Patents by Inventor Koorosh Zaerpoor

Koorosh Zaerpoor has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electrical energy-generating system and devices and methods related thereto
    Patent number: 7411337
    Abstract: An electrical energy-generating heat sink system provides a convenient and economical method for continuously recharging an energy storage device in electronic devices.
    Type: Grant
    Filed: June 30, 2004
    Date of Patent: August 12, 2008
    Assignee: Intel Corporation
    Inventors: Pooya Tadayon, Koorosh Zaerpoor
  • Ultra-short low-force vertical probe test head
    Patent number: 7394266
    Abstract: A playground play feature comprising a track having a glide board thereon, such that a user may run and jump onto the glide board and propel the board along the length of the track. The glide board further can comprise a rubber, or similar material, covered board having wheels, the wheels designed to fit within angled side rails, so that the glide board is held onto the track along the entire length of the track. The track further comprises shock absorbing end caps so as to more controllably stop the glide board as it nears the end of the track.
    Type: Grant
    Filed: February 16, 2005
    Date of Patent: July 1, 2008
    Assignee: Intel Corporation
    Inventor: Koorosh Zaerpoor
  • Ultra-short low-force vertical probe test head and method
    Patent number: 7132839
    Abstract: A method and apparatus for making a probe head that is very short (in the direction vertical) and exerts low force on the contacts of the circuit being tested, and on its own pins. The probe head is moved in the vertical direction to contact the IC being tested. Each pin is in sliding contact with an electrical contact on a space-transformer substrate, such as a post that slides within a sleeve. Each pin is also held in a diaphragm, such as an elastic membrane, in order to provide gentle force of the pin against the contact point of the circuit being tested. One or more walls or supports around each pin hold portions of the diaphragm in place so a deflection of one pin will not lift neighboring pins off their contacts.
    Type: Grant
    Filed: December 31, 2002
    Date of Patent: November 7, 2006
    Assignee: Intel Corporation
    Inventor: Koorosh Zaerpoor
  • Ultra-short low-force vertical probe test head and method
    Publication number: 20050146338
    Abstract: A method and apparatus for making a probe head that is very short (in the direction vertical) and exerts low force on the contacts of the circuit being tested, and on its own pins. The probe head is moved in the vertical direction to contact the IC being tested. Each pin is in sliding contact with an electrical contact on a space-transformer substrate, such as a post that slides within a sleeve. Each pin is also held in a diaphragm, such as an elastic membrane, in order to provide gentle force of the pin against the contact point of the circuit being tested. One or more walls or supports around each pin hold portions of the diaphragm in place so a deflection of one pin will not lift neighboring pins off their contacts.
    Type: Application
    Filed: February 16, 2005
    Publication date: July 7, 2005
    Inventor: Koorosh Zaerpoor
  • Electrical energy-generating heat sink system and method of using same to recharge an energy storage device
    Publication number: 20050029903
    Abstract: An electrical energy-generating heat sink system provides a convenient and economical method for continuously recharging an energy storage device in electronic devices.
    Type: Application
    Filed: June 30, 2004
    Publication date: February 10, 2005
    Inventors: Pooya Tadayon, Koorosh Zaerpoor
  • Ultra-short low-force vertical probe test head and method
    Publication number: 20040124861
    Abstract: A method and apparatus for making a probe head that is very short (in the direction vertical) and exerts low force on the contacts of the circuit being tested, and on its own pins. The probe head is moved in the vertical direction to contact the IC being tested. Each pin is in sliding contact with an electrical contact on a space-transformer substrate, such as a post that slides within a sleeve. Each pin is also held in a diaphragm, such as an elastic membrane, in order to provide gentle force of the pin against the contact point of the circuit being tested. One or more walls or supports around each pin hold portions of the diaphragm in place so a deflection of one pin will not lift neighboring pins off their contacts.
    Type: Application
    Filed: December 31, 2002
    Publication date: July 1, 2004
    Inventor: Koorosh Zaerpoor