Patents by Inventor Kohey Uchida

Kohey Uchida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

Electronic circuit and integrated circuit including scan testing circuit, and power consumption reducing method used for integrated circuit

Publication number: 20070226560

Abstract: An integrated circuit with a scan testing circuit which enables reducing power consumption in normal operation mode is provided. A power-supply controller applies a power-supply voltage to internal and external transmission circuits in scan test mode and stops applying the power supply voltage in normal operation mode. Thus, power consumption associated with operations of the internal and external transmission circuits is eliminated, thereby reducing power consumption in normal operation mode.

Type: Application

Filed: March 15, 2007

Publication date: September 27, 2007

Applicant: NEC CORPORATION

Inventor: Kohey Uchida

Electronic circuit and integrated circuit including scan testing circuit, and power consumption reducing method used for integrated circuit