Abstract: A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.

Abstract: A magnetic sensor includes a plurality of magnetoresistive element units. Each of the magnetoresistive element units includes a flat-surface-type first magnetoresistive element having a detection axis in a first direction and a flat-surface-type second magnetoresistive element having a detection axis in a second direction different from the first direction. The first magnetoresistive element and the second magnetoresistive element are arranged so as to face each other. The plurality of magnetoresistive element units are arrayed in a direction orthogonal to flat surfaces of the first magnetoresistive element and the second magnetoresistive element. The surfaces facing a measurement sample constitute a surface parallel to the direction in which the magnetoresistive element units are arrayed.

Abstract: A magnetic sensor includes a plurality of magnetoresistive element units. Each of the magnetoresistive element units includes a flat-surface-type first magnetoresistive element having a detection axis in a first direction and a flat-surface-type second magnetoresistive element having a detection axis in a second direction different from the first direction. The first magnetoresistive element and the second magnetoresistive element are arranged so as to face each other. The plurality of magnetoresistive element units are arrayed in a direction orthogonal to flat surfaces of the first magnetoresistive element and the second magnetoresistive element. The surfaces facing a measurement sample constitute a surface parallel to the direction in which the magnetoresistive element units are arrayed.

Abstract: A non-destructive inspection method of inspecting an inspection target using multiple different types of non-destructive inspection means that include one non-destructive inspection means and at least one other non-destructive inspection means. The method includes determining a marking position on the inspection target in a detection result by the one non-destructive inspection means, causing a device to store the marking position, and fixedly forming a mark on the inspection target corresponding to the marking position. The mark is detectable by the other non-destructive inspection means. The method further includes causing the other non-destructive inspection means to inspect an inspection target including the mark. The method further includes contrasting detection results by the multiple different types of non-destructive inspection means in reference to the mark which is the marking position.

Abstract: Provided is a production method for a magnetoresistive element including treating a stacked layer into a predetermined shape. The stacked layer includes a magnetoresistive layer whose resistance changes depending on a magnetic field and a cap layer above the magnetoresistive layer and having a thickness in a range of 10 nm to 60 nm. The method further includes covering and protecting the stacked layer with an insulating layer, forming an opening in the insulating layer by reactive etching and exposing a surface of the cap layer at the opening, etching the cap layer in a range less than a total thickness of the cap layer by ion milling of the surface, and depositing an upper layer to be a part of the magnetoresistive element. The upper layer is in contact with the surface of the cap layer after the etching.

Abstract: A method for producing a tunnel magnetoresistive element includes a stacking step, then in-magnetic field heating, and then dry etching. The stacking includes stacking a B absorption layer which is in contact with an upper surface of a CoFeB layer. The dry etching includes removal of layers to the B absorption layer. An end of etching is set as an end point time detected by an analysis device when a final layer before the B absorption layer directly above the CoFeB layer is exposed has reduced to a prescribed level, or when the B absorption layer directly above the CoFeB layer has increased to the prescribed level. An amount of over-etching after the end point time is specified in advance, and the B absorption layer is stacked such that the thickness from the prescribed level to the upper surface of the CoFeB layer corresponds to the over-etching amount.

Abstract: A non-destructive inspection method for inspecting an object to be inspected using a plurality of different types of non-destructive inspection means is shown. The method includes the following, fixedly forming common marks that can be detected by any of the plurality of non-destructive inspection means on the object to be inspected; then detecting the object to be inspected including the marks by the plurality of non-destructive inspection means respectively; and comparing the detection results by the plurality of non-destructive inspection means using the marks as positional references.

Abstract: Provided is an electroluminescent device that emits light of a single color and includes a plurality of functional layers, in which an absorption peak is included in the emission wavelength and at least one absorption peak is included in a complementary color region of an emission wavelength in the range of 380 nm to 780 nm, an absolute value of a deviation (?uv) of a color coordinate of front reflected light at the time of white color illumination from a blackbody locus is below 0.02, and a refractive index and a film thickness of each of the plurality of functional layers are determined to satisfy the formula D(?)?D(0)cos ? (0????D?60 degrees) when an angle dependence of emission intensity is defined as D(?).

Abstract: A method for producing a tunnel magnetoresistive element includes a stacking step, then in-magnetic field heating, and then dry etching. The stacking includes stacking a B absorption layer which is in contact with an upper surface of a CoFeB layer. The dry etching includes removal of layers to the B absorption layer. An end of etching is set as an end point time detected by an analysis device when a final layer before the B absorption layer directly above the CoFeB layer is exposed has reduced to a prescribed level, or when the B absorption layer directly above the CoFeB layer has increased to the prescribed level. An amount of over-etching after the end point time is specified in advance, and the B absorption layer is stacked such that the thickness from the prescribed level to the upper surface of the CoFeB layer corresponds to the over-etching amount.

Abstract: Provided is a production method for a magnetoresistive element including treating a stacked layer into a predetermined shape. The stacked layer includes a magnetoresistive layer whose resistance changes depending on a magnetic field and a cap layer above the magnetoresistive layer and having a thickness in a range of 10 nm to 60 nm. The method further includes covering and protecting the stacked layer with an insulating layer, forming an opening in the insulating layer by reactive etching and exposing a surface of the cap layer at the opening, etching the cap layer in a range less than a total thickness of the cap layer by ion milling of the surface, and depositing an upper layer to be a part of the magnetoresistive element. The upper layer is in contact with the surface of the cap layer after the etching.

Abstract: Provided is an organic electro-luminescence emission device wherein a color adjustment layer causes the chroma C* of transmitted light from the organic electro-luminescence emission device when not emitting light to be less than that of transmitted light from an organic electro-luminescence emission device not having a color adjustment layer when not emitting light, thus allowing the chroma of the transmitted light at non-emitting time to approach 0.

Abstract: Provided is an electroluminescent device that emits light of a single color and includes a plurality of functional layers, in which an absorption peak is included in the emission wavelength and at least one absorption peak is included in a complementary color region of an emission wavelength in the range of 380 nm to 780 nm, an absolute value of a deviation (?uv) of a color coordinate of front reflected light at the time of white color illumination from a blackbody locus is below 0.02, and a refractive index and a film thickness of each of the plurality of functional layers are determined to satisfy the formula D(?)?D(0)cos ? (0????D?60 degrees) when an angle dependence of emission intensity is defined as D(?).

Abstract: A method of designing an electroluminescent device includes preparing a reference device including a construction of an electroluminescent device and a desired analyzed device including a construction of an electroluminescent device, performing quantum optical analysis, electromagnetic field analysis, and ray trace with thicknesses and complex relative permittivities of a first transparent member, a first electrode, a first functional layer, a second functional layer, an emissive layer, and a second electrode as well as a position of a light-emitting point in the emissive layer and a distribution of light-emitting points in the emissive layer being used as design variables, calculating a “ratio of light extraction efficiency” between the reference device and the analyzed device by computing efficiency of light extraction from the emissive layer into the transparent member or air in both of the reference device and the analyzed device, finding relation of the thickness and the complex relative permittivity of

Abstract: A surface-emitting unit includes a surface-emitting panel which emits light, a transmissive member which is arranged to face a light-emitting surface, propagates light emitted from the surface-emitting panel as being reflected therein, and allows light to exit from a light exit surface, and a scattering sheet which is provided to face a light exit surface of the transmissive member and scatters light. The transmissive member has a dimming surface provided between a light incident surface on which light emitted from the surface-emitting panel is incident and the light exit surface. The light-emitting surface has a light-emitting region which emits light and a non-light-emitting region which does not emit light. The dimming surface is configured such that a region facing the non-light-emitting region is different in transmittance of light from a region facing the light-emitting region, in accordance with a distribution of light emitted from each of the surface-emitting panels.

Abstract: A method of designing an electroluminescent device includes preparing a reference device including a construction of an electroluminescent device and a desired analyzed device including a construction of an electroluminescent device, performing quantum optical analysis, electromagnetic field analysis, and ray trace with thicknesses and complex relative permittivities of a first transparent member, a first electrode, a first functional layer, a second functional layer, an emissive layer, and a second electrode as well as a position of a light-emitting point in the emissive layer and a distribution of light-emitting points in the emissive layer being used as design variables, calculating a “ratio of light extraction efficiency” between the reference device and the analyzed device by computing efficiency of light extraction from the emissive layer into the transparent member or air in both of the reference device and the analyzed device, finding relation of the thickness and the complex relative permittivity of

Abstract: A method of designing an electroluminescent device allows more accurate computation of an external emission spectrum output to the outside in a current injection state and accurate estimate of a quantity and/or a color of light extracted to the outside, an electroluminescent device manufactured with the design method, and a method of manufacturing an electroluminescent device with the design method.

Abstract: A planar light-emitting unit includes a light emission region and a non-light emission region located in an outer periphery of the light emission region. A non-space region is provided between a light guide member and a diffusion member in a region corresponding to the non-light emission region such that a space is formed in a region corresponding to the light emission region between the light guide member and the diffusion member. The non-space region includes a protruding region extending to the light emission region from the non-light emission region, and a conditional expression 0<??2d×tan ? is fulfilled, where ? is a protruding amount (mm) from the non-light emission region of the non-space region, d is a thickness (mm) of the light guide member, and ? is a total reflection critical angle between the light guide member and air.

Abstract: A surface light emitting element includes a light emitting layer that emits light, a first electrode layer that is provided on the side of the light emitting layer from which the light is extracted and allows the light that has been emitted by the light emitting layer to pass through, a second electrode layer that is provided on the side of the light emitting layer from which light is not extracted, a light scattering layer that is provided on the side of the first electrode layer opposite to the side on which the light emitting layer is positioned, and a transparent substrate that is provided on the side of the light scattering layer opposite to the side on which the light emitting layer is positioned, wherein a conductive material in which the real part of a complex dielectric constant is negative is used in the first electrode layer.

Abstract: A method of designing an electroluminescent device allows more accurate computation of an external emission spectrum output to the outside in a current injection state and accurate estimate of a quantity and/or a color of light extracted to the outside, an electroluminescent device manufactured with the design method, and a method of manufacturing an electroluminescent device with the design method.

Abstract: A planar light-emitting unit includes a light emission region and a non-light emission region located in an outer periphery of the light emission region. A non-space region is provided between a light guide member and a diffusion member in a region corresponding to the non-light emission region such that a space is formed in a region corresponding to the light emission region between the light guide member and the diffusion member. The non-space region includes a protruding region extending to the light emission region from the non-light emission region, and a conditional expression 0<??2d×tan? is fulfilled, where ? is a protruding amount (mm) from the non-light emission region of the non-space region, d is a thickness (mm) of the light guide member, and ? is a total reflection critical angle between the light guide member and air.