Patents by Inventor Kousuke Nakayama

Kousuke Nakayama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230343949
    Abstract: A cathode-active material for a proton-conducting secondary battery, the cathode-active material being for use in a proton-conducting secondary battery, the cathode-active material comprising a compound that is a solid solution that has a composition containing Mn.
    Type: Application
    Filed: June 28, 2023
    Publication date: October 26, 2023
    Applicant: KAWASAKI MOTORS, LTD.
    Inventors: Kwohsiung YOUNG, Kousuke NAKAYAMA, Chiaki MATSUDA
  • Publication number: 20230075768
    Abstract: There are provided a drive control device, a drive control method, and a non-transitory computer readable storage medium storing a program that control driving of an electric vehicle includes: a map storage unit storing a plurality of battery correlation maps, the battery correlation maps corresponding to a plurality of battery deterioration states and defining a relationship of a charge state and a battery temperature with an internal resistance of a battery; a map selection unit configured to select one battery correlation map from among the plurality of battery correlation maps stored in the map storage unit based on a current deterioration state of the battery; and a motor output control unit configured to control an output of a vehicular electric motor driven by the battery based on the one battery correlation map selected by the map selection unit.
    Type: Application
    Filed: September 6, 2022
    Publication date: March 9, 2023
    Inventors: Eisaku KITAGAWA, Kousuke NAKAYAMA, Ryohei YOSHIDA
  • Patent number: 10249034
    Abstract: A method of adjusting a sensitivity parameter value for substrate defect inspection used in a substrate defect inspection apparatus compares, for each pixel value of a selected virtual inspection substrate, using reference pixel data to be used after adjustment, the deviation amount from an allowable range corresponding to the position thereof and the sensitivity parameter value before the adjustment when each pixel value is deviated from the allowable range, and updates the deviation amount as a new sensitivity parameter value when the deviation amount exceeds the sensitivity parameter value and a difference between the deviation amount and the sensitivity parameter value is equal to or less than a threshold value.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: April 2, 2019
    Assignee: Tokyo Electron Limited
    Inventors: Yasuhiro Kitada, Izumi Hasegawa, Hiroshi Tomita, Kousuke Nakayama, Tadashi Nishiyama
  • Publication number: 20180005370
    Abstract: A method of adjusting a sensitivity parameter value for substrate defect inspection used in a substrate defect inspection apparatus compares, for each pixel value of a selected virtual inspection substrate, using reference pixel data to be used after adjustment, the deviation amount from an allowable range corresponding to the position thereof and the sensitivity parameter value before the adjustment when each pixel value is deviated from the allowable range, and updates the deviation amount as a new sensitivity parameter value when the deviation amount exceeds the sensitivity parameter value and a difference between the deviation amount and the sensitivity parameter value is equal to or less than a threshold value.
    Type: Application
    Filed: June 27, 2017
    Publication date: January 4, 2018
    Inventors: Yasuhiro Kitada, Izumi Hasegawa, Hiroshi Tomita, Kousuke Nakayama, Tadashi Nishiyama