Abstract: Device is described that reduces the forces needed to release a wafer from a wet polishing surface after polishing. Device comprises attachment adapted to be mounted to a polishing apparatus to permit attachment surface, configured to mate with two regions of the wafer, to tilt relative to the polishing surface. Means for defining adhesive force between attachment surface and one of the two wafer regions, and means for defining adhesive force between attachment surface and other of the two wafer regions which is different than that defined between attachment surface and the one wafer region so as to cause a non-parallel relationship between the one wafer face and polishing surface, are provided. Unbalanced force causes a non-parallel relationship between wafer and polishing pad and facilitates separation and lifting of wafer from polishing surface.

Abstract: Device and method are described that reduce the force needed to release a wafer from a wet polishing surface after polishing. Device comprises attachment, such as a wafer carrier, adapted to be mounted to a polishing apparatus to permit attachment surface, configured to mate with two regions of the wafer, to tilt relative to polishing surface. Means for defining adhesive force between attachment surface and one of the two wafer regions, and means for defining adhesive force between attachment surface and other of the two wafer regions which is different than that defined between attachment surface and the one wafer region so as to cause a non-parallel relationship between the one wafer face and polishing surface, are provided. Unbalanced force, such as a vacuum force communicated to a limited region of the surface of the carrier, causes a non-parallel relationship between wafer and polishing pad and facilitates separation and lifting of wafer from polishing surface.