Patents by Inventor Konosuke Oishi
Konosuke Oishi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 5793039Abstract: Disclosed is a structure comprising; (a) Plasma gas is supplied to torch tube 8 from inert pressure vessel 1. (b) Nebulizer 3 absorbs sample 4 to vaporize the sample as aerosol and to introduce it into plasma 5. (c) Plasma 5 touches sampling cone 10 having an opening at the apex and a conical surface, whereby an ion stream is extracted through the opening of the sampling cone whose pressure is reduced at the rear face thereof. (d) The extracted ion stream further touches skimmer cone 12 of the conical surface having a small hole at the apex, and is absorbed into vacuum chamber 13 where the pressure is further reduced at the rear face. (e) The ion stream is flowed into quadruple pole filter 18 to carry out the mass spectrometry analysis of the ion stream.Type: GrantFiled: February 22, 1996Date of Patent: August 11, 1998Assignee: Hitachi Ltd.Inventors: Konosuke Oishi, Masamichi Tsukada, Toyoharu Okumoto, Takashi Iino
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Patent number: 5763877Abstract: In an analyzer in which plasma is generated, a sample is supplied to the plasma though an aerosol guide tube and analyzed by a quadrapole mass filter, the top end portion of the aerosol guide tube is made of sapphire.Type: GrantFiled: September 18, 1996Date of Patent: June 9, 1998Assignee: Hitachi, Ltd.Inventors: Konosuke Oishi, Masamichi Tsukada, Toyoharu Okumoto, Takashi Iino
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Patent number: 5616918Abstract: A plasma ion mass spectrometer capable of improving detection accuracy in mass spectrometry by reducing background noise due to ultraviolet radiation and neutral particles, and a plasma ion mass spectrometry using the same. A sample is ionized with plasma in a plasma generating portion. The flow of the ionized sample is shielded by a shield plate after an elapse of a specified time, and ions of the sample accumulated before the shielding is held in an ion trap type mass spectrometric portion for a specified time. The ions of the sample held for the specified time are then subjected to mass spectrometry. During ions of the sample accumulated before the shielding are held, ultraviolet radiation mixed with the ions of the sample disappears, and thereby only ions of the sample can be subjected to mass spectrometry. As a result, background noise is reduced, to improve detection accuracy in mass spectrometry.Type: GrantFiled: October 5, 1995Date of Patent: April 1, 1997Assignee: Hitachi, Ltd.Inventors: Konosuke Oishi, Toyoharu Okumoto, Masamichi Tsukada, Takashi Iino
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Patent number: 5308977Abstract: A plasma mass spectrometer generates an aerosol of a sample, by dissolving the sample in a liquid solvent, and spraying the liquid into a spray chamber via a nebulizer. The solvent condenses in the spray chamber and an aerosol of the sample then passes through a supply tube to a plasma torch. Microwave power from an output on the plasma torch converts the aerosol to a plasma, and the plasma passes to an analyzer. If microwave radiation reached the spray chamber, it would cause heating of the solvent which may evaporate it so that the solvent would be present in the plasma. Therefore, there is a wall between the spray chamber and the plasma torch and microwave output which blocks such microwave radiation.Type: GrantFiled: March 2, 1993Date of Patent: May 3, 1994Assignee: Hitachi, LtdInventors: Konosuke Oishi, Masataka Koga, Hiromi Yamashita, Takashi Iino, Toyoharu Okumoto, Tsuyoshi Nishitarumizu
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Patent number: 5283624Abstract: Incident slits and exit slits are provided separately on corresponding optical axes incident simultaneously on a spectroscope from a sample atomizing unit. A mechanism for changing the widths of the respective incident slits and exiting slits is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.Type: GrantFiled: October 15, 1990Date of Patent: February 1, 1994Assignee: Hitachi, Ltd.Inventors: Masamichi Tsukada, Konosuke Oishi
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Patent number: 5148021Abstract: A mass spectrometer using a plasma ion source for analyzing an ultra-trace element includes a plasma generation system for generating a plasma including the composition of a sample, an ion beam formation system for extracting ions in the form of a beam from the plasma generating the ions, a mass spectrometry system for performing mass spectrometry of the ion beamn, and an ion detection system for detecting the ions subjected to the mass spectrometry, in which a lens system made up of a cylindrical first electrode, a cylindrical second electrode with a photon stopper disposed on the central axis thereof, and a cylindrical third electrode is further provided between the ion beam formation system and the mass spectrometry system.Type: GrantFiled: December 20, 1990Date of Patent: September 15, 1992Assignee: Hitachi, Ltd.Inventors: Yukio Okamoto, Satoshi Shimura, Konosuke Oishi, Masataka Koga, Makoto Yasuda, Takahashi Iino
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Patent number: 5108178Abstract: An atomic absorption spectrophotometer includes a sample-atomizing portion for ashing and atomizing a sample, a power source operable to supply electric current to the sample-atomizing portion, a controller for controlling the operation of the power source, a pair of pressure regulators for setting a flow rate of an inert gas according to an ashing step and an atomization step in the sample-atomizing portion, a pair of movable valves respectively provided downstream of and connected to the pair of pressure regulators, and a filter device provided between the pair of movable valves and the sample-atomizing portion. Either of the pair of movable valves is activated into open or closed condition in synchronism with the operation of the power source so as to select the flow rate of the inert gas into the sample-atomizing portion.Type: GrantFiled: March 29, 1990Date of Patent: April 28, 1992Assignee: Hitachi, Ltd.Inventors: Konosuke Oishi, Katsuhito Harada, Masamichi Tsukada, Kazuo Moriya, Toyoharu Okumoto
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Patent number: 5104220Abstract: An atomic absorption spectrophotometer comprising means for setting the ashing temperature for that of the element having the lowest ashing temperature; means for setting the atomizing temperature for that of the element having the highest atomizing temperature; and means for effecting background correction utilizing Zeeman effect.Type: GrantFiled: February 28, 1989Date of Patent: April 14, 1992Assignee: Hitachi, Ltd.Inventors: Toyoharu Okumoto, Katsuhito Harada, Konosuke Oishi
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Patent number: 4948250Abstract: In atomic absorption spectrophotometers such as Zeeman atomic absorption spectrophotometer, the present invention is characterized in that the correction timing of background absorption in sample light is made to coincide with that of reference light so as to improve the accuracy of the output signals of the spectrophotometer.Type: GrantFiled: June 18, 1984Date of Patent: August 14, 1990Assignee: Hitachi, Ltd.Inventors: Konosuke Oishi, Hideaki Koizumi, Masataka Koga
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Patent number: 4890919Abstract: An atomic absorption spectrophotometer is disclosed in which, in order to detect the temperature of a graphite cuvette correctly on the basis of the radiation emitted from the inner wall of the graphite cuvette, the above radiation and the measuring light emitted from a hollow cathode lamp are both taken out by the same optical members, and then the radiation is separated from the measuring light, to be detected and used for measuring the temperature of the graphite cuvette.Type: GrantFiled: January 4, 1988Date of Patent: January 2, 1990Assignee: Hitachi, Ltd.Inventors: Masamichi Tsukada, Konosuke Oishi, Katsuhito Harada, Toyoharu Okumoto
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Patent number: 4867562Abstract: An atomic absorption spectrophotometer for simultaneously measuring a plurality of elements different in kind from each other. A cylindrical heating furnace is provided for heating a sample being analyzed to dry, ash and atomize the sample thereby producing atomic vapor. A plurality of hollow-cathode discharge tubes corresponding in number to the elements being detected are arranged for simultaneously emitting light beams respectively containing line spectra of the respective elements, to cause the light beams to be incident upon the heating furnace at respective angles of inclination with respect to a central axis of the heating furnace. A plurality of spectral detection systems are arranged behind the heating furnace in relation to the angles of inclination, for respectively spectral-diffracting and receiving the light beams having their respective line spectra absorbed by the atomic vapor.Type: GrantFiled: May 20, 1988Date of Patent: September 19, 1989Assignee: Hitachi, Ltd.Inventors: Konosuke Oishi, Masamichi Tsukada, Masatoshi Kitagawa, Toyoharu Okumoto, Hayato Tobe
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Patent number: 4840484Abstract: In an atomic absorption spectrophotometer including an electric furnace for drying and ashing a liquid sample to be analyzed and then atomizing the sample to generate atomic vapor, a low-pressure lamp for emitting light having a spectrum of an element to be analyzed onto the atomic vapor atomized in the electric furnace, a monochromator for splitting the transmitted light from the electric furnace and selecting a wavelength of an atomic absorption line absorbed by the element to be analyzed, and a signal processing unit for performing signal processing on the light having the selected wavelength supplied from the monochromator, the electric furnace is an airtight mechanism for maintaining airtightness of the inside of the electric furnace and an evacuation unit for evacuating the inside of the electric furnace to a pressure equal to the pressure inside the lamp.Type: GrantFiled: March 30, 1988Date of Patent: June 20, 1989Assignee: Hitachi, Ltd.Inventors: Konosuke Oishi, Toyoharu Okumoto, Hayato Tobe, Masamichi Tsukada
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Patent number: 4728189Abstract: An absorption profile indicative of a relation in atomic absorption spectroscopy between the absorbance of a desired element and time has a constant half-width independent of the concentration of the desired element in a sample, and hence the half-width of absorption profile with respect to the desired element can be previously determined from data which is obtained by the measurement of a standard sample. In an atomic absorption spectrophotometer herein disclosed, the half-width of absorption profile is previously determined in the above-mentioned manner, and the true peak value of an absorption profile obtained by measuring a sample which contains the desired element at a high concentration, is calculated using the time width of this absorption profile at a predetermined absorbance and the previously-determined half-width.Type: GrantFiled: January 23, 1987Date of Patent: March 1, 1988Assignee: Hitachi, Ltd. Hitachi Instrument Eng.Inventors: Konosuke Oishi, Koichi Uchino, Hideo Yamada, Seigo Kamitake, Masao Hashimoto
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Patent number: 4645341Abstract: A double polarized light beam spectrophotometer of a light-source modulation type. A modulated light beam emitted by a light source is conducted through specimen atom vapor generated by a graphite atomizer. Wavelength of light undergone atom absorption is selected and spatially separated into a pair of linearly polarized light beams perpendicular to each other. The pair of the linearly polarized light beams separated are alternately passed through a chopper and received by a photoelectric conversion device to be converted into electric signals which are utilized for determining atomic absorption of the specimen. The phase of modulation of light radiated from the light source is synchronized with phase of a current supplied to the graphite atomizer for heating thereof and the switching timing of the chopper.Type: GrantFiled: April 27, 1984Date of Patent: February 24, 1987Assignee: Hitachi, Ltd.Inventors: Masataka Koga, Masatoshi Kitagawa, Konosuke Oishi
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Patent number: 4468121Abstract: A spectrophotometric analyzer disclosed by this invention has two monochromators capable of operating independently of each other. In each monochromator, a light beam from a light source is made to be incident on an entrance slit, and, after dispersed and wavelength scanned, issued from an exit slit as an analyzed light beam. These analyzed light beams are detected by detectors. The entrance slits and the exit slits of the two monochromators are disposed rotation symmetrically. This can simplify the operation of switching between a series mode where the analyzed light from the exit slit of the one monochromator is made to be incident on the entrance slit of the other monochromator and a parallel mode where the both monochromators operate for detection independently from each other.Type: GrantFiled: March 24, 1982Date of Patent: August 28, 1984Assignee: Hitachi, Ltd.Inventors: Hideaki Koizumi, Konosuke Oishi
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Patent number: 4198589Abstract: A spectral source comprises a lamp containing an anode and a cathode in an inert gas. The anode and cathode are different in shape and connected to a high-frequency power source to produce a high-frequency discharge between the anode and cathode to cause both sputtering of the cathode and excitation of a radiation having the spectrum according to the material sputtered from the cathode. The application of solely high-frequency power prevents adherence of the sputtered material to the interior walls of the lamp bulb thereby allowing a reduction of the dimensions of the lamp bulb, prolongating the life time of the lamp and increasing the stability and intensity of the radiation. A magnetic field may be applied to the radiation for Zeeman modulation. Due to the relatively small dimensions of the lamp bulb, relatively small and inexpensive magnets may be used.Type: GrantFiled: January 24, 1978Date of Patent: April 15, 1980Assignee: Hitachi, Ltd.Inventors: Shinji Mayama, Masataka Koga, Yoji Arai, Konosuke Oishi
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Patent number: 4100446Abstract: In a tubular bulb filled with inert gas, a cathode and an anode are disposed opposite to each other. Electric discharge is caused between the electrodes to emit optical radiation. The bulb has a smaller diameter at the portion thereof which surrounds the electrodes than at the other portion of the bulb, and a magnet to establish magnetic field to cause Zeeman effect in the direction of the electric field between the electrodes is disposed near the portion of the bulb having the smaller diameter.Type: GrantFiled: May 30, 1974Date of Patent: July 11, 1978Assignee: Hitachi, Ltd.Inventors: Katsuhito Harada, Hideaki Koizumi, Konosuke Oishi