filament, in the thermionic emission filament including a core member through which electric current flows and an electron emitting layer which is formed so as to cover a surface of the core member, the electron emitting layer is configured to have denseness for substantial gas-tight integrity.Type: ApplicationFiled: December 7, 2016Publication date: June 15, 2017Applicant: HORIBA STEC, CO., LTD.Inventors: Kohei SASAI, Toshihiro IKEYAMA, Toshiaki SAKAI
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Publication number: 20120267525Abstract: The present invention is directed to a gas analyzer that hardly generates noise peaks and facilitates reading of a molecular peak, even when a low-molecular-weight alkane is an analysis target. The analyzer analyzes an alkane of the carbon number 1 through 12 contained in a sample gas as an analysis target. The analyzed includes an ionization module for ionizing the sample gas by thermoelectrons having energy of 10 through 30 eV, an ion extraction electrode for extracting ions from the ionization module, a quadrupole module for selectively passing the ions extracted from the ionization module by the ion extraction electrode, through the quadrupole module, and an ion detection module for detecting the ions passed through the quadrupole module.Type: ApplicationFiled: April 22, 2011Publication date: October 25, 2012Applicant: HORIBA STEC, CO., LTD.Inventors: Kohei Sasai, Said Boumsellek