Abstract: A microscope routes excitation light through a first set of optical components so the excitation light is projected into a sample and forms a sheet of excitation light at an oblique angle. The position of the sheet varies depending on an orientation of the scanning element. The first set of optical components routes detection light back to the scanning element, which routes the detection light into a second set of optical components. The second set of optical components forms an intermediate image plane that is imaged onto a detector. In some embodiments, a folding mirror is disposed between the first and second sets of optical components. In some embodiments, an optically transparent spacer covers the first objective and is configured to press against tissue being imaged. This spacer sets the working distance for the first objective to capture a particular range of depths within the tissue.

Abstract: In some embodiments, a SCAPE system routes light from a tilted intermediate image plane to an infinity space disposed behind a third objective. A first beam splitter positioned in the infinity space routes light from the intermediate image plane with different wavelengths in different directions. First and second light detector arrays capture first and second wavelength images, respectively, and optical components route light having the first and second wavelength towards the first and second light detectors, respectively. In some embodiments, a SCAPE system is used to capture a plurality of images while a sample is perturbed (e.g., vibrated, deformed, pushed, pulled, stretched, or squeezed) in order to visualize the impact of the perturbation on the sample.

Abstract: In a first invention, a SCAPE system routes light from a tilted intermediate image plane (170) to an infinity space disposed behind a third objective (180). A first dichroic beam splitter (52) positioned in the infinity space routes light from the intermediate image plane with different wavelengths in different directions. First and second light detector arrays (90) capture first and second wavelength images, respectively, and optical components (54,56,58,82) route light having the first and second wavelengths towards the first and second light detectors, respectively. In a second invention, a SCAPE system is used to capture a plurality of images while a sample is perturbed (e.g., vibrated, deformed, pushed, pulled, stretched, or squeezed) in order to visualize the impact of the perturbation on the sample.

Abstract: In some embodiments, a SCAPE system routes light from a tilted intermediate image plane to an infinity space disposed behind a third objective. A first beam splitter positioned in the infinity space routes light from the intermediate image plane with different wavelengths in different directions. First and second light detector arrays capture first and second wavelength images, respectively, and optical components route light having the first and second wavelength towards the first and second light detectors, respectively. In some embodiments, a SCAPE system is used to capture a plurality of images while a sample is perturbed (e.g., vibrated, deformed, pushed, pulled, stretched, or squeezed) in order to visualize the impact of the perturbation on the sample.

Abstract: In a first invention, a SCAPE system routes light from a tilted intermediate image plane (170) to an infinity space disposed behind a third objective (180). A first dichroic beam splitter (52) positioned in the infinity space routes light from the intermediate image plane with different wavelengths in different directions. First and second light detector arrays (90) capture first and second wavelength images, respectively, and optical components (54,56,58,82) route light having the first and second wavelengths towards the first and second light detectors, respectively. In a second invention, a SCAPE system is used to capture a plurality of images while a sample is perturbed (e.g., vibrated, deformed, pushed, pulled, stretched, or squeezed) in order to visualize the impact of the perturbation on the sample.