Patents by Inventor Koji Kashu

Koji Kashu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11132785
    Abstract: An image processing device for estimating the three-dimensional size of a foreign object is provided. The image processing device includes a storage section configured to store respective first pixel values of a plurality of pixels; a pixel value computing section configured to calculate the respective second pixel values of the plurality of pixels, the second pixel values being each a ratio of the difference between the first pixel value of the corresponding pixel and the background value of the corresponding pixel to the background value; and a pixel value integrating section configured to integrate respective second pixel values of a group of pixels belonging in a continuous region.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: September 28, 2021
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventor: Koji Kashu
  • Patent number: 11124379
    Abstract: A method of producing a film is provided. The method involves a winding step including a point-of-interest detecting step including detecting a point-of-interest on the film, a number-of-turns counting step including counting the number of turns of the film wound around a winding core, and a number-of-turns storing step including storing, in association with the number of turns of the film wound around the winding core, a position of the point-of-interest in a direction of transfer of the film. The method eliminates the need for a step of printing on a film for the purpose of locating a point-of-interest on the film.
    Type: Grant
    Filed: February 21, 2019
    Date of Patent: September 21, 2021
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventor: Koji Kashu
  • Patent number: 11017555
    Abstract: An image processing device capable of high-accuracy foreign object inspection is provided. The image processing device include a background value setting section configured to (i) obtain a value for use as a background value on a basis of a first pixel value of at least one reference pixel present in the vicinity of a target pixel and having a predetermined positional relationship with the target pixel, and (ii) set the background value of the target pixel to the value obtained.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: May 25, 2021
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventor: Koji Kashu
  • Patent number: 10964051
    Abstract: An image processing device and method for reducing the risk of a failure to detect a foreign object provided. The image processing device is configured for processing an image based on an X ray having propagated through an inspection target having a foreign object. The image processing device includes a storage section configured to store respective first pixel values of a plurality of pixels that form the image; a pixel value computing section configured to calculate respective second pixel values of the plurality of pixels on a basis of the first pixel values; and a pixel value integrating section configured to integrate respective second pixel values of a group of pixels belonging in a continuous region. The method includes steps of storing the respective first pixel values, calculating the respective second pixel values, and integrating respective second pixel values of a group of pixels belonging in a continuous region.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: March 30, 2021
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventor: Koji Kashu
  • Patent number: 10852254
    Abstract: A foreign object inspection device is provided. The device reduces the risk of a failure to detect a foreign object. A direction normal to a principal surface is inclined with respect to a direction in which an intensity of electromagnetic waves emitted from an electromagnetic wave generating source is greatest.
    Type: Grant
    Filed: March 29, 2019
    Date of Patent: December 1, 2020
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventor: Koji Kashu
  • Patent number: 10811652
    Abstract: To carry out accurate defect inspection over a wide area, a defect inspection device (1) includes: a radiation source section (2) configured to emit an electromagnetic wave (4) to a separator roll (10); and a sensor section (3) configured to detect the electromagnetic wave (4) that the radiation source section (2) has emitted to the separator roll (10), the sensor section (3) being configured to detect the electromagnetic wave (4) before and after the separator roll is moved relative to the radiation source section (2).
    Type: Grant
    Filed: November 29, 2017
    Date of Patent: October 20, 2020
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Yoshitaka Shinomiya, Koji Kashu, Yasuyuki Kondo
  • Patent number: 10732125
    Abstract: To inspect a separator roll for a defect inside the separator roll with use of only a small number of defect inspection devices, a defect inspection device (1) includes: a radiation source section (2) configured to emit an electromagnetic wave (4) to a separator roll (10); and a sensor section (3) configured to detect the electromagnetic wave (4) having passed through the separator roll (10).
    Type: Grant
    Filed: November 28, 2017
    Date of Patent: August 4, 2020
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Yoshitaka Shinomiya, Koji Kashu
  • Publication number: 20200227710
    Abstract: To carry out accurate defect inspection over a wide area, a defect inspection device includes: a radiation source section configured to emit an electromagnetic wave to a separator roll; and a sensor section configured to detect the electromagnetic wave that the radiation source section has emitted to the separator roll, the sensor section being configured to detect the electromagnetic wave before and after the separator roll is moved relative to the radiation source section.
    Type: Application
    Filed: March 31, 2020
    Publication date: July 16, 2020
    Inventors: Yoshitaka SHINOMIYA, Koji KASHU, Yasuyuki KONDO
  • Patent number: 10665838
    Abstract: To easily specify the position of a defect in a separator, a method for producing a separator original sheet (12b) includes the steps of: forming a separator original sheet (12b) including a separator original sheet (12c) and a heat-resistant layer coated on the separator original sheet (12c); detecting a defect (D) in the separator original sheet (12b); and recording information including information on a position of the defect (D) which position is a position in the width direction of the separator original sheet (12b).
    Type: Grant
    Filed: January 30, 2015
    Date of Patent: May 26, 2020
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Koichiro Watanabe, Tatsuya Kataoka, Koji Kashu
  • Patent number: 10634625
    Abstract: A transfer system includes a robot arm configured to hold a core, which is tubular, of at least one separator roll from a side of a first side surface of the at least one separator roll. The at least one separator roll includes the core and a separator, wound around an outer circumferential surface of the core. The robot arm is further configured to take out the at least one separator roll from a rack. A defect inspection device is configured to hold the core from a side of a second side surface of the at least one separator roll, receive the at least one separator roll from the robot arm, and inspect, for a defect, the at least one separator roll thus received.
    Type: Grant
    Filed: March 28, 2018
    Date of Patent: April 28, 2020
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Yoshitaka Shinomiya, Yasuyuki Kondo, Koji Kashu
  • Patent number: 10551329
    Abstract: The present invention makes it possible to check a target object highly accurately and quickly. Each of the electromagnetic wave reception regions includes m pieces of smaller regions which are arranged along a diameter of a circle in a plan view of a circular profile surface.
    Type: Grant
    Filed: September 4, 2018
    Date of Patent: February 4, 2020
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMTED
    Inventors: Koji Kashu, Daizaburo Yashiki
  • Patent number: 10539517
    Abstract: The present invention makes it possible to check a target object highly accurately and quickly. In a sensor having an electromagnetic wave reception region, suitability of portions for capturing an image of a subject which moves fast is heightened as a distance from a center increases in a plan view of a circular profile surface.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: January 21, 2020
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Koji Kashu, Yoshitaka Shinomiya, Daizaburo Yashiki
  • Publication number: 20190331614
    Abstract: An inspection system is provided to inspect an inspection target efficiently. The inspection system includes a second chamber separate from a first chamber in which a radiation source section is present. The second chamber is surrounded by a wall that blocks an electromagnetic wave that the radiation source section emits. A separator roll is stocked in the second chamber.
    Type: Application
    Filed: April 24, 2019
    Publication date: October 31, 2019
    Inventor: Koji KASHU
  • Publication number: 20190302035
    Abstract: A foreign object inspection device is provided. The device reduces the risk of a failure to detect a foreign object. A direction normal to a principal surface is inclined with respect to a direction in which an intensity of electromagnetic waves emitted from an electromagnetic wave generating source is greatest.
    Type: Application
    Filed: March 29, 2019
    Publication date: October 3, 2019
    Inventor: Koji KASHU
  • Publication number: 20190304126
    Abstract: An image processing device for reducing the risk of a failure to detect a foreign object is provided. The image processing device (4) is configured for processing an image based on an X ray having propagated through an inspection target (1) having a foreign object (13). The image processing device includes a storage section (41) configured to store respective first pixel values of a plurality of pixels that form the image; a pixel value computing section (42) configured to calculate respective second pixel values of the plurality of pixels on a basis of the first pixel values; and a pixel value integrating section (44) configured to integrate respective second pixel values of a group of pixels belonging in a continuous region.
    Type: Application
    Filed: March 29, 2019
    Publication date: October 3, 2019
    Inventor: Koji KASHU
  • Publication number: 20190304086
    Abstract: An image processing device for estimating the three-dimensional size of a foreign object is provided. The image processing device includes a storage section configured to store respective first pixel values of a plurality of pixels; a pixel value computing section configured to calculate the respective second pixel values of the plurality of pixels, the second pixel values being each a ratio of the difference between the first pixel value of the corresponding pixel and the background value of the corresponding pixel to the background value; and a pixel value integrating section configured to integrate respective second pixel values of a group of pixels belonging in a continuous region.
    Type: Application
    Filed: March 29, 2019
    Publication date: October 3, 2019
    Inventor: Koji KASHU
  • Publication number: 20190304127
    Abstract: A foreign object inspection device to increase the efficiency of inspection and reduce the risk of a failure to detect a foreign object is provided. The a foreign object inspection device includes: a moving mechanism configured to translate an inspection target; an image sensor in the form of a TDI sensor; a storage section; a pixel value computing section configured to calculate the respective second pixel values of a plurality of pixels on the basis of first pixel values; and a pixel value integrating section configured to integrate the respective second pixel values of a group of pixels belonging in a particular continuous region.
    Type: Application
    Filed: March 29, 2019
    Publication date: October 3, 2019
    Inventor: Koji KASHU
  • Publication number: 20190304125
    Abstract: An image processing device capable of high-accuracy foreign object inspection is provided. The image processing device include a background value setting section configured to (i) obtain a value for use as a background value on a basis of a first pixel value of at least one reference pixel present in the vicinity of a target pixel and having a predetermined positional relationship with the target pixel, and (ii) set the background value of the target pixel to the value obtained.
    Type: Application
    Filed: March 29, 2019
    Publication date: October 3, 2019
    Inventor: Koji KASHU
  • Publication number: 20190256316
    Abstract: A method of producing a film is provided. The method involves a winding step including a point-of-interest detecting step including detecting a point-of-interest on the film, a number-of-turns counting step including counting the number of turns of the film wound around a winding core, and a number-of-turns storing step including storing, in association with the number of turns of the film wound around the winding core, a position of the point-of-interest in a direction of transfer of the film. The method eliminates the need for a step of printing on a film for the purpose of locating a point-of-interest on the film.
    Type: Application
    Filed: February 21, 2019
    Publication date: August 22, 2019
    Inventor: Koji KASHU
  • Patent number: 10355256
    Abstract: A method of film production includes the steps of obtaining defect information including information on the position of a defect (D) in a separator original sheet (12b), slitting the separator original sheet (12b) to produce a plurality of separators (12a), and determining, on the basis of the defect information on a single defect (D), that a separator (12a) actually having the defect (D) and another separator (12a) adjacent to the above separator (12a) are defective.
    Type: Grant
    Filed: September 18, 2015
    Date of Patent: July 16, 2019
    Assignee: SUMITOMO CHEMICAL COMPANY, LIMITED
    Inventors: Koji Kashu, Yusuke Kon, Tatsuya Sakamoto, Jian Wang