Patents by Inventor Kohji Kakefuda

Kohji Kakefuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7206378
    Abstract: An X-ray analysis apparatus includes: an X-ray radiation unit that irradiates a sample with X-ray; an X-ray detection unit that detects X-ray emission from the sample; a unit that allows the X-ray detection unit to perform scanning operation for changing the angle of the X-ray detection unit with respect to the sample; and an image controller that displays information related to X-ray intensity detected by the X-ray detection unit and information related to a scanning angle of the X-ray detection unit as a 3D image. The image controller displays the 3D image simultaneously with the scanning operation of the X-ray detection unit. Further, simultaneously with the scanning operation of the X-ray detection unit, two or all of 1D, 2D, and 3D images are displayed in one screen. A measurement result starts being displayed as a 3D image before information related to all measurement results has been obtained.
    Type: Grant
    Filed: February 25, 2005
    Date of Patent: April 17, 2007
    Assignee: Rigaku Corporation
    Inventors: Yasushi Obata, Kohji Kakefuda
  • Patent number: 7120227
    Abstract: The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions on a screen which represents the reciprocal space of a sample crystal. The tip location of the scattering vector can be seen dynamically and the X-ray diffraction phenomenon under changing measuring conditions can be readily understood, effecting easy consideration of the measuring conditions and easy evaluation of the measured results.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: October 10, 2006
    Assignee: Rigaku Corporation
    Inventors: Tetsuya Ozawa, Susumu Yamaguchi, Kohji Kakefuda
  • Publication number: 20050190881
    Abstract: An X-ray analysis apparatus includes: an X-ray radiation unit that irradiates a sample with X-ray; an X-ray detection unit that detects X-ray emission from the sample; a unit that allows the X-ray detection unit to perform scanning operation for changing the angle of the X-ray detection unit with respect to the sample; and an image controller that displays information related to X-ray intensity detected by the X-ray detection unit and information related to a scanning angle of the X-ray detection unit as a 3D image. The image controller displays the 3D image simultaneously with the scanning operation of the X-ray detection unit. Further, simultaneously with the scanning operation of the X-ray detection unit, two or all of 1D, 2D, and 3D images are displayed in one screen. A measurement result starts being displayed as a 3D image before information related to all measurement results has been obtained.
    Type: Application
    Filed: February 25, 2005
    Publication date: September 1, 2005
    Applicant: Rigaku Corporation
    Inventors: Yasushi Obata, Kohji Kakefuda
  • Publication number: 20050002488
    Abstract: The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions on a screen which represents the reciprocal space of a sample crystal. The tip location of the scattering vector can be seen dynamically and the X-ray diffraction phenomenon under changing measuring conditions can be readily understood, effecting easy consideration of the measuring conditions and easy evaluation of the measured results.
    Type: Application
    Filed: May 25, 2004
    Publication date: January 6, 2005
    Applicant: Rigaku Corporation
    Inventors: Tetsuya Ozawa, Susumu Yamaguchi, Kohji Kakefuda