Patents by Inventor Kris Kaufman

Kris Kaufman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9488529
    Abstract: A temperature measurement system is disclosed. In accordance with some embodiments of the present disclosure, a temperature measurement system may comprise a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal based on a resistance, an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal, and a calculation stage communicatively coupled to an ADC output and configured to determine a first digital value based on the first digital signal, determine a second digital value based on the second digital signal, calculate a resistance ratio based on the first digital value and the second digital value, and determine a temperature output value based on the resistance ratio.
    Type: Grant
    Filed: May 29, 2013
    Date of Patent: November 8, 2016
    Assignee: Intel IP Corporation
    Inventors: Merit Hong, David Harnishfeger, Kris Kaufman
  • Patent number: 9470585
    Abstract: In accordance with some embodiments of the present disclosure, a calibrated temperature measurement system comprises a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal based on a resistance, and an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal. A memory may comprise resistor-characterization information. A calculation stage communicatively coupled to an ADC output may be configured to determine a first digital value based on the first digital signal, determine a second digital value based on the second digital signal, calculate a resistance ratio based on the first digital value and the second digital value, and determine a temperature output value based on the resistance ratio and the resistor-characterization information.
    Type: Grant
    Filed: May 29, 2013
    Date of Patent: October 18, 2016
    Assignee: Intel IP Corporation
    Inventors: Merit Hong, David Harnishfeger, Kris Kaufman
  • Patent number: 9322719
    Abstract: A temperature-measurement input stage may include a resistor, a thermistor, a first multiplexor, an amplifier, a second multiplexor, and an output stage. The first multiplexor may be configured to couple the resistor to a first amplifier input during a first multiplexor state, and couple the thermistor to the first amplifier input during a second multiplexor state. The amplifier may comprise the first amplifier input, a second amplifier input coupled to a voltage reference, and an amplifier output coupled to a feedback path. The second multiplexor may be configured to route a feedback current to the resistor during the first multiplexor state and route the feedback current to the thermistor during the second multiplexor state. The output stage may be configured to provide an output current based on the feedback current.
    Type: Grant
    Filed: May 29, 2013
    Date of Patent: April 26, 2016
    Assignee: Intel IP Corporation
    Inventors: Merit Hong, David Harnishfeger, Kris Kaufman
  • Publication number: 20140355651
    Abstract: In accordance with some embodiments of the present disclosure, a calibrated temperature measurement system comprises a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal based on a resistance, and an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal. A memory may comprise resistor-characterization information. A calculation stage communicatively coupled to an ADC output may be configured to determine a first digital value based on the first digital signal, determine a second digital value based on the second digital signal, calculate a resistance ratio based on the first digital value and the second digital value, and determine a temperature output value based on the resistance ratio and the resistor-characterization information.
    Type: Application
    Filed: May 29, 2013
    Publication date: December 4, 2014
    Applicant: Intel IP Corporation
    Inventors: Merit Hong, David Harnishfeger, Kris Kaufman
  • Publication number: 20140355650
    Abstract: A temperature measurement system is disclosed. In accordance with some embodiments of the present disclosure, a temperature measurement system may comprise a resistor, a thermistor, a resistance-to-current converter configured to generate a current signal based on a resistance, an analog-to-digital converter (ADC) configured to receive a first current signal based on the resistor, convert the first current signal into a first digital signal, receive a second current signal based on the thermistor, and convert the second current signal into a second digital signal, and a calculation stage communicatively coupled to an ADC output and configured to determine a first digital value based on the first digital signal, determine a second digital value based on the second digital signal, calculate a resistance ratio based on the first digital value and the second digital value, and determine a temperature output value based on the resistance ratio.
    Type: Application
    Filed: May 29, 2013
    Publication date: December 4, 2014
    Inventors: Merit Hong, David Harnishfeger, Kris Kaufman
  • Publication number: 20140354308
    Abstract: A temperature-measurement input stage is disclosed. In accordance with some embodiments of the present disclosure, a temperature-measurement input stage may comprise a resistor, a thermistor, a first multiplexor, an amplifier, a second multiplexor, and an output stage. The first multiplexor may be configured to couple the resistor to a first amplifier input during a first multiplexor state, and couple the thermistor to the first amplifier input during a second multiplexor state. The amplifier may comprise the first amplifier input, a second amplifier input coupled to a voltage reference, and an amplifier output coupled to a feedback path. The second multiplexor may be configured to route a feedback current to the resistor during the first multiplexor state and route the feedback current to the thermistor during the second multiplexor state. The output stage may be configured to provide an output current based on the feedback current.
    Type: Application
    Filed: May 29, 2013
    Publication date: December 4, 2014
    Inventors: Merit Hong, David Harnishfeger, Kris Kaufman