Patents by Inventor Koumei Nagai

Koumei Nagai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5352897
    Abstract: A soft X-ray detector includes a surface electrode layer, a photoelectric conversion layer, and a semiconductor detector having an electrode connected to the photoelectric conversion layer, for detecting an electric charge produced In the photoelectric conversion layer. The photoelectric conversion layer and the surface electrode layer have thicknesses satisfying conditionsdA.gtoreq.0.183.lambda./KAdB.ltoreq.0.183.lambda./KBwhere dA is a thickness of the photoelectric conversion layer, dB is a thickness of the surface electrode layer, KA is an extinction coefficient of radiation of a wavelength .lambda. in a substance constituting the photoelectric conversion layer, and KB is an extinction coefficient of radiation of the wavelength .lambda.in a substance constituting the surface electrode layer. Thus, the soft X-ray detector has a high sensitivity to soft X rays and a lower sensitivity to visible light, so that only soft X rays can be selectively detected.
    Type: Grant
    Filed: March 15, 1993
    Date of Patent: October 4, 1994
    Assignee: Olympus Optical Co., Ltd.
    Inventors: Yoshiaki Horikawa, Yoshinori Iketaki, Shoichiro Mochimaru, Koumei Nagai