Patents by Inventor Konrad Mack

Konrad Mack has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • METHOD AND DEVICE FOR CHARACTERIZING SILICON LAYER ON TRANSLUCENT SUBSTRATE
    Publication number: 20100253942
    Abstract: A method for the characterization of a silicon layer on a translucent substrate, in particular, for the characterization of a solar cell blank, includes detecting by at least one optical detector, the light transmitted through the silicon layer and/or reflected on the silicon layer. The method also includes determining a degree of absorption of the silicon layer for at least one wavelength by means of the detected light. The method further includes determining a quantity ratio between an amorphous fraction and a crystalline fraction of the silicon layer or between one of these fractions and the total of these fractions by means of the degree of absorption.
    Type: Application
    Filed: March 19, 2010
    Publication date: October 7, 2010
    Applicant: CARL ZEISS MICROIMAGING GMBH
    Inventors: Konrad Mack, Juergen Gobel, Joerg Wagner