Abstract: There is provided a semiconductor integrated circuit in which a ring oscillator is formed by a variable delay circuit to cause the ring oscillator to oscillate (S2) at the test operation of the variable delay circuit and it is determined whether the variable delay circuit is normal or abnormal depending on whether the ring oscillator satisfies a predetermined monotonic increase condition (S6) and a predetermined linearity condition (S7).

Abstract: There is provided a semiconductor integrated circuit in which a ring oscillator is formed by a variable delay circuit to cause the ring oscillator to oscillate (S2) at the test operation of the variable delay circuit and it is determined whether the variable delay circuit is normal or abnormal depending on whether the ring oscillator satisfies a predetermined monotonic increase condition (S6) and a predetermined linearity condition (S7).

Abstract: There is provided a semiconductor integrated circuit in which a ring oscillator is formed by a variable delay circuit to cause the ring oscillator to oscillate (S2) at the test operation of the variable delay circuit and it is determined whether the variable delay circuit is normal or abnormal depending on whether the ring oscillator satisfies a predetermined monotonic increase condition (S6) and a predetermined linearity condition (S7).

Abstract: A semiconductor apparatus including built-in power supply circuits capable of supplying a large current with high voltage accuracy. The semiconductor apparatus includes a semiconductor chip including a circuit area and power supply circuits, coils and capacitors. The semiconductor chip, coils and capacitors are provided in a package. Each power supply circuit, a coil and a capacitor compose a switching regulator. The semiconductor chip and the package are connected such that a power supply voltage which will be produced by the switching regulator is supplied to the circuit area. The power supply circuit is supplied with a power supply voltage from the outside of the semiconductor apparatus.

Abstract: An electric current flowing to an upper side power MOSFET during soft-start is detected according to an on-voltage of the MOSFET and an on-pulse width of a PWM pulse for driving the upper side power MOSFET is forced to be reset in the idle and decided according to a signal generated when the voltage falls below a predetermined specified voltage.

Abstract: An over-current detection circuit using the ON-voltage of a main MOSFET is provided, which is resistant to process variations of a main MOSFET and is not easily influenced by switching noise. Separately from a main MOSFET (Q1), a sense MOSFET (Q3) whose size is 1/m of the main MOSFET is provided and it is caused to be normally on. A DC ON-voltage generated when a current that is 1/m of an over-current value is caused to flow through the sense MOSFET is obtained as a reference voltage for over-current setting. The ON-voltage when the main MOSFET is on is sampled and held, and it is obtained as a DC voltage. These DC voltages are compared in a comparator (COMP).

Abstract: A semiconductor apparatus including built-in power supply circuits capable of supplying a large current with high voltage accuracy. The semiconductor apparatus includes a semiconductor chip including a circuit area and power supply circuits, coils and capacitors. The semiconductor chip, coils and capacitors are provided in a package. Each power supply circuit, a coil and a capacitor compose a switching regulator. The semiconductor chip and the package are connected such that a power supply voltage which will be produced by the switching regulator is supplied to the circuit area. The power supply circuit is supplied with a power supply voltage from the outside of the semiconductor apparatus.

Abstract: An over-current detection circuit using the ON-voltage of a main MOSFET is provided, which is resistant to process variations of a main MOSFET and is not easily influenced by switching noise. Separately from a main MOSFET (Q1), a sense MOSFET (Q3) whose size is 1/m of the main MOSFET is provided and it is caused to be normally on. A DC ON-voltage generated when a current that is 1/m of an over-current value is caused to flow through the sense MOSFET is obtained as a reference voltage for over-current setting. The ON-voltage when the main MOSFET is on is sampled and held, and it is obtained as a DC voltage. These DC voltages are compared in a comparator (COMP).

Abstract: In a semiconductor integrated circuit device that includes macro cells (circuit blocks that can be designed independently) such as a storage circuit and operates synchronously with an external clock, total delay time from signal input to output is reduced and the speed of operation is increased. In the semiconductor integrated circuit device which has plural circuit blocks coupled in series for signal transmission and whose whole operation is controlled by a clock signal, the semiconductor integrated circuit device including first circuit blocks that receive input signals in response to a first timing signal based on a clock signal, and a second circuit block that forms output signals in response to a second timing signal based on the clock signal, a time difference between the first timing signal and the second timing signal is set to a non-integral multiple of the cycle of the clock signal.

Abstract: An information processing system having an original clock oscillator for delivering at least one original clock signal K defined as a first clock signal and a plurality of information processing units supplied with the original clock signal K, wherein each information processing unit comprises clock generating means for generating at least one second clock signal K1 which is phase-locked with the original clock signal K and which has a predetermined duty cycle and a logic device whose operation timing is controlled by the second clock signal K1 and the operation timing of an interface provided between at least one pair of logic devices is synchronously controlled by the clock signal K1.

Abstract: The present invention provides a semiconductor integrated circuit device equipped with at least one pulse generator which generates a pulse of a pulse with shorter than a rising time up to the full amplitude of a transfer signal. A first signal and a second signal supplied from outside through a first signal path and a second signal path are respectively transferred to the pulse generator. When a rising time up to the full amplitude at any one of buffers in the first signal path and the second signal path is longer than a pulse width of a pulse to be formed by the pulse generator, the difference in phase between the first signal and the second signal is caused to correspond to a pulse width of a first pulse.

Abstract: A phase locked loop (PLL) circuit is provided to operate in a broad band, including two separate loops one of which is for feed-back of an output from an oscillator to the same oscillator through its associative proportional control unit and the other of which is for feed-back of an output of an oscillator to the same oscillator via an integral control unit. The proportional control unit is arranged to control an output frequency of the oscillator and is operable to generate a control signal based on a difference between input and output signals. The integral control unit is arranged to control the phase of an output signal of the oscillator to thereby generate a control signal based on a phase difference between input and output signals.

Abstract: In a semiconductor integrated circuit device that includes macro cells (circuit blocks that can be designed independently) such as a storage circuit and operates synchronously with an external clock, total delay time from signal input to output is reduced and the speed of operation is increased. In the semiconductor integrated circuit device which has plural circuit blocks coupled in series for signal transmission and whose whole operation is controlled by a clock signal, the semiconductor integrated circuit device including first circuit blocks that receive input signals in response to a first timing signal based on a clock signal, and a second circuit block that forms output signals in response to a second timing signal based on the clock signal, a time difference between the first timing signal and the second timing signal is set to a non-integral multiple of the cycle of the clock signal.

Abstract: The present invention provides a semiconductor integrated circuit device equipped with at least one pulse generator which generates a pulse of a pulse with shorter than a rising time up to the full amplitude of a transfer signal.

Abstract: An information processing system having an original clock oscillator for delivering at least one original clock signal K defined as a first clock signal and a plurality of information processing units supplied with the original clock signal K, wherein each information processing unit comprises clock generating means for generating at least one second clock signal K1 which is phase-locked with the original clock signal K and which has a predetermined duty cycle and a logic device whose operation timing is controlled by the second clock signal K1 and the operation timing of an interface provided between at least one pair of logic devices is synchronously controlled by the clock signal K1.

Abstract: In a semiconductor integrated circuit device that includes macro cells (circuit blocks that can be designed independently) such as a storage circuit and operates synchronously with an external clock, total delay time from signal input to output is reduced and the speed of operation is increased. In the semiconductor integrated circuit device which has plural circuit blocks coupled in series for signal transmission and whose whole operation is controlled by a clock signal, the semiconductor integrated circuit device including first circuit blocks that receive input signals in response to a first timing signal based on a clock signal, and a second circuit block that forms output signals in response to a second timing signal based on the clock signal, a time difference between the first timing signal and the second timing signal is set to a non-integral multiple of the cycle of the clock signal.

Abstract: An information processing system having an original clock oscillator for delivering at least one original clock signal K defined as a first clock signal and a plurality of information processing units supplied with the original clock signal K, wherein each information processing unit comprises clock generating means for generating at least one second clock signal K1 which is phase-locked with the original clock signal K and which has a predetermined duty cycle and a logic device whose operation timing is controlled by the second clock signal K1, And the operation timing of an interface provided between at least one pair oflogic devices is synchronously controlled by the clock signal K1.

Abstract: In a semiconductor integrated circuit device that includes macro cells (circuit blocks that can be designed independently) such as a storage circuit and operates synchronously with an external clock, total delay time from signal input to output is reduced and the speed of operation is increased. In the semiconductor integrated circuit device which has plural circuit blocks coupled in series for signal transmission and whose whole operation is controlled by a clock signal, the semiconductor integrated circuit device including first circuit blocks that receive input signals in response to a first timing signal based on a clock signal, and a second circuit block that forms output signals in response to a second timing signal based on the clock signal, a time difference between the first timing signal and the second timing signal is set to a non-integral multiple of the cycle of the clock signal.

Abstract: An information processing system having an original clock oscillator for delivering at least one original clock signal K defined as a first clock signal and a plurality of information processing units supplied with the original clock signal K, wherein each information processing unit comprises clock generating means for generating at least one second clock signal K1 which is phase-locked with the original clock signal K and which has a predetermined duty cycle and a logic device whose operation timing is controlled by the second clock signal K1. and the operation timing of an interface provided between at least one pair of logic devices is synchronously controlled by the clock signal K1.

Abstract: A PLL circuit includes a phase comparator which makes a comparison between an internal clock signal and a clock signal supplied from an external terminal, a charge pump circuit which produces a charging-up or discharging current in accordance with the output of the phase comparator, so as to drive a filter capacitor, a voltage-controlled oscillator the oscillation frequency of which is controlled by the held voltage of the filter capacitor, and a frequency divider circuit which generates the internal clock signal on the basis of the oscillation output of the voltage-controlled oscillator. The PLL circuit is additionally provided with a voltage detector circuit which detects that the held voltage of the filter capacitor has been raised to a predetermined voltage or higher, and the function of forcedly lowering the held voltage of the filter capacitor down to a predetermined potential in accordance with the detection output of the voltage detector circuit.