Patents by Inventor Kouji Namura

Kouji Namura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7768699
    Abstract: A phase difference detecting device includes a splitter for splitting laser beams into a first group which will travel along a first path and a second group which will travel along a second path, a beam selection/extraction unit for selecting, as reference light, one beam from the first group to allow it to pass therethrough, a path length changing unit for changing the length of the first path, a combining unit for combining the reference light and beams which construct the second group to produce interference light, and a detector for detecting the intensity of the interference light. The device changes the length of the first path using the path length changing unit to detect a path length which maximizes the intensity of the interference light for each of the beams which construct the second group, and determines a phase difference among the beams from the detected path length.
    Type: Grant
    Filed: August 20, 2004
    Date of Patent: August 3, 2010
    Assignee: Mitsubishi Electric Corporation
    Inventors: Jiro Suzuki, Yoshihito Hirano, Yutaka Ezaki, Yasushi Horiuchi, Masaki Tabata, Kouji Namura, Izumi Mikami
  • Publication number: 20080304139
    Abstract: A phase difference detecting device includes a splitter for splitting laser beams into a first group which will travel along a first path and a second group which will travel along a second path, a beam selection/extraction unit for selecting, as reference light, one beam from the first group to allow it to pass therethrough, a path length changing unit for changing the length of the first path, a combining unit for combining the reference light and beams which construct the second group to produce interference light, and a detector for detecting the intensity of the interference light. The device changes the length of the first path using the path length changing unit to detect a path length which maximizes the intensity of the interference light for each of the beams which construct the second group, and determines a phase difference among the beams from the detected path length.
    Type: Application
    Filed: August 20, 2004
    Publication date: December 11, 2008
    Inventors: Jiro Suzuki, Yoshihito Hirano, Yutaka Ezaki, Yasushi Horiuchi, Masaki Tabata, Kouji Namura, Izumi Mikami
  • Publication number: 20080123105
    Abstract: A grating alignment device performs alignment of two or more plane gratings so as to eliminate an angular misalignment and a phase misalignment which are caused between respective diffracted light beams generated when incident light is diffracted by the plane gratings. Specifically, alignment is performed by appropriately adjusting an angle A, an angle B, an angle C, a coordinate Z, and a coordinate X of the second plane grating so as to eliminate at least one of the angular misalignment and the phase misalignment which are caused between the respective diffracted light beams generated when incident light is diffracted by the first plane grating and the second plane grating.
    Type: Application
    Filed: January 17, 2005
    Publication date: May 29, 2008
    Inventors: Kouji Seki, Jiro Suzuki, Yoshihito Hirano, Yutaka Ezaki, Yasushi Horiuchi, Masaki Tabata, Kouji Namura, Izumi Mikami