Patents by Inventor Koichiro Komatsu

Koichiro Komatsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8687182
    Abstract: A surface inspection apparatus and a surface inspection method aim to securely deal with finer repetition pitch without shortening the wavelength of illumination light. To this end, the apparatus includes a unit illuminating repetitive pattern(s) formed on the substrate surface to be inspected with linearly polarized light, a unit setting to an oblique angle an angle between the direction of an intersecting line of a vibration plane of the linearly polarized light on the substrate surface and the repetition direction of repetitive pattern(s), a unit extracting a polarized light component perpendicular to the vibration plane of the linearly polarized light, from light having been emitted from the repetitive pattern(s) in a specular direction, and a unit detecting a defect of the repetitive pattern(s) according to the light intensity of the polarized light component.
    Type: Grant
    Filed: December 17, 2012
    Date of Patent: April 1, 2014
    Assignee: Nikon Corporation
    Inventors: Kazuhiko Fukazawa, Koichiro Komatsu, Takeo Oomori
  • Patent number: 8441627
    Abstract: A surface inspection apparatus and a surface inspection method aim to securely deal with finer repetition pitch without shortening the wavelength of illumination light. To this end, the apparatus includes a unit illuminating repetitive pattern(s) formed on the substrate surface to be inspected with linearly polarized light, a unit setting to an oblique angle an angle between the direction of an intersecting line of a vibration plane of the linearly polarized light on the substrate surface and the repetition direction of repetitive pattern(s), a unit extracting a polarized light component perpendicular to the vibration plane of the linearly polarized light, from light having been emitted from the repetitive pattern(s) in a specular direction, and a unit detecting a defect of the repetitive pattern(s) according to the light intensity of the polarized light component.
    Type: Grant
    Filed: March 30, 2010
    Date of Patent: May 14, 2013
    Assignee: Nikon Corporation
    Inventors: Kazuhiko Fukazawa, Koichiro Komatsu, Takeo Oomori
  • Patent number: 8403687
    Abstract: A data storage device is provided. At least a storage section configured to store information therein and a connection terminal configured to transmit information are mounted on a substrate. A casing accommodates the substrate, the casing is formed with an opening to expose a connection portion of the connection terminal to the outside. A shield plate configured to shield the opening of the casing. A shield plate actuation mechanism is configured to detect a connection state between the connection terminal and a receiving terminal to which the connection terminal is connected and actuate the shield plate. The shield plate actuation mechanism actuates the shield plate to shield the opening when the shield plate actuation mechanism detects that the connection terminal is separated from the receiving terminal.
    Type: Grant
    Filed: November 18, 2010
    Date of Patent: March 26, 2013
    Assignee: Seiko Epson Corporation
    Inventors: Tsukasa Abe, Koichiro Komatsu
  • Patent number: 8049901
    Abstract: A measuring device includes a light-sending part sending light in a first direction which is a depth direction of a hollow shape, a conversion part converting a direction of the light into a circumference direction approximately orthogonal to the first direction, a detection part detecting light reflected inside a measuring object, the direction of which is converted by the conversion part, and a shape measurement part measuring an inside shape of the measuring object by obtaining a shift from a reference position according to a detection result of the detection part. Thereby, it is possible to obtain the hollow shape of an object at one time without a need of rotating the object or a light source, and to carry out a highly accurate measurement using a simple device.
    Type: Grant
    Filed: June 3, 2009
    Date of Patent: November 1, 2011
    Assignee: Nikon Corporation
    Inventors: Hiroshi Aoki, Koichiro Komatsu
  • Publication number: 20110136357
    Abstract: A data storage device is provided. At least a storage section configured to store information therein and a connection terminal configured to transmit information are mounted on a substrate. A casing accommodates the substrate, the casing is formed with an opening to expose a connection portion of the connection terminal to the outside. A shield plate configured to shield the opening of the casing. A shield plate actuation mechanism is configured to detect a connection state between the connection terminal and a receiving terminal to which the connection terminal is connected and actuate the shield plate. The shield plate actuation mechanism actuates the shield plate to shield the opening when the shield plate actuation mechanism detects that the connection terminal is separated from the receiving terminal.
    Type: Application
    Filed: November 18, 2010
    Publication date: June 9, 2011
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Tsukasa Abe, Koichiro Komatsu
  • Patent number: 7834993
    Abstract: A surface inspection apparatus and a surface inspection method aim to securely deal with finer repetition pitch without shortening the wavelength of illumination light. To this end, the apparatus includes a unit illuminating repetitive pattern(s) formed on the substrate surface to be inspected with linearly polarized light, a unit setting to an oblique angle an angle between the direction of an intersecting line of a vibration plane of the linearly polarized light on the substrate surface and the repetition direction of repetitive pattern(s), a unit extracting a polarized light component perpendicular to the vibration plane of the linearly polarized light, from light having been emitted from the repetitive pattern(s) in a specular direction, and a unit detecting a defect of the repetitive pattern(s) according to the light intensity of the polarized light component.
    Type: Grant
    Filed: October 9, 2007
    Date of Patent: November 16, 2010
    Assignee: Nikon Corporation
    Inventors: Kazuhiko Fukazawa, Koichiro Komatsu, Takeo Oomori
  • Publication number: 20100225906
    Abstract: A surface inspection apparatus and a surface inspection method aim to securely deal with finer repetition pitch without shortening the wavelength of illumination light. To this end, the apparatus includes a unit illuminating repetitive pattern(s) formed on the substrate surface to be inspected with linearly polarized light, a unit setting to an oblique angle an angle between the direction of an intersecting line of a vibration plane of the linearly polarized light on the substrate surface and the repetition direction of repetitive pattern(s), a unit extracting a polarized light component perpendicular to the vibration plane of the linearly polarized light, from light having been emitted from the repetitive pattern(s) in a specular direction, and a unit detecting a defect of the repetitive pattern(s) according to the light intensity of the polarized light component.
    Type: Application
    Filed: March 30, 2010
    Publication date: September 9, 2010
    Applicant: NIKON CORPORATION
    Inventors: Kazuhiko Fukazawa, Koichiro Komatsu, Takeo Oomori
  • Publication number: 20090237677
    Abstract: A measuring device includes a light-sending part sending light in a first direction which is a depth direction of a hollow shape, a conversion part converting a direction of the light into a circumference direction approximately orthogonal to the first direction, a detection part detecting light reflected inside a measuring object, the direction of which is converted by the conversion part, and a shape measurement part measuring an inside shape of the measuring object by obtaining a shift from a reference position according to a detection result of the detection part. Thereby, it is possible to obtain the hollow shape of an object at one time without a need of rotating the object or a light source, and to carry out a highly accurate measurement using a simple device.
    Type: Application
    Filed: June 3, 2009
    Publication date: September 24, 2009
    Applicant: NIKON CORPORATION
    Inventors: Hiroshi Aoki, Koichiro Komatsu
  • Publication number: 20080094628
    Abstract: A surface inspection apparatus and a surface inspection method aim to securely deal with finer repetition pitch without shortening the wavelength of illumination light. To this end, the apparatus includes a unit illuminating repetitive pattern(s) formed on the substrate surface to be inspected with linearly polarized light, a unit setting to an oblique angle an angle between the direction of an intersecting line of a vibration plane of the linearly polarized light on the substrate surface and the repetition direction of repetitive pattern(s), a unit extracting a polarized light component perpendicular to the vibration plane of the linearly polarized light, from light having been emitted from the repetitive pattern(s) in a specular direction, and a unit detecting a defect of the repetitive pattern(s) according to the light intensity of the polarized light component.
    Type: Application
    Filed: October 9, 2007
    Publication date: April 24, 2008
    Applicant: NIKON CORPORATION
    Inventors: Kazuhiko Fukazawa, Koichiro Komatsu, Takeo Oomori
  • Patent number: 7322335
    Abstract: An oil pan structure includes a tubular level-gauge guide into which an oil level-gauge that measures the amount of oil stored in the oil pan is inserted. The oil pan structure further includes a nozzle guide that guides the end of a nozzle of an oil changer, which is inserted into the level-gauge-guide when the oil in the oil pan is replaced with new oil, to a position near the deepest portion of the reservoir portion.
    Type: Grant
    Filed: December 13, 2005
    Date of Patent: January 29, 2008
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Yoshinori Suzuki, Koichiro Komatsu, Hisayoshi Kato
  • Patent number: 7324274
    Abstract: A microscope includes a microscope optical system that forms an enlarged image of an observation position by an immersion objective lens with an immersion liquid is filled between the observation position and the objective lens, a moving mechanism that moves a state that a first observation position among a plurality of observation positions on a substrate is positioned in a field of view of the microscope to another state that a second observation position is positioned in the field of view of the microscope, an immersion supplier that supplies the immersion liquid to fill between the objective lens and the observation position, an immersion remover that removes the immersion liquid filled between the objective lens and the observation position, and an immersion remove controller that makes the immersion remover remove the immersion liquid before operating the moving mechanism.
    Type: Grant
    Filed: December 22, 2004
    Date of Patent: January 29, 2008
    Assignee: Nikon Corporation
    Inventors: Koichiro Komatsu, Hiromasa Shibata
  • Patent number: 7311378
    Abstract: A wiping apparatus has a cover box which covers at least a feeding reel, a take-up reel, a wiping member and a spray head, as well as a sheet-feeding passage for the wiping sheet. The passage extends from the feeding reel to the take-up reel. The cover box has formed therein a member opening through which the wiping member protrudes.
    Type: Grant
    Filed: February 21, 2005
    Date of Patent: December 25, 2007
    Assignee: Seiko Epson Corporation
    Inventors: Kazuyoshi Fujimori, Koichiro Komatsu, Toru Shirasaki
  • Patent number: 7298471
    Abstract: A surface inspection apparatus and a surface inspection method aim to securely deal with finer repetition pitch without shortening the wavelength of illumination light. To this end, the apparatus includes a unit illuminating repetitive pattern(s) formed on the substrate surface to be inspected with linearly polarized light, a unit setting to an oblique angle an angle between the direction of an intersecting line of a vibration plane of the linearly polarized light on the substrate surface and the repetition direction of repetitive pattern(s), a unit extracting a polarized light component perpendicular to the vibration plane of the linearly polarized light, from light having been emitted from the repetitive pattern(s) in a specular direction, and a unit detecting a defect of the repetitive pattern(s) according to the light intensity of the polarized light component.
    Type: Grant
    Filed: April 26, 2006
    Date of Patent: November 20, 2007
    Assignee: Nikon Corporation
    Inventors: Kazuhiko Fukazawa, Koichiro Komatsu, Takeo Oomori
  • Publication number: 20060192953
    Abstract: A surface inspection apparatus and a surface inspection method aim to securely deal with finer repetition pitch without shortening the wavelength of illumination light. To this end, the apparatus includes a unit illuminating repetitive pattern(s) formed on the substrate surface to be inspected with linearly polarized light, a unit setting to an oblique angle an angle between the direction of an intersecting line of a vibration plane of the linearly polarized light on the substrate surface and the repetition direction of repetitive pattern(s), a unit extracting a polarized light component perpendicular to the vibration plane of the linearly polarized light, from light having been emitted from the repetitive pattern(s) in a specular direction, and a unit detecting a defect of the repetitive pattern(s) according to the light intensity of the polarized light component.
    Type: Application
    Filed: April 26, 2006
    Publication date: August 31, 2006
    Applicant: NIKON CORPORATION
    Inventors: Kazuhiko Fukazawa, Koichiro Komatsu, Takeo Oomori
  • Publication number: 20060130801
    Abstract: An oil pan structure includes a tubular level-gauge guide into which an oil level-gauge that measures the amount of oil stored in the oil pan is inserted. The oil pan structure further includes a nozzle guide that guides the end of a nozzle of an oil changer, which is inserted into the level-gauge-guide when the oil in the oil pan is replaced with new oil, to a position near the deepest portion of the reservoir portion.
    Type: Application
    Filed: December 13, 2005
    Publication date: June 22, 2006
    Inventors: Yoshinori Suzuki, Koichiro Komatsu, Hisayoshi Kato
  • Publication number: 20050179997
    Abstract: A microscope includes a microscope optical system that forms an enlarged image of an observation position by an immersion objective lens with an immersion liquid is filled between the observation position and the objective lens, a moving mechanism that moves a state that a first observation position among a plurality of observation positions on a substrate is positioned in a field of view of the microscope to another state that a second observation position is positioned in the field of view of the microscope, an immersion supplier that supplies the immersion liquid to fill between the objective lens and the observation position, an immersion remover that removes the immersion liquid filled between the objective lens and the observation position, and an immersion remove controller that makes the immersion remover remove the immersion liquid before operating the moving mechanism.
    Type: Application
    Filed: December 22, 2004
    Publication date: August 18, 2005
    Applicant: NIKON CORPORATION
    Inventors: Koichiro Komatsu, Hiromasa Shibata
  • Publication number: 20050162461
    Abstract: A wiping apparatus has a cover box which covers at least a feeding reel, a take-up reel, a wiping member and a spray head, as well as a sheet-feeding passage for the wiping sheet. The passage extends from the feeding reel to the take-up reel. The cover box has formed therein a member opening through which the wiping member protrudes.
    Type: Application
    Filed: February 21, 2005
    Publication date: July 28, 2005
    Inventors: Kazuyoshi Fujimori, Koichiro Komatsu, Toru Shirasaki
  • Patent number: 6774987
    Abstract: A surface inspection method for inspecting a pattern formed at a surface of a test piece, includes: a first step in which a plurality of inspection conditions that are different from each other are set; a second step in which light from the surface of the test piece is detected by irradiating illumination light onto the surface of the test piece under each of the plurality of inspection conditions; a third step in which a plurality of sets of detection information corresponding to the plurality of inspection conditions are generated based upon the detected light; a fourth step in which a logical OR of the plurality of sets of detection information is obtained; and a fifth step in which a decision is made as to whether or not the pattern at the surface of the test piece is acceptable based upon results of the logical OR.
    Type: Grant
    Filed: September 15, 2003
    Date of Patent: August 10, 2004
    Assignee: Nikon Corporation
    Inventors: Koichiro Komatsu, Takeo Oomori
  • Publication number: 20040063232
    Abstract: A surface inspection method for inspecting a pattern formed at a surface of a test piece, includes: a first step in which a plurality of inspection conditions that are different from each other are set; a second step in which light from the surface of the test piece is detected by irradiating illumination light onto the surface of the test piece under each of the plurality of inspection conditions; a third step in which a plurality of sets of detection information corresponding to the plurality of inspection conditions are generated based upon the detected light; a fourth step in which a logical OR of the plurality of sets of detection information is obtained; and a fifth step in which a decision is made as to whether or not the pattern at the surface of the test piece is acceptable based upon results of the logical OR.
    Type: Application
    Filed: September 15, 2003
    Publication date: April 1, 2004
    Applicant: Nikon Corporation
    Inventors: Koichiro Komatsu, Takeo Oomori
  • Publication number: 20030112428
    Abstract: The present invention has one object to provide a method and an apparatus for surface inspection capable of excellently inspecting a substrate on which repeated pattern with finer pitch is formed. In order to carry out above object, the present invention provides a surface inspection apparatus comprising; a light source unit which provides light flux; an illumination optical system which leads the light flux to a test substrate, having either one of a reflection mirror or a positive lens for illumination; a light receiving optical system which receives a diffracted light from the test substrate, having either one of a reflection mirror or a positive lens for light receiving; and a processing unit which detects surface condition of the test substrate based on output from a light receiving unit consisting of the light receiving optical system and an imaging device; wherein the light source unit provides ultraviolet light having a wavelength shorter than 400 nm.
    Type: Application
    Filed: November 27, 2002
    Publication date: June 19, 2003
    Applicant: Nikon Corporation
    Inventors: Takeo Oomori, Koichiro Komatsu, Noriyuki Koide