Abstract: To carry out accurate defect inspection over a wide area, a defect inspection device includes: a radiation source section configured to emit an electromagnetic wave to a separator roll; and a sensor section configured to detect the electromagnetic wave that the radiation source section has emitted to the separator roll, the sensor section being configured to detect the electromagnetic wave before and after the separator roll is moved relative to the radiation source section.

Abstract: An image processing device for estimating the three-dimensional size of a foreign object is provided. The image processing device includes a storage section configured to store respective first pixel values of a plurality of pixels; a pixel value computing section configured to calculate the respective second pixel values of the plurality of pixels, the second pixel values being each a ratio of the difference between the first pixel value of the corresponding pixel and the background value of the corresponding pixel to the background value; and a pixel value integrating section configured to integrate respective second pixel values of a group of pixels belonging in a continuous region.

Abstract: A method of producing a film is provided. The method involves a winding step including a point-of-interest detecting step including detecting a point-of-interest on the film, a number-of-turns counting step including counting the number of turns of the film wound around a winding core, and a number-of-turns storing step including storing, in association with the number of turns of the film wound around the winding core, a position of the point-of-interest in a direction of transfer of the film. The method eliminates the need for a step of printing on a film for the purpose of locating a point-of-interest on the film.

Abstract: An image processing device capable of high-accuracy foreign object inspection is provided. The image processing device include a background value setting section configured to (i) obtain a value for use as a background value on a basis of a first pixel value of at least one reference pixel present in the vicinity of a target pixel and having a predetermined positional relationship with the target pixel, and (ii) set the background value of the target pixel to the value obtained.

Abstract: An image processing device and method for reducing the risk of a failure to detect a foreign object provided. The image processing device is configured for processing an image based on an X ray having propagated through an inspection target having a foreign object. The image processing device includes a storage section configured to store respective first pixel values of a plurality of pixels that form the image; a pixel value computing section configured to calculate respective second pixel values of the plurality of pixels on a basis of the first pixel values; and a pixel value integrating section configured to integrate respective second pixel values of a group of pixels belonging in a continuous region. The method includes steps of storing the respective first pixel values, calculating the respective second pixel values, and integrating respective second pixel values of a group of pixels belonging in a continuous region.

Abstract: A foreign object inspection device is provided. The device reduces the risk of a failure to detect a foreign object. A direction normal to a principal surface is inclined with respect to a direction in which an intensity of electromagnetic waves emitted from an electromagnetic wave generating source is greatest.

Abstract: To carry out accurate defect inspection over a wide area, a defect inspection device (1) includes: a radiation source section (2) configured to emit an electromagnetic wave (4) to a separator roll (10); and a sensor section (3) configured to detect the electromagnetic wave (4) that the radiation source section (2) has emitted to the separator roll (10), the sensor section (3) being configured to detect the electromagnetic wave (4) before and after the separator roll is moved relative to the radiation source section (2).

Abstract: To inspect a separator roll for a defect inside the separator roll with use of only a small number of defect inspection devices, a defect inspection device (1) includes: a radiation source section (2) configured to emit an electromagnetic wave (4) to a separator roll (10); and a sensor section (3) configured to detect the electromagnetic wave (4) having passed through the separator roll (10).

Abstract: To carry out accurate defect inspection over a wide area, a defect inspection device includes: a radiation source section configured to emit an electromagnetic wave to a separator roll; and a sensor section configured to detect the electromagnetic wave that the radiation source section has emitted to the separator roll, the sensor section being configured to detect the electromagnetic wave before and after the separator roll is moved relative to the radiation source section.

Abstract: To easily specify the position of a defect in a separator, a method for producing a separator original sheet (12b) includes the steps of: forming a separator original sheet (12b) including a separator original sheet (12c) and a heat-resistant layer coated on the separator original sheet (12c); detecting a defect (D) in the separator original sheet (12b); and recording information including information on a position of the defect (D) which position is a position in the width direction of the separator original sheet (12b).

Abstract: A transfer system includes a robot arm configured to hold a core, which is tubular, of at least one separator roll from a side of a first side surface of the at least one separator roll. The at least one separator roll includes the core and a separator, wound around an outer circumferential surface of the core. The robot arm is further configured to take out the at least one separator roll from a rack. A defect inspection device is configured to hold the core from a side of a second side surface of the at least one separator roll, receive the at least one separator roll from the robot arm, and inspect, for a defect, the at least one separator roll thus received.

Abstract: The present invention makes it possible to check a target object highly accurately and quickly. Each of the electromagnetic wave reception regions includes m pieces of smaller regions which are arranged along a diameter of a circle in a plan view of a circular profile surface.

Abstract: The present invention makes it possible to check a target object highly accurately and quickly. In a sensor having an electromagnetic wave reception region, suitability of portions for capturing an image of a subject which moves fast is heightened as a distance from a center increases in a plan view of a circular profile surface.

Abstract: An inspection system is provided to inspect an inspection target efficiently. The inspection system includes a second chamber separate from a first chamber in which a radiation source section is present. The second chamber is surrounded by a wall that blocks an electromagnetic wave that the radiation source section emits. A separator roll is stocked in the second chamber.

Abstract: An image processing device capable of high-accuracy foreign object inspection is provided. The image processing device include a background value setting section configured to (i) obtain a value for use as a background value on a basis of a first pixel value of at least one reference pixel present in the vicinity of a target pixel and having a predetermined positional relationship with the target pixel, and (ii) set the background value of the target pixel to the value obtained.

Abstract: A foreign object inspection device is provided. The device reduces the risk of a failure to detect a foreign object. A direction normal to a principal surface is inclined with respect to a direction in which an intensity of electromagnetic waves emitted from an electromagnetic wave generating source is greatest.

Abstract: An image processing device for reducing the risk of a failure to detect a foreign object is provided. The image processing device (4) is configured for processing an image based on an X ray having propagated through an inspection target (1) having a foreign object (13). The image processing device includes a storage section (41) configured to store respective first pixel values of a plurality of pixels that form the image; a pixel value computing section (42) configured to calculate respective second pixel values of the plurality of pixels on a basis of the first pixel values; and a pixel value integrating section (44) configured to integrate respective second pixel values of a group of pixels belonging in a continuous region.

Abstract: An image processing device for estimating the three-dimensional size of a foreign object is provided. The image processing device includes a storage section configured to store respective first pixel values of a plurality of pixels; a pixel value computing section configured to calculate the respective second pixel values of the plurality of pixels, the second pixel values being each a ratio of the difference between the first pixel value of the corresponding pixel and the background value of the corresponding pixel to the background value; and a pixel value integrating section configured to integrate respective second pixel values of a group of pixels belonging in a continuous region.

Abstract: A foreign object inspection device to increase the efficiency of inspection and reduce the risk of a failure to detect a foreign object is provided. The a foreign object inspection device includes: a moving mechanism configured to translate an inspection target; an image sensor in the form of a TDI sensor; a storage section; a pixel value computing section configured to calculate the respective second pixel values of a plurality of pixels on the basis of first pixel values; and a pixel value integrating section configured to integrate the respective second pixel values of a group of pixels belonging in a particular continuous region.

Abstract: A method of producing a film is provided. The method involves a winding step including a point-of-interest detecting step including detecting a point-of-interest on the film, a number-of-turns counting step including counting the number of turns of the film wound around a winding core, and a number-of-turns storing step including storing, in association with the number of turns of the film wound around the winding core, a position of the point-of-interest in a direction of transfer of the film. The method eliminates the need for a step of printing on a film for the purpose of locating a point-of-interest on the film.