Patents by Inventor Koji FUJIMORI

Koji FUJIMORI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11931959
    Abstract: A three-dimensional shaping device includes: a stage whose shaping surface has a first groove and a second groove extending in a first direction; a discharge unit configured to supply a shaping material to the shaping surface; a movement mechanism configured to relatively move the stage and the discharge unit; and a control unit configured to control the discharge unit and the movement mechanism.
    Type: Grant
    Filed: August 31, 2022
    Date of Patent: March 19, 2024
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Akihiko Tsunoya, Koji Fujimori
  • Publication number: 20230061480
    Abstract: A three-dimensional shaping device includes: a stage whose shaping surface has a first groove and a second groove extending in a first direction; a discharge unit configured to supply a shaping material to the shaping surface; a movement mechanism configured to relatively move the stage and the discharge unit; and a control unit configured to control the discharge unit and the movement mechanism.
    Type: Application
    Filed: August 31, 2022
    Publication date: March 2, 2023
    Inventors: Akihiko TSUNOYA, Koji FUJIMORI
  • Patent number: 11577470
    Abstract: Provided is a three-dimensional shaping apparatus in which surface of a three-dimensional shaped object can be prevented from being roughened. The three-dimensional shaping apparatus that shapes a three-dimensional shaped object by stacking layers of a material includes: a stage; a discharge unit that has a nozzle surface in which a nozzle hole is formed; a moving unit that is configured to change a relative position between the stage and the nozzle surface; and a control unit that is configured to control the moving unit. The control unit drives the moving unit such that a relation between a gap G between the nozzle surface and the stage or the layer of the material when the material is discharged from the discharge unit and an outer diameter Dp of the nozzle surface satisfies a following relation (1). Dp?20×G+0.
    Type: Grant
    Filed: November 25, 2020
    Date of Patent: February 14, 2023
    Inventors: Manabu Watanabe, Eiji Okamoto, Akihiko Tsunoya, Koji Fujimori, Kazuhide Nakamura
  • Patent number: 11498266
    Abstract: A three-dimensional molding device includes a discharge unit that discharges a molding material towards a stage, a heating unit that heats the discharge unit, a temperature acquisition unit that acquires a temperature of the molding material placed on the stage, and a control unit.
    Type: Grant
    Filed: February 25, 2020
    Date of Patent: November 15, 2022
    Assignee: SEIKO EPSON CORPORATION
    Inventors: Koji Fujimori, Manabu Watanabe
  • Publication number: 20210154940
    Abstract: Provided is a three-dimensional shaping apparatus in which surface of a three-dimensional shaped object can be prevented from being roughened. The three-dimensional shaping apparatus that shapes a three-dimensional shaped object by stacking layers of a material includes: a stage; a discharge unit that has a nozzle surface in which a nozzle hole is formed; a moving unit that is configured to change a relative position between the stage and the nozzle surface; and a control unit that is configured to control the moving unit. The control unit drives the moving unit such that a relation between a gap G between the nozzle surface and the stage or the layer of the material when the material is discharged from the discharge unit and an outer diameter Dp of the nozzle surface satisfies a following relation (1). Dp×20×G+0.
    Type: Application
    Filed: November 25, 2020
    Publication date: May 27, 2021
    Inventors: Manabu WATANABE, Eiji OKAMOTO, Akihiko TSUNOYA, Koji FUJIMORI, Kazuhide NAKAMURA
  • Publication number: 20200269491
    Abstract: A three-dimensional molding device includes a discharge unit that discharges a molding material towards a stage, a heating unit that heats the discharge unit, a temperature acquisition unit that acquires a temperature of the molding material placed on the stage, and a control unit.
    Type: Application
    Filed: February 25, 2020
    Publication date: August 27, 2020
    Applicant: SEIKO EPSON CORPORATION
    Inventors: Koji FUJIMORI, Manabu WATANABE
  • Patent number: 8900876
    Abstract: Provided is an abnormality-identifying method for identifying an abnormality in an analyzer which analyzes a specimen based on optical measurement. The method includes firstly acquiring a reference value which is a measurement result obtained by using a low-concentration reagent containing a component in predetermined very low concentrations, secondly acquiring an abnormality-identification measurement value which is a measurement result obtained through an analysis process using a high-concentration reagent containing the component in predetermined high concentrations, and identifying an abnormality in an analysis process concerning removal of the high-concentration reagent based on whether the abnormality-identification measurement value is within an acceptable range set based on the reference value.
    Type: Grant
    Filed: April 13, 2009
    Date of Patent: December 2, 2014
    Assignee: Beckman Coulter, Inc.
    Inventors: Kiyotaka Kubota, Yukihiro Furusawa, Koji Fujimori
  • Publication number: 20090257051
    Abstract: Provided is an abnormality-identifying method for identifying an abnormality in an analyzer which analyzes a specimen based on optical measurement. The method includes firstly acquiring a reference value which is a measurement result obtained by using a low-concentration reagent containing a component in predetermined very low concentrations, secondly acquiring an abnormality-identification measurement value which is a measurement result obtained through an analysis process using a high-concentration reagent containing the component in predetermined high concentrations, and identifying an abnormality in an analysis process concerning removal of the high-concentration reagent based on whether the abnormality-identification measurement value is within an acceptable range set based on the reference value.
    Type: Application
    Filed: April 13, 2009
    Publication date: October 15, 2009
    Applicant: OLYMPUS CORPORATION
    Inventors: Kiyotaka KUBOTA, Yukihiro FURUSAWA, Koji FUJIMORI
  • Publication number: 20090258433
    Abstract: Provided is an abnormality-identifying method for identifying an abnormality of an analyzer which analyzes a specimen based on optical characteristics. All predetermined analysis processes to be performed on the specimen but an analysis process whose abnormality is to be examined are eliminated, and the abnormality of the analyzer is identified based on a measurement result which is obtained through the analysis process whose abnormality is to be examined and a reaction process in which a substance whose abnormality is to be identified or a predetermined reagent is reacted with a predetermined reactant.
    Type: Application
    Filed: April 13, 2009
    Publication date: October 15, 2009
    Applicant: OLYMPUS CORPORATION
    Inventors: Kiyotaka KUBOTA, Yukihiro FURUSAWA, Koji FUJIMORI
  • Publication number: 20090254309
    Abstract: An abnormality identifying method is for identifying an abnormality detail in an analyzing apparatus that analyzes a specimen based on optical measurement. The method includes: for a reagent having a same function as an intermediate product produced during analysis processes, canceling a predetermined analysis process other than an analysis process to be verified for abnormality from among analysis processes with respect to the specimen; and identifying an abnormality in the analyzing apparatus based on a measurement result obtained by performing a same analysis process as an analysis process performed on the intermediate product as well as the analysis process to be verified for abnormality.
    Type: Application
    Filed: April 13, 2009
    Publication date: October 8, 2009
    Applicant: OLYMPUS CORPORATION
    Inventors: Kiyotaka KUBOTA, Yukihiro FURUSAWA, Koji FUJIMORI